PROCESSING OF DIGITAL IMAGES OF INDUSTRIAL OBJECT SURFACES DURING NON-DESTRUCTIVE TESTING
The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image p...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
A. A. Hundzin [verfasserIn] M. A. Hundzina [verfasserIn] A. N. Cheshkin [verfasserIn] |
|---|
| Format: |
E-Artikel |
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| Sprache: |
Russisch |
| Erschienen: |
2016 |
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| Schlagwörter: |
non-destructive testing, binarization, filtration, image processing |
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| Übergeordnetes Werk: |
In: Nauka i Tehnika - Belarusian National Technical University, 2016, 15(2016), 3, Seite 225-232 |
|---|---|
| Übergeordnetes Werk: |
volume:15 ; year:2016 ; number:3 ; pages:225-232 |
| Links: |
Link aufrufen |
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| DOI / URN: |
10.21122/2227-1031-2016-15-3-225-232 |
|---|
| Katalog-ID: |
DOAJ031104657 |
|---|
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10.21122/2227-1031-2016-15-3-225-232 doi (DE-627)DOAJ031104657 (DE-599)DOAJ6fe5cc1e4c4b4abeb063ec5dc350aee0 DE-627 ger DE-627 rakwb rus A. A. Hundzin verfasserin aut PROCESSING OF DIGITAL IMAGES OF INDUSTRIAL OBJECT SURFACES DURING NON-DESTRUCTIVE TESTING 2016 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image processing have been described in the paper. While processing a number of images on a metal structure containing micro-cracks and being under strain difference between two such images have been determined in the paper. The metal structure represents a contour specifying the difference in images. An analysis of the contour makes it possible to determine initial direction of crack propagation in the metal. A threshold binarization value has been determined while processing the image having a field of medium intensity which are disappearing in the process of simple binarization and merging with the background due to rather small drop between the edges. In this regard an algorithm of a balanced threshold histogram clipping has been selected and it is based on the following approach: two different histogram fractions are “weighed” and if one of the fractions “outweighs” then last column of the histogram fraction is removed and the procedure is repeated again. When there is rather high threshold value a contour break (disappearance of informative pixels) may occur, and when there is a low threshold value – a noise (non-informative pixels) may appear. The paper shows implementation of an algorithm for location of contact pads on image of semiconductor crystal. Algorithms for morphological processing of production prototype images have been obtained in the paper and these algorithms permit to detect defects on the surface of semiconductors, to carry out filtration, threshold binarization that presupposes application of an algorithm of a balanced threshold histogram clipping. The developed approaches can be used to highlight contours on the surface images of mechanical engineering products and prepare them as production prototype images in accordance with enterprise documentation. Such approach makes it possible to remove noise on radiographs without introduction of additional distortions in the processed image; highlight defects of welded joints on the images. non-destructive testing, binarization, filtration, image processing Technology T M. A. Hundzina verfasserin aut A. N. Cheshkin verfasserin aut In Nauka i Tehnika Belarusian National Technical University, 2016 15(2016), 3, Seite 225-232 (DE-627)864215290 (DE-600)2863738-0 24140392 nnns volume:15 year:2016 number:3 pages:225-232 https://doi.org/10.21122/2227-1031-2016-15-3-225-232 kostenfrei https://doaj.org/article/6fe5cc1e4c4b4abeb063ec5dc350aee0 kostenfrei https://sat.bntu.by/jour/article/view/923 kostenfrei https://doaj.org/toc/2227-1031 Journal toc kostenfrei https://doaj.org/toc/2414-0392 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 15 2016 3 225-232 |
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10.21122/2227-1031-2016-15-3-225-232 doi (DE-627)DOAJ031104657 (DE-599)DOAJ6fe5cc1e4c4b4abeb063ec5dc350aee0 DE-627 ger DE-627 rakwb rus A. A. Hundzin verfasserin aut PROCESSING OF DIGITAL IMAGES OF INDUSTRIAL OBJECT SURFACES DURING NON-DESTRUCTIVE TESTING 2016 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image processing have been described in the paper. While processing a number of images on a metal structure containing micro-cracks and being under strain difference between two such images have been determined in the paper. The metal structure represents a contour specifying the difference in images. An analysis of the contour makes it possible to determine initial direction of crack propagation in the metal. A threshold binarization value has been determined while processing the image having a field of medium intensity which are disappearing in the process of simple binarization and merging with the background due to rather small drop between the edges. In this regard an algorithm of a balanced threshold histogram clipping has been selected and it is based on the following approach: two different histogram fractions are “weighed” and if one of the fractions “outweighs” then last column of the histogram fraction is removed and the procedure is repeated again. When there is rather high threshold value a contour break (disappearance of informative pixels) may occur, and when there is a low threshold value – a noise (non-informative pixels) may appear. The paper shows implementation of an algorithm for location of contact pads on image of semiconductor crystal. Algorithms for morphological processing of production prototype