A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains
Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, s...
Ausführliche Beschreibung
Autor*in: |
Chenying Gao [verfasserIn] Dandan Shi [verfasserIn] Cheng Li [verfasserIn] Xiaobo Yu [verfasserIn] Xisha Zhang [verfasserIn] Zitong Liu [verfasserIn] Guanxin Zhang [verfasserIn] Deqing Zhang [verfasserIn] |
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E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2022 |
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Übergeordnetes Werk: |
In: Advanced Science - Wiley, 2015, 9(2022), 15, Seite n/a-n/a |
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Übergeordnetes Werk: |
volume:9 ; year:2022 ; number:15 ; pages:n/a-n/a |
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DOI / URN: |
10.1002/advs.202106087 |
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Katalog-ID: |
DOAJ029589614 |
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520 | |a Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. | ||
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10.1002/advs.202106087 doi (DE-627)DOAJ029589614 (DE-599)DOAJ8b26ae0c0e1d4a498945b98a53ae7837 DE-627 ger DE-627 rakwb eng Chenying Gao verfasserin aut A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. conjugated polymers cross‐linking organic field‐effect transistors photo‐patterning semiconducting photoresists Science Q Dandan Shi verfasserin aut Cheng Li verfasserin aut Xiaobo Yu verfasserin aut Xisha Zhang verfasserin aut Zitong Liu verfasserin aut Guanxin Zhang verfasserin aut Deqing Zhang verfasserin aut In Advanced Science Wiley, 2015 9(2022), 15, Seite n/a-n/a (DE-627)817357777 (DE-600)2808093-2 21983844 nnns volume:9 year:2022 number:15 pages:n/a-n/a https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/article/8b26ae0c0e1d4a498945b98a53ae7837 kostenfrei https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/toc/2198-3844 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2022 15 n/a-n/a |
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10.1002/advs.202106087 doi (DE-627)DOAJ029589614 (DE-599)DOAJ8b26ae0c0e1d4a498945b98a53ae7837 DE-627 ger DE-627 rakwb eng Chenying Gao verfasserin aut A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. conjugated polymers cross‐linking organic field‐effect transistors photo‐patterning semiconducting photoresists Science Q Dandan Shi verfasserin aut Cheng Li verfasserin aut Xiaobo Yu verfasserin aut Xisha Zhang verfasserin aut Zitong Liu verfasserin aut Guanxin Zhang verfasserin aut Deqing Zhang verfasserin aut In Advanced Science Wiley, 2015 9(2022), 15, Seite n/a-n/a (DE-627)817357777 (DE-600)2808093-2 21983844 nnns volume:9 year:2022 number:15 pages:n/a-n/a https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/article/8b26ae0c0e1d4a498945b98a53ae7837 kostenfrei https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/toc/2198-3844 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2022 15 n/a-n/a |
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10.1002/advs.202106087 doi (DE-627)DOAJ029589614 (DE-599)DOAJ8b26ae0c0e1d4a498945b98a53ae7837 DE-627 ger DE-627 rakwb eng Chenying Gao verfasserin aut A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. conjugated polymers cross‐linking organic field‐effect transistors photo‐patterning semiconducting photoresists Science Q Dandan Shi verfasserin aut Cheng Li verfasserin aut Xiaobo Yu verfasserin aut Xisha Zhang verfasserin aut Zitong Liu verfasserin aut Guanxin Zhang verfasserin aut Deqing Zhang verfasserin aut In Advanced Science Wiley, 2015 9(2022), 15, Seite n/a-n/a (DE-627)817357777 (DE-600)2808093-2 21983844 nnns volume:9 year:2022 number:15 pages:n/a-n/a https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/article/8b26ae0c0e1d4a498945b98a53ae7837 kostenfrei https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/toc/2198-3844 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2022 15 n/a-n/a |
