Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micr...
Ausführliche Beschreibung
Autor*in: |
Lili Zheng [verfasserIn] Ziquan Guo [verfasserIn] Wei Yan [verfasserIn] Yue Lin [verfasserIn] Yijun Lu [verfasserIn] Hao-Chung Kuo [verfasserIn] Zhong Chen [verfasserIn] Lihong Zhu [verfasserIn] Tingzhu Wu [verfasserIn] Yulin Gao [verfasserIn] |
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E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2018 |
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Übergeordnetes Werk: |
In: IEEE Access - IEEE, 2014, 6(2018), Seite 51329-51336 |
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Übergeordnetes Werk: |
volume:6 ; year:2018 ; pages:51329-51336 |
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DOI / URN: |
10.1109/ACCESS.2018.2869778 |
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Katalog-ID: |
DOAJ015297705 |
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LEADER | 01000caa a22002652 4500 | ||
---|---|---|---|
001 | DOAJ015297705 | ||
003 | DE-627 | ||
005 | 20230310073728.0 | ||
007 | cr uuu---uuuuu | ||
008 | 230226s2018 xx |||||o 00| ||eng c | ||
024 | 7 | |a 10.1109/ACCESS.2018.2869778 |2 doi | |
035 | |a (DE-627)DOAJ015297705 | ||
035 | |a (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
050 | 0 | |a TK1-9971 | |
100 | 0 | |a Lili Zheng |e verfasserin |4 aut | |
245 | 1 | 0 | |a Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array |
264 | 1 | |c 2018 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a Computermedien |b c |2 rdamedia | ||
338 | |a Online-Ressource |b cr |2 rdacarrier | ||
520 | |a A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. | ||
650 | 4 | |a Micro-LED | |
650 | 4 | |a luminance measurement | |
650 | 4 | |a microscope with camera | |
650 | 4 | |a inspection system | |
650 | 4 | |a 3D luminance distribution | |
653 | 0 | |a Electrical engineering. Electronics. Nuclear engineering | |
700 | 0 | |a Ziquan Guo |e verfasserin |4 aut | |
700 | 0 | |a Wei Yan |e verfasserin |4 aut | |
700 | 0 | |a Yue Lin |e verfasserin |4 aut | |
700 | 0 | |a Yijun Lu |e verfasserin |4 aut | |
700 | 0 | |a Hao-Chung Kuo |e verfasserin |4 aut | |
700 | 0 | |a Zhong Chen |e verfasserin |4 aut | |
700 | 0 | |a Lihong Zhu |e verfasserin |4 aut | |
700 | 0 | |a Tingzhu Wu |e verfasserin |4 aut | |
700 | 0 | |a Yulin Gao |e verfasserin |4 aut | |
773 | 0 | 8 | |i In |t IEEE Access |d IEEE, 2014 |g 6(2018), Seite 51329-51336 |w (DE-627)728440385 |w (DE-600)2687964-5 |x 21693536 |7 nnns |
773 | 1 | 8 | |g volume:6 |g year:2018 |g pages:51329-51336 |
856 | 4 | 0 | |u https://doi.org/10.1109/ACCESS.2018.2869778 |z kostenfrei |
856 | 4 | 0 | |u https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 |z kostenfrei |
856 | 4 | 0 | |u https://ieeexplore.ieee.org/document/8463461/ |z kostenfrei |
856 | 4 | 2 | |u https://doaj.org/toc/2169-3536 |y Journal toc |z kostenfrei |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_DOAJ | ||
912 | |a GBV_ILN_11 | ||
912 | |a GBV_ILN_20 | ||
912 | |a GBV_ILN_22 | ||
912 | |a GBV_ILN_23 | ||
912 | |a GBV_ILN_24 | ||
912 | |a GBV_ILN_31 | ||
912 | |a GBV_ILN_39 | ||
912 | |a GBV_ILN_40 | ||
912 | |a GBV_ILN_60 | ||
912 | |a GBV_ILN_62 | ||
912 | |a GBV_ILN_63 | ||
912 | |a GBV_ILN_65 | ||
912 | |a GBV_ILN_69 | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_73 | ||
912 | |a GBV_ILN_95 | ||
912 | |a GBV_ILN_105 | ||
912 | |a GBV_ILN_110 | ||
912 | |a GBV_ILN_151 | ||
912 | |a GBV_ILN_161 | ||
912 | |a GBV_ILN_170 | ||
912 | |a GBV_ILN_213 | ||
912 | |a GBV_ILN_230 | ||
912 | |a GBV_ILN_285 | ||
912 | |a GBV_ILN_293 | ||
912 | |a GBV_ILN_370 | ||
912 | |a GBV_ILN_602 | ||
912 | |a GBV_ILN_2014 | ||
912 | |a GBV_ILN_4012 | ||
912 | |a GBV_ILN_4037 | ||
912 | |a GBV_ILN_4112 | ||
912 | |a GBV_ILN_4125 | ||
912 | |a GBV_ILN_4126 | ||
912 | |a GBV_ILN_4249 | ||
912 | |a GBV_ILN_4305 | ||
912 | |a GBV_ILN_4306 | ||
912 | |a GBV_ILN_4307 | ||
912 | |a GBV_ILN_4313 | ||
912 | |a GBV_ILN_4322 | ||
912 | |a GBV_ILN_4323 | ||
912 | |a GBV_ILN_4324 | ||
912 | |a GBV_ILN_4325 | ||
912 | |a GBV_ILN_4335 | ||
912 | |a GBV_ILN_4338 | ||
912 | |a GBV_ILN_4367 | ||
912 | |a GBV_ILN_4700 | ||
951 | |a AR | ||
952 | |d 6 |j 2018 |h 51329-51336 |
author_variant |
l z lz z g zg w y wy y l yl y l yl h c k hck z c zc l z lz t w tw y g yg |
---|---|
matchkey_str |
article:21693536:2018----::eerhncmrbsdirsoiiaigytmonpcteufclm |
hierarchy_sort_str |
2018 |
callnumber-subject-code |
TK |
publishDate |
2018 |
allfields |
10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336 |
spelling |
10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336 |
allfields_unstemmed |
10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336 |
allfieldsGer |
10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336 |
allfieldsSound |
10.1109/ACCESS.2018.2869778 doi (DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 DE-627 ger DE-627 rakwb eng TK1-9971 Lili Zheng verfasserin aut Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering Ziquan Guo verfasserin aut Wei Yan verfasserin aut Yue Lin verfasserin aut Yijun Lu verfasserin aut Hao-Chung Kuo verfasserin aut Zhong Chen verfasserin aut Lihong Zhu verfasserin aut Tingzhu Wu verfasserin aut Yulin Gao verfasserin aut In IEEE Access IEEE, 2014 6(2018), Seite 51329-51336 (DE-627)728440385 (DE-600)2687964-5 21693536 nnns volume:6 year:2018 pages:51329-51336 https://doi.org/10.1109/ACCESS.2018.2869778 kostenfrei https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 kostenfrei https://ieeexplore.ieee.org/document/8463461/ kostenfrei https://doaj.org/toc/2169-3536 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 6 2018 51329-51336 |
