A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications

In nanomaterials and microstructural evolution, electron microscopy has had an important effect on materials investigation. Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Diffraction, Operando Electron Microscopy, and...
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Gespeichert in:

Autor*in:	Agrawal Manoj [verfasserIn] Prasad VVSH [verfasserIn] Nijhawan Ginni [verfasserIn] Jalal Sarah Salah [verfasserIn] Rajalakshmi B [verfasserIn] Dwivedi Shashi Prakash [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch ; Französisch

Erschienen:	2024

Schlagwörter:	electron microscopy transmission electron microscopy (tem) scanning electron microscopy (sem) microstructural analysis

Übergeordnetes Werk:	In: E3S Web of Conferences - EDP Sciences, 2013, 505, p 01029(2024)
Übergeordnetes Werk:	volume:505, p 01029 ; year:2024

Links:	Link aufrufen Link aufrufen Link aufrufen Journal toc

DOI / URN:	10.1051/e3sconf/202450501029

Katalog-ID:	DOAJ098615289

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callnumber-first	G - Geography, Anthropology, Recreation
author	Agrawal Manoj
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topic_title	GE1-350 A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications electron microscopy transmission electron microscopy (tem) scanning electron microscopy (sem) microstructural analysis
topic	misc GE1-350 misc electron microscopy misc transmission electron microscopy (tem) misc scanning electron microscopy (sem) misc microstructural analysis misc Environmental sciences
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title	A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications
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title_sort	comprehensive review of electron microscopy in materials science: technological advances and applications
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title_auth	A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications
abstract	In nanomaterials and microstructural evolution, electron microscopy has had an important effect on materials investigation. Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Diffraction, Operando Electron Microscopy, and Aberration-Corrected Electron Microscopy offer the investigation on understanding of nanoscale material properties and structure. The present research covers the basics, advantages and disadvantages, and material-related applications of various electron microscopy techniques. TEM is useful for investigating atomic arrangements and imperfections in materials, while SEM offers micro- to nanoscale topographical, morphological, & compositional information. EDS, frequently employed with SEM or TEM, analyzes elements and compounds to determine material compositions. Opando Electron Microscopy allows researchers to observe and assess materials during catalytic reactions and battery charge/discharge cycles. This approach is vital for knowing how dynamic processes influence nanoscale material characteristics and behaviour. Another advanced technique, Aberration-Corrected Electron Microscopy, corrects lens aberrations that interfered with electron microscope resolution. This adjustment enables imaging at sample-limited resolutions, allowing further studies of atomic structures & flaws. These electron microscopy methods significantly improve nanomaterial microstructural evolution understanding. These have enabled extensive study of flaws, transitions between phases, and formation mechanisms, which are essential to producing optimal materials.
abstractGer	In nanomaterials and microstructural evolution, electron microscopy has had an important effect on materials investigation. Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Diffraction, Operando Electron Microscopy, and Aberration-Corrected Electron Microscopy offer the investigation on understanding of nanoscale material properties and structure. The present research covers the basics, advantages and disadvantages, and material-related applications of various electron microscopy techniques. TEM is useful for investigating atomic arrangements and imperfections in materials, while SEM offers micro- to nanoscale topographical, morphological, & compositional information. EDS, frequently employed with SEM or TEM, analyzes elements and compounds to determine material compositions. Opando Electron Microscopy allows researchers to observe and assess materials during catalytic reactions and battery charge/discharge cycles. This approach is vital for knowing how dynamic processes influence nanoscale material characteristics and behaviour. Another advanced technique, Aberration-Corrected Electron Microscopy, corrects lens aberrations that interfered with electron microscope resolution. This adjustment enables imaging at sample-limited resolutions, allowing further studies of atomic structures & flaws. These electron microscopy methods significantly improve nanomaterial microstructural evolution understanding. These have enabled extensive study of flaws, transitions between phases, and formation mechanisms, which are essential to producing optimal materials.
abstract_unstemmed	In nanomaterials and microstructural evolution, electron microscopy has had an important effect on materials investigation. Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Diffraction, Operando Electron Microscopy, and Aberration-Corrected Electron Microscopy offer the investigation on understanding of nanoscale material properties and structure. The present research covers the basics, advantages and disadvantages, and material-related applications of various electron microscopy techniques. TEM is useful for investigating atomic arrangements and imperfections in materials, while SEM offers micro- to nanoscale topographical, morphological, & compositional information. EDS, frequently employed with SEM or TEM, analyzes elements and compounds to determine material compositions. Opando Electron Microscopy allows researchers to observe and assess materials during catalytic reactions and battery charge/discharge cycles. This approach is vital for knowing how dynamic processes influence nanoscale material characteristics and behaviour. Another advanced technique, Aberration-Corrected Electron Microscopy, corrects lens aberrations that interfered with electron microscope resolution. This adjustment enables imaging at sample-limited resolutions, allowing further studies of atomic structures & flaws. These electron microscopy methods significantly improve nanomaterial microstructural evolution understanding. These have enabled extensive study of flaws, transitions between phases, and formation mechanisms, which are essential to producing optimal materials.
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title_short	A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications
url	https://doi.org/10.1051/e3sconf/202450501029 https://doaj.org/article/4331360d5bb4421ea4826b09bafc3f4f https://www.e3s-conferences.org/articles/e3sconf/pdf/2024/35/e3sconf_icarae2023_01029.pdf https://doaj.org/toc/2267-1242
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A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications

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