Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array

A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micr...
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Autor*in:	Lili Zheng [verfasserIn] Ziquan Guo [verfasserIn] Wei Yan [verfasserIn] Yue Lin [verfasserIn] Yijun Lu [verfasserIn] Hao-Chung Kuo [verfasserIn] Zhong Chen [verfasserIn] Lihong Zhu [verfasserIn] Tingzhu Wu [verfasserIn] Yulin Gao [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2018

Schlagwörter:	Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution

Übergeordnetes Werk:	In: IEEE Access - IEEE, 2014, 6(2018), Seite 51329-51336
Übergeordnetes Werk:	volume:6 ; year:2018 ; pages:51329-51336

Links:	Link aufrufen Link aufrufen Link aufrufen Journal toc

DOI / URN:	10.1109/ACCESS.2018.2869778

Katalog-ID:	DOAJ015297705

Internformat


LEADER	01000caa a22002652 4500
001	DOAJ015297705
003	DE-627
005	20230310073728.0
007	cr uuu---uuuuu
008	230226s2018 xx \|\|\|\|\|o 00\| \|\|eng c
024	7		\|a 10.1109/ACCESS.2018.2869778 \|2 doi
035			\|a (DE-627)DOAJ015297705
035			\|a (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
041			\|a eng
050		0	\|a TK1-9971
100	0		\|a Lili Zheng \|e verfasserin \|4 aut
245	1	0	\|a Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
264		1	\|c 2018
336			\|a Text \|b txt \|2 rdacontent
337			\|a Computermedien \|b c \|2 rdamedia
338			\|a Online-Ressource \|b cr \|2 rdacarrier
520			\|a A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.
650		4	\|a Micro-LED
650		4	\|a luminance measurement
650		4	\|a microscope with camera
650		4	\|a inspection system
650		4	\|a 3D luminance distribution
653		0	\|a Electrical engineering. Electronics. Nuclear engineering
700	0		\|a Ziquan Guo \|e verfasserin \|4 aut
700	0		\|a Wei Yan \|e verfasserin \|4 aut
700	0		\|a Yue Lin \|e verfasserin \|4 aut
700	0		\|a Yijun Lu \|e verfasserin \|4 aut
700	0		\|a Hao-Chung Kuo \|e verfasserin \|4 aut
700	0		\|a Zhong Chen \|e verfasserin \|4 aut
700	0		\|a Lihong Zhu \|e verfasserin \|4 aut
700	0		\|a Tingzhu Wu \|e verfasserin \|4 aut
700	0		\|a Yulin Gao \|e verfasserin \|4 aut
773	0	8	\|i In \|t IEEE Access \|d IEEE, 2014 \|g 6(2018), Seite 51329-51336 \|w (DE-627)728440385 \|w (DE-600)2687964-5 \|x 21693536 \|7 nnns
773	1	8	\|g volume:6 \|g year:2018 \|g pages:51329-51336
856	4	0	\|u https://doi.org/10.1109/ACCESS.2018.2869778 \|z kostenfrei
856	4	0	\|u https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 \|z kostenfrei
856	4	0	\|u https://ieeexplore.ieee.org/document/8463461/ \|z kostenfrei
856	4	2	\|u https://doaj.org/toc/2169-3536 \|y Journal toc \|z kostenfrei
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_DOAJ
912			\|a GBV_ILN_11
912			\|a GBV_ILN_20
912			\|a GBV_ILN_22
912			\|a GBV_ILN_23
912			\|a GBV_ILN_24
912			\|a GBV_ILN_31
912			\|a GBV_ILN_39
912			\|a GBV_ILN_40
912			\|a GBV_ILN_60
912			\|a GBV_ILN_62
912			\|a GBV_ILN_63
912			\|a GBV_ILN_65
912			\|a GBV_ILN_69
912			\|a GBV_ILN_70
912			\|a GBV_ILN_73
912			\|a GBV_ILN_95
912			\|a GBV_ILN_105
912			\|a GBV_ILN_110
912			\|a GBV_ILN_151
912			\|a GBV_ILN_161
912			\|a GBV_ILN_170
912			\|a GBV_ILN_213
912			\|a GBV_ILN_230
912			\|a GBV_ILN_285
912			\|a GBV_ILN_293
912			\|a GBV_ILN_370
912			\|a GBV_ILN_602
912			\|a GBV_ILN_2014
912			\|a GBV_ILN_4012
912			\|a GBV_ILN_4037
912			\|a GBV_ILN_4112
912			\|a GBV_ILN_4125
912			\|a GBV_ILN_4126
912			\|a GBV_ILN_4249
912			\|a GBV_ILN_4305
912			\|a GBV_ILN_4306
912			\|a GBV_ILN_4307
912			\|a GBV_ILN_4313
912			\|a GBV_ILN_4322
912			\|a GBV_ILN_4323
912			\|a GBV_ILN_4324
912			\|a GBV_ILN_4325
912			\|a GBV_ILN_4335
912			\|a GBV_ILN_4338
912			\|a GBV_ILN_4367
912			\|a GBV_ILN_4700
951			\|a AR
952			\|d 6 \|j 2018 \|h 51329-51336

