Review of Active Thermal Control for Power Electronics: Potentials, Limitations, and Future Trends

The main factor that drives the aging of power semiconductor modules is the thermally induced stress caused by the maximum temperature and temperature swings. This thermally induced stress is usually counteracted in passive designs with oversizing of components, which brings additional cost to the s...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Anas Ibrahim [verfasserIn]

Mohamed Salem [verfasserIn]

Mohamad Kamarol [verfasserIn]

Maria Teresa Delgado [verfasserIn]

Mohd Khairunaz Mat Desa [verfasserIn]

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2024

Schlagwörter:

Active thermal control

junction temperature control

reliability enhancement

power electronics

semiconductor device lifetime

Übergeordnetes Werk:

In: IEEE Open Journal of Power Electronics - IEEE, 2021, 5(2024), Seite 414-435

Übergeordnetes Werk:

volume:5 ; year:2024 ; pages:414-435

Links:

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Journal toc

DOI / URN:

10.1109/OJPEL.2024.3376086

Katalog-ID:

DOAJ097344915

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