Suchergebnisse - Spectroscopic Ellipsometry Data

1

Optical properties investigation of [nc-Si:$ SiO_{2} $/$ SiO_{2} $]30 periodic multilayer films

von: Feng, Liang

2012, in: Applied physics

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2

A method for determining ultrathin DLC film thickness by spectroscopic ellipsometry

von: Zhao, J. M.

2012, in: Microsystem technologies

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3

A method for determining ultrathin DLC film thickness by spectroscopic ellipsometry

von: Zhao, J. M.

2012, in: Microsystem technologies

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4

Optical properties investigation of [nc-Si:$ SiO_{2} $/$ SiO_{2} $]30 periodic multilayer films

von: Feng, Liang

2012, in: Applied physics. A, Materials science & processing

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5

Optical properties of epitaxial $ BiFeO_{3} $ thin films

von: Železný, V.

2010, in: Applied physics

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6

Model selection in spectroscopic ellipsometry data analysis: Combining an information criteria approach with screening sensitivity analysis

von: Likhachev, D.V

2017, in: Applied surface science

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7

Model selection in spectroscopic ellipsometry data analysis: Combining an information criteria approach with screening sensitivity analysis

von: Likhachev, D.V.

2017, in: Characterising shape patterns using features derived from best-fitting ellipsoids

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8

Optical properties of epitaxial $ BiFeO_{3} $ thin films

von: Železný, V.

2010, in: Applied physics. A, Materials science & processing

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9

Spectroscopic ellipsometry data analysis using penalized splines representation for the dielectric function

von: Likhachev, D.V.

2018, in: Thin solid films

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