Indexfelder

author_variant	l z lz z g zg w y wy y l yl y l yl h c k hck z c zc l z lz t w tw y g yg
matchkey_str	article:21693536:2018----::eerhncmrbsdirsoiiaigytmonpcteufclm
hierarchy_sort_str	2018
callnumber-subject-code	TK
publishDate	2018
allfields	10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336
spelling	10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336
allfields_unstemmed	10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336
allfieldsGer	10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336
allfieldsSound	10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336
language	English
source	In IEEE Access 6(2018), Seite 51329-51336 volume:6 year:2018 pages:51329-51336
sourceStr	In IEEE Access 6(2018), Seite 51329-51336 volume:6 year:2018 pages:51329-51336
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering
isfreeaccess_bool	true
container_title	IEEE Access
authorswithroles_txt_mv	Lili Zheng @@aut@@ Ziquan Guo @@aut@@ Wei Yan @@aut@@ Yue Lin @@aut@@ Yijun Lu @@aut@@ Hao-Chung Kuo @@aut@@ Zhong Chen @@aut@@ Lihong Zhu @@aut@@ Tingzhu Wu @@aut@@ Yulin Gao @@aut@@
publishDateDaySort_date	2018-01-01T00:00:00Z
hierarchy_top_id	728440385
id	DOAJ015297705
language_de	englisch
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">DOAJ015297705</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230310073728.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">230226s2018 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/ACCESS.2018.2869778</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)DOAJ015297705</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK1-9971</subfield></datafield><datafield tag="100" ind1="0" ind2=" "><subfield code="a">Lili Zheng</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2018</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Micro-LED</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">luminance measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">microscope with camera</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">inspection system</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">3D luminance distribution</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Electrical engineering. Electronics. Nuclear engineering</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Ziquan Guo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Wei Yan</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yue Lin</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yijun Lu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Hao-Chung Kuo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Zhong Chen</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Lihong Zhu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Tingzhu Wu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yulin Gao</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">In</subfield><subfield code="t">IEEE Access</subfield><subfield code="d">IEEE, 2014</subfield><subfield code="g">6(2018), Seite 51329-51336</subfield><subfield code="w">(DE-627)728440385</subfield><subfield code="w">(DE-600)2687964-5</subfield><subfield code="x">21693536</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:6</subfield><subfield code="g">year:2018</subfield><subfield code="g">pages:51329-51336</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1109/ACCESS.2018.2869778</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ieeexplore.ieee.org/document/8463461/</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">https://doaj.org/toc/2169-3536</subfield><subfield code="y">Journal toc</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_DOAJ</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_39</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_161</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_213</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_230</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4249</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4367</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">6</subfield><subfield code="j">2018</subfield><subfield code="h">51329-51336</subfield></datafield></record></collection>
callnumber-first	T - Technology
author	Lili Zheng
spellingShingle	Lili Zheng misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
authorStr	Lili Zheng
ppnlink_with_tag_str_mv	@@773@@(DE-627)728440385
format	electronic Article
delete_txt_mv	keep
author_role	aut aut aut aut aut aut aut aut aut aut
collection	DOAJ
remote_str	true
callnumber-label	TK1-9971
illustrated	Not Illustrated
issn	21693536
topic_title	TK1-9971 Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution
topic	misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering
topic_unstemmed	misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering
topic_browse	misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering
format_facet	Elektronische Aufsätze Aufsätze Elektronische Ressource
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	cr
hierarchy_parent_title	IEEE Access
hierarchy_parent_id	728440385
