Suchergebnisse - "Foucard, G"

1

Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs

von: Velazco, R

2010, in: IEEE transactions on nuclear science

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2

Embedded Detection and Correction of SEU Bursts in SRAM Memories Used as Radiation Detectors

von: Secondo, R

2016, in: IEEE transactions on nuclear science

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3

Effectiveness Analysis of a Non-Destructive Single Event Burnout Test Methodology

von: Oser, P

2014, in: IEEE transactions on nuclear science

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4

SESSION I: RADIATION HARDNESS ASSURANCE - A Fault Tolerant Approach to Detect Transient Faults in Microprocessors Based on a Non-Intrusive Reconfigurable Hardware

von: Azambuja, J R

2012, in: IEEE transactions on nuclear science

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