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1Effects of Channel Implant Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETsvon: Mclain, Michael LPP, 99, Seite 1-1, in: IEEE transactions on nuclear science
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2Effects of Channel Implant Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETsvon: Mclain, Michael L2017, in: IEEE transactions on nuclear science
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6von: Zinzow, Heidi2020transfer abstract, in: Quality properties and antioxidant activity of seven strawberry (