language |
English |
source |
In IEEE Access 6(2018), Seite 51329-51336 volume:6 year:2018 pages:51329-51336 |
sourceStr |
In IEEE Access 6(2018), Seite 51329-51336 volume:6 year:2018 pages:51329-51336 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution Electrical engineering. Electronics. Nuclear engineering |
isfreeaccess_bool |
true |
container_title |
IEEE Access |
authorswithroles_txt_mv |
Lili Zheng @@aut@@ Ziquan Guo @@aut@@ Wei Yan @@aut@@ Yue Lin @@aut@@ Yijun Lu @@aut@@ Hao-Chung Kuo @@aut@@ Zhong Chen @@aut@@ Lihong Zhu @@aut@@ Tingzhu Wu @@aut@@ Yulin Gao @@aut@@ |
publishDateDaySort_date |
2018-01-01T00:00:00Z |
hierarchy_top_id |
728440385 |
id |
DOAJ015297705 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">DOAJ015297705</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230310073728.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">230226s2018 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/ACCESS.2018.2869778</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)DOAJ015297705</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK1-9971</subfield></datafield><datafield tag="100" ind1="0" ind2=" "><subfield code="a">Lili Zheng</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2018</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Micro-LED</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">luminance measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">microscope with camera</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">inspection system</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">3D luminance distribution</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Electrical engineering. Electronics. Nuclear engineering</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Ziquan Guo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Wei Yan</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yue Lin</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yijun Lu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Hao-Chung Kuo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Zhong Chen</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Lihong Zhu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Tingzhu Wu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yulin Gao</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">In</subfield><subfield code="t">IEEE Access</subfield><subfield code="d">IEEE, 2014</subfield><subfield code="g">6(2018), Seite 51329-51336</subfield><subfield code="w">(DE-627)728440385</subfield><subfield code="w">(DE-600)2687964-5</subfield><subfield code="x">21693536</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:6</subfield><subfield code="g">year:2018</subfield><subfield code="g">pages:51329-51336</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1109/ACCESS.2018.2869778</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ieeexplore.ieee.org/document/8463461/</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">https://doaj.org/toc/2169-3536</subfield><subfield code="y">Journal toc</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_DOAJ</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_39</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_161</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_213</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_230</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4249</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4367</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">6</subfield><subfield code="j">2018</subfield><subfield code="h">51329-51336</subfield></datafield></record></collection>
|
callnumber-first |
T - Technology |
author |
Lili Zheng |
spellingShingle |
Lili Zheng misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array |
authorStr |
Lili Zheng |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)728440385 |
format |
electronic Article |
delete_txt_mv |
keep |
author_role |
aut aut aut aut aut aut aut aut aut aut |
collection |
DOAJ |
remote_str |
true |
callnumber-label |
TK1-9971 |
illustrated |
Not Illustrated |
issn |
21693536 |
topic_title |
TK1-9971 Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array Micro-LED luminance measurement microscope with camera inspection system 3D luminance distribution |
topic |
misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering |
topic_unstemmed |
misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering |
topic_browse |
misc TK1-9971 misc Micro-LED misc luminance measurement misc microscope with camera misc inspection system misc 3D luminance distribution misc Electrical engineering. Electronics. Nuclear engineering |
format_facet |
Elektronische Aufsätze Aufsätze Elektronische Ressource |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
cr |
hierarchy_parent_title |
IEEE Access |
hierarchy_parent_id |
728440385 |
hierarchy_top_title |
IEEE Access |
isfreeaccess_txt |
true |