images have been obtained in the paper and these algorithms permit to detect defects on the surface of semiconductors, to carry out filtration, threshold binarization that presupposes application of an algorithm of a balanced threshold histogram clipping. The developed approaches can be used to highlight contours on the surface images of mechanical engineering products and prepare them as production prototype images in accordance with enterprise documentation. Such approach makes it possible to remove noise on radiographs without introduction of additional distortions in the processed image; highlight defects of welded joints on the images. non-destructive testing, binarization, filtration, image processing Technology T M. A. Hundzina verfasserin aut A. N. Cheshkin verfasserin aut In Nauka i Tehnika Belarusian National Technical University, 2016 15(2016), 3, Seite 225-232 (DE-627)864215290 (DE-600)2863738-0 24140392 nnns volume:15 year:2016 number:3 pages:225-232 https://doi.org/10.21122/2227-1031-2016-15-3-225-232 kostenfrei https://doaj.org/article/6fe5cc1e4c4b4abeb063ec5dc350aee0 kostenfrei https://sat.bntu.by/jour/article/view/923 kostenfrei https://doaj.org/toc/2227-1031 Journal toc kostenfrei https://doaj.org/toc/2414-0392 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 15 2016 3 225-232 |
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10.21122/2227-1031-2016-15-3-225-232 doi (DE-627)DOAJ031104657 (DE-599)DOAJ6fe5cc1e4c4b4abeb063ec5dc350aee0 DE-627 ger DE-627 rakwb rus A. A. Hundzin verfasserin aut PROCESSING OF DIGITAL IMAGES OF INDUSTRIAL OBJECT SURFACES DURING NON-DESTRUCTIVE TESTING 2016 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image processing have been described in the paper. While processing a number of images on a metal structure containing micro-cracks and being under strain difference between two such images have been determined in the paper. The metal structure represents a contour specifying the difference in images. An analysis of the contour makes it possible to determine initial direction of crack propagation in the metal. A threshold binarization value has been determined while processing the image having a field of medium intensity which are disappearing in the process of simple binarization and merging with the background due to rather small drop between the edges. In this regard an algorithm of a balanced threshold histogram clipping has been selected and it is based on the following approach: two different histogram fractions are “weighed” and if one of the fractions “outweighs” then last column of the histogram fraction is removed and the procedure is repeated again. When there is rather high threshold value a contour break (disappearance of informative pixels) may occur, and when there is a low threshold value – a noise (non-informative pixels) may appear. The paper shows implementation of an algorithm for location of contact pads on image of semiconductor crystal. Algorithms for morphological processing of production prototype images have been obtained in the paper and these algorithms permit to detect defects on the surface of semiconductors, to carry out filtration, threshold binarization that presupposes application of an algorithm of a balanced threshold histogram clipping. The developed approaches can be used to highlight contours on the surface images of mechanical engineering products and prepare them as production prototype images in accordance with enterprise documentation. Such approach makes it possible to remove noise on radiographs without introduction of additional distortions in the processed image; highlight defects of welded joints on the images. non-destructive testing, binarization, filtration, image processing Technology T M. A. Hundzina verfasserin aut A. N. Cheshkin verfasserin aut In Nauka i Tehnika Belarusian National Technical University, 2016 15(2016), 3, Seite 225-232 (DE-627)864215290 (DE-600)2863738-0 24140392 nnns volume:15 year:2016 number:3 pages:225-232 https://doi.org/10.21122/2227-1031-2016-15-3-225-232 kostenfrei https://doaj.org/article/6fe5cc1e4c4b4abeb063ec5dc350aee0 kostenfrei https://sat.bntu.by/jour/article/view/923 kostenfrei https://doaj.org/toc/2227-1031 Journal toc kostenfrei https://doaj.org/toc/2414-0392 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 15 2016 3 225-232 |
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PROCESSING OF DIGITAL IMAGES OF INDUSTRIAL OBJECT SURFACES DURING NON-DESTRUCTIVE TESTING |
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The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image processing have been described in the paper. While processing a number of images on a metal structure containing micro-cracks and being under strain difference between two such images have been determined in the paper. The metal structure represents a contour specifying the difference in images. An analysis of the contour makes it possible to determine initial direction of crack propagation in the metal. A threshold binarization value has been determined while processing the image having a field of medium intensity which are disappearing in the process of simple binarization and merging with the background due to rather small drop between the edges. In this regard an algorithm of a balanced threshold histogram clipping has been selected and it is based on the following approach: two different histogram fractions are “weighed” and if one of the fractions “outweighs” then last column of the histogram fraction is removed and the procedure is repeated again. When there is rather high threshold value a contour break (disappearance of informative pixels) may occur, and when there is a low threshold value – a noise (non-informative pixels) may appear. The paper shows implementation of an algorithm for location of contact pads on image of semiconductor crystal. Algorithms for morphological processing of production prototype images have been obtained in the paper and these algorithms permit to detect defects on the surface of semiconductors, to carry out filtration, threshold binarization that presupposes application of an algorithm of a balanced threshold histogram clipping. The developed approaches can be used to highlight contours on the surface images of mechanical engineering products and prepare them as production prototype images in accordance with enterprise documentation. Such approach makes it possible to remove noise on radiographs without introduction of additional distortions in the processed image; highlight defects of welded joints on the images. |