hierarchy_top_title	IEEE Access
isfreeaccess_txt	true
familylinks_str_mv	(DE-627)728440385 (DE-600)2687964-5
title	Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
ctrlnum	(DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8
title_full	Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
author_sort	Lili Zheng
journal	IEEE Access
journalStr	IEEE Access
callnumber-first-code	T
lang_code	eng
isOA_bool	true
recordtype	marc
publishDateSort	2018
contenttype_str_mv	txt
container_start_page	51329
author_browse	Lili Zheng Ziquan Guo Wei Yan Yue Lin Yijun Lu Hao-Chung Kuo Zhong Chen Lihong Zhu Tingzhu Wu Yulin Gao
container_volume	6
class	TK1-9971
format_se	Elektronische Aufsätze
author-letter	Lili Zheng
doi_str_mv	10.1109/ACCESS.2018.2869778
author2-role	verfasserin
title_sort	research on a camera-based microscopic imaging system to inspect the surface luminance of the micro-led array
callnumber	TK1-9971
title_auth	Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
abstract	A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.
abstractGer	A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.
abstract_unstemmed	A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700
title_short	Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
url	https://doi.org/10.1109/ACCESS.2018.2869778 https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 https://ieeexplore.ieee.org/document/8463461/ https://doaj.org/toc/2169-3536
remote_bool	true
author2	Ziquan Guo Wei Yan Yue Lin Yijun Lu Hao-Chung Kuo Zhong Chen Lihong Zhu Tingzhu Wu Yulin Gao
author2Str	Ziquan Guo Wei Yan Yue Lin Yijun Lu Hao-Chung Kuo Zhong Chen Lihong Zhu Tingzhu Wu Yulin Gao
ppnlink	728440385
callnumber-subject	TK - Electrical and Nuclear Engineering
mediatype_str_mv	c
isOA_txt	true
hochschulschrift_bool	false
doi_str	10.1109/ACCESS.2018.2869778
callnumber-a	TK1-9971
up_date	2024-07-03T14:09:05.783Z
_version_	1803567230658543617
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">DOAJ015297705</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230310073728.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">230226s2018 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/ACCESS.2018.2869778</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)DOAJ015297705</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK1-9971</subfield></datafield><datafield tag="100" ind1="0" ind2=" "><subfield code="a">Lili Zheng</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2018</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Micro-LED</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">luminance measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">microscope with camera</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">inspection system</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">3D luminance distribution</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Electrical engineering. Electronics. Nuclear engineering</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Ziquan Guo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Wei Yan</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yue Lin</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yijun Lu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Hao-Chung Kuo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Zhong Chen</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Lihong Zhu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Tingzhu Wu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yulin Gao</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">In</subfield><subfield code="t">IEEE Access</subfield><subfield code="d">IEEE, 2014</subfield><subfield code="g">6(2018), Seite 51329-51336</subfield><subfield code="w">(DE-627)728440385</subfield><subfield code="w">(DE-600)2687964-5</subfield><subfield code="x">21693536</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:6</subfield><subfield code="g">year:2018</subfield><subfield code="g">pages:51329-51336</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1109/ACCESS.2018.2869778</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ieeexplore.ieee.org/document/8463461/</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">https://doaj.org/toc/2169-3536</subfield><subfield code="y">Journal toc</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_DOAJ</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_39</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_161</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_213</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_230</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4249</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4367</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">6</subfield><subfield code="j">2018</subfield><subfield code="h">51329-51336</subfield></datafield></record></collection>
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Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array

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