familylinks_str_mv |
(DE-627)728440385 (DE-600)2687964-5 |
title |
Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array |
ctrlnum |
(DE-627)DOAJ015297705 (DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8 |
title_full |
Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array |
author_sort |
Lili Zheng |
journal |
IEEE Access |
journalStr |
IEEE Access |
callnumber-first-code |
T |
lang_code |
eng |
isOA_bool |
true |
recordtype |
marc |
publishDateSort |
2018 |
contenttype_str_mv |
txt |
container_start_page |
51329 |
author_browse |
Lili Zheng Ziquan Guo Wei Yan Yue Lin Yijun Lu Hao-Chung Kuo Zhong Chen Lihong Zhu Tingzhu Wu Yulin Gao |
container_volume |
6 |
class |
TK1-9971 |
format_se |
Elektronische Aufsätze |
author-letter |
Lili Zheng |
doi_str_mv |
10.1109/ACCESS.2018.2869778 |
author2-role |
verfasserin |
title_sort |
research on a camera-based microscopic imaging system to inspect the surface luminance of the micro-led array |
callnumber |
TK1-9971 |
title_auth |
Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array |
abstract |
A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. |
abstractGer |
A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. |
abstract_unstemmed |
A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 |
title_short |
Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array |
url |
https://doi.org/10.1109/ACCESS.2018.2869778 https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8 https://ieeexplore.ieee.org/document/8463461/ https://doaj.org/toc/2169-3536 |
remote_bool |
true |
author2 |
Ziquan Guo Wei Yan Yue Lin Yijun Lu Hao-Chung Kuo Zhong Chen Lihong Zhu Tingzhu Wu Yulin Gao |
author2Str |
Ziquan Guo Wei Yan Yue Lin Yijun Lu Hao-Chung Kuo Zhong Chen Lihong Zhu Tingzhu Wu Yulin Gao |
ppnlink |
728440385 |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
mediatype_str_mv |
c |
isOA_txt |
true |
hochschulschrift_bool |
false |
doi_str |
10.1109/ACCESS.2018.2869778 |
callnumber-a |
TK1-9971 |
up_date |
2024-07-03T14:09:05.783Z |
_version_ |
1803567230658543617 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">DOAJ015297705</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230310073728.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">230226s2018 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/ACCESS.2018.2869778</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)DOAJ015297705</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DOAJe1480999b3d6413180bbdf4dd5504cc8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK1-9971</subfield></datafield><datafield tag="100" ind1="0" ind2=" "><subfield code="a">Lili Zheng</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2018</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Micro-LED</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">luminance measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">microscope with camera</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">inspection system</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">3D luminance distribution</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Electrical engineering. Electronics. Nuclear engineering</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Ziquan Guo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Wei Yan</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yue Lin</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yijun Lu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Hao-Chung Kuo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Zhong Chen</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Lihong Zhu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Tingzhu Wu</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Yulin Gao</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">In</subfield><subfield code="t">IEEE Access</subfield><subfield code="d">IEEE, 2014</subfield><subfield code="g">6(2018), Seite 51329-51336</subfield><subfield code="w">(DE-627)728440385</subfield><subfield code="w">(DE-600)2687964-5</subfield><subfield code="x">21693536</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:6</subfield><subfield code="g">year:2018</subfield><subfield code="g">pages:51329-51336</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1109/ACCESS.2018.2869778</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doaj.org/article/e1480999b3d6413180bbdf4dd5504cc8</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ieeexplore.ieee.org/document/8463461/</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">https://doaj.org/toc/2169-3536</subfield><subfield code="y">Journal toc</subfield><subfield code="z">kostenfrei</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_DOAJ</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_39</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_161</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_213</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_230</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4249</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4367</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">6</subfield><subfield code="j">2018</subfield><subfield code="h">51329-51336</subfield></datafield></record></collection>
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