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The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image processing have been described in the paper. While processing a number of images on a metal structure containing micro-cracks and being under strain difference between two such images have been determined in the paper. The metal structure represents a contour specifying the difference in images. An analysis of the contour makes it possible to determine initial direction of crack propagation in the metal. A threshold binarization value has been determined while processing the image having a field of medium intensity which are disappearing in the process of simple binarization and merging with the background due to rather small drop between the edges. In this regard an algorithm of a balanced threshold histogram clipping has been selected and it is based on the following approach: two different histogram fractions are “weighed” and if one of the fractions “outweighs” then last column of the histogram fraction is removed and the procedure is repeated again. When there is rather high threshold value a contour break (disappearance of informative pixels) may occur, and when there is a low threshold value – a noise (non-informative pixels) may appear. The paper shows implementation of an algorithm for location of contact pads on image of semiconductor crystal. Algorithms for morphological processing of production prototype images have been obtained in the paper and these algorithms permit to detect defects on the surface of semiconductors, to carry out filtration, threshold binarization that presupposes application of an algorithm of a balanced threshold histogram clipping. The developed approaches can be used to highlight contours on the surface images of mechanical engineering products and prepare them as production prototype images in accordance with enterprise documentation. Such approach makes it possible to remove noise on radiographs without introduction of additional distortions in the processed image; highlight defects of welded joints on the images. |
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The paper presents modern approaches to processing of images obtained with the help of industrial equipment. Usage of pixel modification in small neighborhoods, application of uniform image processing while changing brightness level, possibilities for combination of several images, threshold image processing have been described in the paper. While processing a number of images on a metal structure containing micro-cracks and being under strain difference between two such images have been determined in the paper. The metal structure represents a contour specifying the difference in images. An analysis of the contour makes it possible to determine initial direction of crack propagation in the metal. A threshold binarization value has been determined while processing the image having a field of medium intensity which are disappearing in the process of simple binarization and merging with the background due to rather small drop between the edges. In this regard an algorithm of a balanced threshold histogram clipping has been selected and it is based on the following approach: two different histogram fractions are “weighed” and if one of the fractions “outweighs” then last column of the histogram fraction is removed and the procedure is repeated again. When there is rather high threshold value a contour break (disappearance of informative pixels) may occur, and when there is a low threshold value – a noise (non-informative pixels) may appear. The paper shows implementation of an algorithm for location of contact pads on image of semiconductor crystal. Algorithms for morphological processing of production prototype images have been obtained in the paper and these algorithms permit to detect defects on the surface of semiconductors, to carry out filtration, threshold binarization that presupposes application of an algorithm of a balanced threshold histogram clipping. The developed approaches can be used to highlight contours on the surface images of mechanical engineering products and prepare them as production prototype images in accordance with enterprise documentation. Such approach makes it possible to remove noise on radiographs without introduction of additional distortions in the processed image; highlight defects of welded joints on the images. |
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PROCESSING OF DIGITAL IMAGES OF INDUSTRIAL OBJECT SURFACES DURING NON-DESTRUCTIVE TESTING |
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https://doi.org/10.21122/2227-1031-2016-15-3-225-232 https://doaj.org/article/6fe5cc1e4c4b4abeb063ec5dc350aee0 https://sat.bntu.by/jour/article/view/923 https://doaj.org/toc/2227-1031 https://doaj.org/toc/2414-0392 |
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