Development of an automated and programmable characterization system for silicon multi-strip sensors
The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the inst...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Jain, G. [verfasserIn] Jain, C. [verfasserIn] Kumar, A. [verfasserIn] Sisodia, A. [verfasserIn] Sharma, S. [verfasserIn] Saxena, M. [verfasserIn] Bhardwaj, A. [verfasserIn] Ranjan, K. [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2018 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: Nuclear instruments & methods in physics research / A - Amsterdam : North-Holland Publ. Co., 1984, 936, Seite 663-665 |
|---|---|
| Übergeordnetes Werk: |
volume:936 ; pages:663-665 |
| DOI / URN: |
10.1016/j.nima.2018.10.115 |
|---|
| Katalog-ID: |
ELV002454378 |
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| 520 | |a The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. | ||
| 650 | 4 | |a CMS | |
| 650 | 4 | |a Tracker | |
| 650 | 4 | |a Silicon sensor | |
| 650 | 4 | |a Characterization | |
| 700 | 1 | |a Jain, C. |e verfasserin |4 aut | |
| 700 | 1 | |a Kumar, A. |e verfasserin |4 aut | |
| 700 | 1 | |a Sisodia, A. |e verfasserin |4 aut | |
| 700 | 1 | |a Sharma, S. |e verfasserin |4 aut | |
| 700 | 1 | |a Saxena, M. |e verfasserin |4 aut | |
| 700 | 1 | |a Bhardwaj, A. |e verfasserin |4 aut | |
| 700 | 1 | |a Ranjan, K. |e verfasserin |4 aut | |
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10.1016/j.nima.2018.10.115 doi (DE-627)ELV002454378 (ELSEVIER)S0168-9002(18)31429-3 DE-627 ger DE-627 rda eng 530 DE-600 33.05 bkl 33.07 bkl 33.40 bkl Jain, G. verfasserin aut Development of an automated and programmable characterization system for silicon multi-strip sensors 2018 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. CMS Tracker Silicon sensor Characterization Jain, C. verfasserin aut Kumar, A. verfasserin aut Sisodia, A. verfasserin aut Sharma, S. verfasserin aut Saxena, M. verfasserin aut Bhardwaj, A. verfasserin aut Ranjan, K. verfasserin aut Enthalten in Nuclear instruments & methods in physics research / A Amsterdam : North-Holland Publ. Co., 1984 936, Seite 663-665 Online-Ressource (DE-627)266014666 (DE-600)1466532-3 (DE-576)074959743 0168-9002 nnns volume:936 pages:663-665 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.05 Experimentalphysik 33.07 Spektroskopie 33.40 Kernphysik AR 936 663-665 |
| spelling |
10.1016/j.nima.2018.10.115 doi (DE-627)ELV002454378 (ELSEVIER)S0168-9002(18)31429-3 DE-627 ger DE-627 rda eng 530 DE-600 33.05 bkl 33.07 bkl 33.40 bkl Jain, G. verfasserin aut Development of an automated and programmable characterization system for silicon multi-strip sensors 2018 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. CMS Tracker Silicon sensor Characterization Jain, C. verfasserin aut Kumar, A. verfasserin aut Sisodia, A. verfasserin aut Sharma, S. verfasserin aut Saxena, M. verfasserin aut Bhardwaj, A. verfasserin aut Ranjan, K. verfasserin aut Enthalten in Nuclear instruments & methods in physics research / A Amsterdam : North-Holland Publ. Co., 1984 936, Seite 663-665 Online-Ressource (DE-627)266014666 (DE-600)1466532-3 (DE-576)074959743 0168-9002 nnns volume:936 pages:663-665 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.05 Experimentalphysik 33.07 Spektroskopie 33.40 Kernphysik AR 936 663-665 |
| allfields_unstemmed |
10.1016/j.nima.2018.10.115 doi (DE-627)ELV002454378 (ELSEVIER)S0168-9002(18)31429-3 DE-627 ger DE-627 rda eng 530 DE-600 33.05 bkl 33.07 bkl 33.40 bkl Jain, G. verfasserin aut Development of an automated and programmable characterization system for silicon multi-strip sensors 2018 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. CMS Tracker Silicon sensor Characterization Jain, C. verfasserin aut Kumar, A. verfasserin aut Sisodia, A. verfasserin aut Sharma, S. verfasserin aut Saxena, M. verfasserin aut Bhardwaj, A. verfasserin aut Ranjan, K. verfasserin aut Enthalten in Nuclear instruments & methods in physics research / A Amsterdam : North-Holland Publ. Co., 1984 936, Seite 663-665 Online-Ressource (DE-627)266014666 (DE-600)1466532-3 (DE-576)074959743 0168-9002 nnns volume:936 pages:663-665 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.05 Experimentalphysik 33.07 Spektroskopie 33.40 Kernphysik AR 936 663-665 |
| allfieldsGer |
10.1016/j.nima.2018.10.115 doi (DE-627)ELV002454378 (ELSEVIER)S0168-9002(18)31429-3 DE-627 ger DE-627 rda eng 530 DE-600 33.05 bkl 33.07 bkl 33.40 bkl Jain, G. verfasserin aut Development of an automated and programmable characterization system for silicon multi-strip sensors 2018 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. CMS Tracker Silicon sensor Characterization Jain, C. verfasserin aut Kumar, A. verfasserin aut Sisodia, A. verfasserin aut Sharma, S. verfasserin aut Saxena, M. verfasserin aut Bhardwaj, A. verfasserin aut Ranjan, K. verfasserin aut Enthalten in Nuclear instruments & methods in physics research / A Amsterdam : North-Holland Publ. Co., 1984 936, Seite 663-665 Online-Ressource (DE-627)266014666 (DE-600)1466532-3 (DE-576)074959743 0168-9002 nnns volume:936 pages:663-665 GBV_USEFLAG_U SYSFLAG_U GBV_ELV GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 33.05 Experimentalphysik 33.07 Spektroskopie 33.40 Kernphysik AR 936 663-665 |
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Development of an automated and programmable characterization system for silicon multi-strip sensors |
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Development of an automated and programmable characterization system for silicon multi-strip sensors |
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Jain, G. |
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Nuclear instruments & methods in physics research / A |
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Jain, G. Jain, C. Kumar, A. Sisodia, A. Sharma, S. Saxena, M. Bhardwaj, A. Ranjan, K. |
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development of an automated and programmable characterization system for silicon multi-strip sensors |
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Development of an automated and programmable characterization system for silicon multi-strip sensors |
| abstract |
The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. |
| abstractGer |
The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. |
| abstract_unstemmed |
The CMS tracking system will demand a large quantity of multi-strip silicon sensors, which must fulfill stringent tolerance criteria to maintain the physics performance in the High Luminosity (HL) phase of the LHC. Thus, a subset of the fabricated sensors must be extensively tested prior to the installation in the main detector system. This will be achieved through measurement of various global and strip parameters of silicon strip sensors as envisaged in a detailed quality assurance program for phase II upgrade of CMS tracker. Also, to handle the large quantity of the pixel and strip sensors and other constraints, the characterization setup should have multi-functionality features, including automation. A fully automated and programmable characterization system for testing silicon multi-strip sensors has been under development at University of Delhi. The entire system is controlled though an Automated Characterization Suite (ACS). Various features of the characterization system along with some measurement results are presented in this work. |
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Development of an automated and programmable characterization system for silicon multi-strip sensors |
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