Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice
Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In t...
Ausführliche Beschreibung
Autor*in: |
Hur, Ji-Hyun [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2019 |
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Schlagwörter: |
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Übergeordnetes Werk: |
Enthalten in: Physics letters / A - Amsterdam : North-Holland Publ., 1967, 383, Seite 1182-1186 |
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Übergeordnetes Werk: |
volume:383 ; pages:1182-1186 |
DOI / URN: |
10.1016/j.physleta.2018.12.039 |
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Katalog-ID: |
ELV001836056 |
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520 | |a Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. | ||
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10.1016/j.physleta.2018.12.039 doi (DE-627)ELV001836056 (ELSEVIER)S0375-9601(18)31274-X DE-627 ger DE-627 rda eng 530 DE-600 33.00 bkl Hur, Ji-Hyun verfasserin (orcid)0000-0002-3927-5605 aut Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice 2019 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. Resistive memory Oxide memory OxRAM Modeling Resistance variability Resistance deviation Enthalten in Physics letters / A Amsterdam : North-Holland Publ., 1967 383, Seite 1182-1186 Online-Ressource (DE-627)266015298 (DE-600)1466603-0 (DE-576)074959905 1873-2429 nnns volume:383 pages:1182-1186 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.00 Physik: Allgemeines AR 383 1182-1186 |
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10.1016/j.physleta.2018.12.039 doi (DE-627)ELV001836056 (ELSEVIER)S0375-9601(18)31274-X DE-627 ger DE-627 rda eng 530 DE-600 33.00 bkl Hur, Ji-Hyun verfasserin (orcid)0000-0002-3927-5605 aut Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice 2019 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. Resistive memory Oxide memory OxRAM Modeling Resistance variability Resistance deviation Enthalten in Physics letters / A Amsterdam : North-Holland Publ., 1967 383, Seite 1182-1186 Online-Ressource (DE-627)266015298 (DE-600)1466603-0 (DE-576)074959905 1873-2429 nnns volume:383 pages:1182-1186 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.00 Physik: Allgemeines AR 383 1182-1186 |
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10.1016/j.physleta.2018.12.039 doi (DE-627)ELV001836056 (ELSEVIER)S0375-9601(18)31274-X DE-627 ger DE-627 rda eng 530 DE-600 33.00 bkl Hur, Ji-Hyun verfasserin (orcid)0000-0002-3927-5605 aut Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice 2019 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. Resistive memory Oxide memory OxRAM Modeling Resistance variability Resistance deviation Enthalten in Physics letters / A Amsterdam : North-Holland Publ., 1967 383, Seite 1182-1186 Online-Ressource (DE-627)266015298 (DE-600)1466603-0 (DE-576)074959905 1873-2429 nnns volume:383 pages:1182-1186 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.00 Physik: Allgemeines AR 383 1182-1186 |
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10.1016/j.physleta.2018.12.039 doi (DE-627)ELV001836056 (ELSEVIER)S0375-9601(18)31274-X DE-627 ger DE-627 rda eng 530 DE-600 33.00 bkl Hur, Ji-Hyun verfasserin (orcid)0000-0002-3927-5605 aut Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice 2019 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. Resistive memory Oxide memory OxRAM Modeling Resistance variability Resistance deviation Enthalten in Physics letters / A Amsterdam : North-Holland Publ., 1967 383, Seite 1182-1186 Online-Ressource (DE-627)266015298 (DE-600)1466603-0 (DE-576)074959905 1873-2429 nnns volume:383 pages:1182-1186 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.00 Physik: Allgemeines AR 383 1182-1186 |
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10.1016/j.physleta.2018.12.039 doi (DE-627)ELV001836056 (ELSEVIER)S0375-9601(18)31274-X DE-627 ger DE-627 rda eng 530 DE-600 33.00 bkl Hur, Ji-Hyun verfasserin (orcid)0000-0002-3927-5605 aut Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice 2019 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. Resistive memory Oxide memory OxRAM Modeling Resistance variability Resistance deviation Enthalten in Physics letters / A Amsterdam : North-Holland Publ., 1967 383, Seite 1182-1186 Online-Ressource (DE-627)266015298 (DE-600)1466603-0 (DE-576)074959905 1873-2429 nnns volume:383 pages:1182-1186 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.00 Physik: Allgemeines AR 383 1182-1186 |
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Hur, Ji-Hyun |
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530 DE-600 33.00 bkl Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice Resistive memory Oxide memory OxRAM Modeling Resistance variability Resistance deviation |
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mechanism of resistance distribution properties in oxide-based resistance switching nanodevice |
title_auth |
Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice |
abstract |
Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. |
abstractGer |
Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. |
abstract_unstemmed |
Although oxide-based resistive switching memory (OxRAM) is one of the strong next-generation high-capacity memory candidates, it has an unresolved problem that the higher the resistance levels, the larger the cycle-to-cycle resistance variabilities to be operated in multi-resistance level mode. In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. From the theory, we can finally understand the fundamental capabilities of multi-resistance level operation of OxRAMs, and how to improve the switching properties within that. |
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Mechanism of resistance distribution properties in oxide-based resistance switching nanodevice |
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In this paper, we develop a simple theory from the operating principles of OxRAMs that excellently matches with experiments both qualitatively and quantitatively. 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