Suchergebnisse - "Seiler, Wilfrid"

1

XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal

von: Seiler, Wilfrid

2005, in: Materials science forum

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2

Surface Roughness Effect on Pseudo-GIXRD Stress Analysis

von: Peng, Jun

2005, in: Materials science forum

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3

Stresses Analysis on Coarse Grain Zn Film during Tensile Loading

von: Huang, Wen Jun

2006, in: Materials science forum

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4

Non-Destructive Analysis of Surface Stresses Using Grazing Incident X-Ray Diffraction

von: Braham, Chedly

2005, in: Materials science forum

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5

Residual Stress Effects on Mechanical Properties of a Two Phase TiAl-Based Intermetallic Alloy

von: Guo, F.A.

2002, in: Materials science forum

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6

Residual Stresses Gradient Determination in Cu Thin Films

von: Peng, Jun

2006, in: Materials science forum

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7

X-Ray Diffraction Residual Stress Analyses on a Copper Coating Realized by Inert Plasma Spray

von: Gassot, H.

2002, in: Materials science forum

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8

Residual Stress in α-Brass during Annealing

von: Wawszczak, R.

2008, in: Materials science forum

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9

Structural and optical properties of rare-earth-doped Y2O3 waveguides grown by pulsed-laser deposition

von: Pons-Y-Moll, Olivier

2002, in: Journal of applied physics

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10

Er-doped ZnO thin films grown by pulsed-laser deposition

von: Pérez-Casero, Rafael

2005, in: Journal of applied physics

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