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10.1002/advs.202106087 doi (DE-627)DOAJ029589614 (DE-599)DOAJ8b26ae0c0e1d4a498945b98a53ae7837 DE-627 ger DE-627 rakwb eng Chenying Gao verfasserin aut A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. conjugated polymers cross‐linking organic field‐effect transistors photo‐patterning semiconducting photoresists Science Q Dandan Shi verfasserin aut Cheng Li verfasserin aut Xiaobo Yu verfasserin aut Xisha Zhang verfasserin aut Zitong Liu verfasserin aut Guanxin Zhang verfasserin aut Deqing Zhang verfasserin aut In Advanced Science Wiley, 2015 9(2022), 15, Seite n/a-n/a (DE-627)817357777 (DE-600)2808093-2 21983844 nnns volume:9 year:2022 number:15 pages:n/a-n/a https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/article/8b26ae0c0e1d4a498945b98a53ae7837 kostenfrei https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/toc/2198-3844 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2022 15 n/a-n/a |
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10.1002/advs.202106087 doi (DE-627)DOAJ029589614 (DE-599)DOAJ8b26ae0c0e1d4a498945b98a53ae7837 DE-627 ger DE-627 rakwb eng Chenying Gao verfasserin aut A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. conjugated polymers cross‐linking organic field‐effect transistors photo‐patterning semiconducting photoresists Science Q Dandan Shi verfasserin aut Cheng Li verfasserin aut Xiaobo Yu verfasserin aut Xisha Zhang verfasserin aut Zitong Liu verfasserin aut Guanxin Zhang verfasserin aut Deqing Zhang verfasserin aut In Advanced Science Wiley, 2015 9(2022), 15, Seite n/a-n/a (DE-627)817357777 (DE-600)2808093-2 21983844 nnns volume:9 year:2022 number:15 pages:n/a-n/a https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/article/8b26ae0c0e1d4a498945b98a53ae7837 kostenfrei https://doi.org/10.1002/advs.202106087 kostenfrei https://doaj.org/toc/2198-3844 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2022 15 n/a-n/a |
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Chenying Gao |
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Chenying Gao misc conjugated polymers misc cross‐linking misc organic field‐effect transistors misc photo‐patterning misc semiconducting photoresists misc Science misc Q A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains |
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A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains conjugated polymers cross‐linking organic field‐effect transistors photo‐patterning semiconducting photoresists |
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A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains |
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dual functional diketopyrrolopyrrole‐based conjugated polymer as single component semiconducting photoresist by appending azide groups in the side chains |
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A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains |
abstract |
Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. |
abstractGer |
Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. |
abstract_unstemmed |
Abstract Molecular systems that can function as photoresists are essential for the fabrication of flexible electronics through all‐photolithographic processes. Most of the reported molecular systems for photo‐patterning of polymeric semiconductors contain binary or multi‐components. In comparison, single component semiconducting photoresist is advantageous since it will circumvent the optimization of phase separation and ensure the patterned semiconducting thin films to be more uniform. In this paper, a single component semiconducting photoresist (PDPP4T‐N3) by incorporating azide groups into the branching alkyl chains of a diketopyrrolopyrrole‐based conjugated polymer is reported. The results reveal that i) the azide groups make the side chains to be photo‐cross‐linkable; ii) uniform patterns with size as small as 5 µm form under mild UV irradiation (365 nm, 85 mW cm−2) at ambient conditions; iii) such photo‐induced cross‐linking does not affect the inter‐chain packing; iv) benefiting from the single component feature, field‐effect transistors (FETs) with the individual patterned thin films display satisfactorily uniform performances with average charge mobility of 0.61 ± 0.10 cm2 V–1 s–1 and threshold voltage of 3.49 ± 1.43 V. These results offer a simple yet effective design strategy for high‐performance single component semiconducting photoresists, which hold great potentials for flexible electronics processed by all‐photolithography. |
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A Dual Functional Diketopyrrolopyrrole‐Based Conjugated Polymer as Single Component Semiconducting Photoresist by Appending Azide Groups in the Side Chains |
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