Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials

Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for mat...
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Autor*in:	Karthikeyan Gnanasekaran [verfasserIn] Gijsbertus de With [verfasserIn] Heiner Friedrich [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2018

Schlagwörter:	scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose

Übergeordnetes Werk:	In: Royal Society Open Science - The Royal Society, 2015, 5(2018), 5
Übergeordnetes Werk:	volume:5 ; year:2018 ; number:5

Links:	Link aufrufen Link aufrufen Link aufrufen Journal toc

DOI / URN:	10.1098/rsos.171838

Katalog-ID:	DOAJ060664134

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allfields	10.1098/rsos.171838 doi (DE-627)DOAJ060664134 (DE-599)DOAJ02a0519af4904c28bb8623fc07b4f783 DE-627 ger DE-627 rakwb eng Karthikeyan Gnanasekaran verfasserin aut Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions. scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose Science Q Gijsbertus de With verfasserin aut Heiner Friedrich verfasserin aut In Royal Society Open Science The Royal Society, 2015 5(2018), 5 (DE-627)798561173 (DE-600)2787755-3 20545703 nnns volume:5 year:2018 number:5 https://doi.org/10.1098/rsos.171838 kostenfrei https://doaj.org/article/02a0519af4904c28bb8623fc07b4f783 kostenfrei https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171838 kostenfrei https://doaj.org/toc/2054-5703 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2001 GBV_ILN_2005 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 5 2018 5
spelling	10.1098/rsos.171838 doi (DE-627)DOAJ060664134 (DE-599)DOAJ02a0519af4904c28bb8623fc07b4f783 DE-627 ger DE-627 rakwb eng Karthikeyan Gnanasekaran verfasserin aut Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions. scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose Science Q Gijsbertus de With verfasserin aut Heiner Friedrich verfasserin aut In Royal Society Open Science The Royal Society, 2015 5(2018), 5 (DE-627)798561173 (DE-600)2787755-3 20545703 nnns volume:5 year:2018 number:5 https://doi.org/10.1098/rsos.171838 kostenfrei https://doaj.org/article/02a0519af4904c28bb8623fc07b4f783 kostenfrei https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171838 kostenfrei https://doaj.org/toc/2054-5703 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2001 GBV_ILN_2005 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 5 2018 5
allfields_unstemmed	10.1098/rsos.171838 doi (DE-627)DOAJ060664134 (DE-599)DOAJ02a0519af4904c28bb8623fc07b4f783 DE-627 ger DE-627 rakwb eng Karthikeyan Gnanasekaran verfasserin aut Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions. scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose Science Q Gijsbertus de With verfasserin aut Heiner Friedrich verfasserin aut In Royal Society Open Science The Royal Society, 2015 5(2018), 5 (DE-627)798561173 (DE-600)2787755-3 20545703 nnns volume:5 year:2018 number:5 https://doi.org/10.1098/rsos.171838 kostenfrei https://doaj.org/article/02a0519af4904c28bb8623fc07b4f783 kostenfrei https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171838 kostenfrei https://doaj.org/toc/2054-5703 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2001 GBV_ILN_2005 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 5 2018 5
allfieldsGer	10.1098/rsos.171838 doi (DE-627)DOAJ060664134 (DE-599)DOAJ02a0519af4904c28bb8623fc07b4f783 DE-627 ger DE-627 rakwb eng Karthikeyan Gnanasekaran verfasserin aut Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions. scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose Science Q Gijsbertus de With verfasserin aut Heiner Friedrich verfasserin aut In Royal Society Open Science The Royal Society, 2015 5(2018), 5 (DE-627)798561173 (DE-600)2787755-3 20545703 nnns volume:5 year:2018 number:5 https://doi.org/10.1098/rsos.171838 kostenfrei https://doaj.org/article/02a0519af4904c28bb8623fc07b4f783 kostenfrei https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171838 kostenfrei https://doaj.org/toc/2054-5703 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2001 GBV_ILN_2005 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 5 2018 5
allfieldsSound	10.1098/rsos.171838 doi (DE-627)DOAJ060664134 (DE-599)DOAJ02a0519af4904c28bb8623fc07b4f783 DE-627 ger DE-627 rakwb eng Karthikeyan Gnanasekaran verfasserin aut Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions. scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose Science Q Gijsbertus de With verfasserin aut Heiner Friedrich verfasserin aut In Royal Society Open Science The Royal Society, 2015 5(2018), 5 (DE-627)798561173 (DE-600)2787755-3 20545703 nnns volume:5 year:2018 number:5 https://doi.org/10.1098/rsos.171838 kostenfrei https://doaj.org/article/02a0519af4904c28bb8623fc07b4f783 kostenfrei https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171838 kostenfrei https://doaj.org/toc/2054-5703 Journal toc kostenfrei GBV_USEFLAG_A SYSFLAG_A GBV_DOAJ SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2001 GBV_ILN_2005 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 5 2018 5
language	English
source	In Royal Society Open Science 5(2018), 5 volume:5 year:2018 number:5
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topic_facet	scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose Science Q
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authorswithroles_txt_mv	Karthikeyan Gnanasekaran @@aut@@ Gijsbertus de With @@aut@@ Heiner Friedrich @@aut@@
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author	Karthikeyan Gnanasekaran
spellingShingle	Karthikeyan Gnanasekaran misc scanning transmission electron microscopy misc monte carlo simulations misc image contrast misc beam-sensitive materials misc low-contrast materials misc electron dose misc Science misc Q Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
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topic_title	Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials scanning transmission electron microscopy monte carlo simulations image contrast beam-sensitive materials low-contrast materials electron dose
topic	misc scanning transmission electron microscopy misc monte carlo simulations misc image contrast misc beam-sensitive materials misc low-contrast materials misc electron dose misc Science misc Q
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title	Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
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title_full	Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
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title_sort	quantification and optimization of adf-stem image contrast for beam-sensitive materials
title_auth	Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
abstract	Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions.
abstractGer	Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions.
abstract_unstemmed	Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF) STEM imaging conditions and detector geometries for a thick and beam-sensitive low-contrast specimen using the example of a carbon nanotube/polymer nanocomposite. We carried out Monte Carlo simulations as well as quantitative ADF-STEM imaging experiments to predict and verify optimum contrast conditions. The presented method is general, can be easily adapted to other beam-sensitive and/or low-contrast materials, as shown for a polymer vesicle within a TEM liquid cell, and can act as an expert guide on whether an experiment is feasible and to determine the best imaging conditions.
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title_short	Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
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Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials

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