Suchergebnisse - "Sbetti, M."

1

Homogeneous line width in a zinc borate glass activated by Eu 3+)

von: Sbetti, M.

1997, in: Journal of non-crystalline solids

Wird geladen...
2

Papers Presented at ECASIA 99 - Depth Profiling - XPS and SIMS depth profiling of oxynitrides

von: Vanzetti, L.

2000, in: Surface and interface analysis

Wird geladen...
3

Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses

von: Bersani, M.

1999, in: Applied surface science

Wird geladen...
4

Boron-interstitial silicon clusters and their effects on transient enhanced diffusion of boron in silicon

von: Solmi, S.

2000, in: Journal of applied physics

Wird geladen...
5

Sample holder implement for very small samples on SC-ultra SIMS instrument

von: Barozzi, M.

2004, in: Applied surface science

Wird geladen...
6

The impact of the nitridation process on the properties of the Si-SiO2 interface

von: Polignano, M.L.

2001, in: Journal of non-crystalline solids

Wird geladen...
7

Papers presented at ECASIA '01 - Depth Profiling - XPS and SIMS depth profiling of chlorine in high-temperature oxynitrides

von: Vanzetti, L.

2002, in: Surface and interface analysis

Wird geladen...
8

Ultra Thin No/$ N_{2} $0 Oxynitride Dielectric for Advanced Flash Memory Application: Single Wafer and Batch Technology

von: Zonca, R.

1999, in: MRS online proceedings library

Wird geladen...
9

Characterization of nitrided silicon-silicon dioxide interfaces

von: Polignano, M. L.

1999, in: MRS online proceedings library

Wird geladen...

Nicht das Richtige dabei?

Schreiben Sie uns!