Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation

In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of phot...
Ausführliche Beschreibung

Gespeichert in:

Autor*in:	Tavares, Vitor Silva [verfasserIn] Calliari, Felipe [verfasserIn] Costa Monteiro, Elisabeth [verfasserIn] Temporão, Guilherme Penello [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2021

Schlagwörter:	Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology

Übergeordnetes Werk:	Enthalten in: Measurement - Amsterdam [u.a.] : Elsevier Science, 1983, 189
Übergeordnetes Werk:	volume:189

DOI / URN:	10.1016/j.measurement.2021.110631

Katalog-ID:	ELV007302371

Internformat


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245	1	0	\|a Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
264		1	\|c 2021
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337			\|a Computermedien \|b c \|2 rdamedia
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520			\|a In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4.
650		4	\|a Single-photon detector
650		4	\|a Single-photon avalanche diode
650		4	\|a Gate width
650		4	\|a Measurement uncertainty
650		4	\|a Quantum metrology
700	1		\|a Calliari, Felipe \|e verfasserin \|4 aut
700	1		\|a Costa Monteiro, Elisabeth \|e verfasserin \|4 aut
700	1		\|a Temporão, Guilherme Penello \|e verfasserin \|4 aut
773	0	8	\|i Enthalten in \|t Measurement \|d Amsterdam [u.a.] : Elsevier Science, 1983 \|g 189 \|h Online-Ressource \|w (DE-627)320404927 \|w (DE-600)2000550-7 \|w (DE-576)259484342 \|7 nnns
773	1	8	\|g volume:189
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912			\|a GBV_ILN_22
912			\|a GBV_ILN_23
912			\|a GBV_ILN_24
912			\|a GBV_ILN_31
912			\|a GBV_ILN_32
912			\|a GBV_ILN_40
912			\|a GBV_ILN_60
912			\|a GBV_ILN_62
912			\|a GBV_ILN_63
912			\|a GBV_ILN_65
912			\|a GBV_ILN_69
912			\|a GBV_ILN_70
912			\|a GBV_ILN_73
912			\|a GBV_ILN_74
912			\|a GBV_ILN_90
912			\|a GBV_ILN_95
912			\|a GBV_ILN_100
912			\|a GBV_ILN_105
912			\|a GBV_ILN_110
912			\|a GBV_ILN_150
912			\|a GBV_ILN_151
912			\|a GBV_ILN_224
912			\|a GBV_ILN_370
912			\|a GBV_ILN_602
912			\|a GBV_ILN_702
912			\|a GBV_ILN_2003
912			\|a GBV_ILN_2004
912			\|a GBV_ILN_2005
912			\|a GBV_ILN_2008
912			\|a GBV_ILN_2010
912			\|a GBV_ILN_2011
912			\|a GBV_ILN_2014
912			\|a GBV_ILN_2015
912			\|a GBV_ILN_2020
912			\|a GBV_ILN_2021
912			\|a GBV_ILN_2025
912			\|a GBV_ILN_2027
912			\|a GBV_ILN_2034
912			\|a GBV_ILN_2038
912			\|a GBV_ILN_2044
912			\|a GBV_ILN_2048
912			\|a GBV_ILN_2049
912			\|a GBV_ILN_2050
912			\|a GBV_ILN_2056
912			\|a GBV_ILN_2059
912			\|a GBV_ILN_2061
912			\|a GBV_ILN_2064
912			\|a GBV_ILN_2065
912			\|a GBV_ILN_2068
912			\|a GBV_ILN_2088
912			\|a GBV_ILN_2111
912			\|a GBV_ILN_2112
912			\|a GBV_ILN_2113
912			\|a GBV_ILN_2118
912			\|a GBV_ILN_2122
912			\|a GBV_ILN_2129
912			\|a GBV_ILN_2143
912			\|a GBV_ILN_2147
912			\|a GBV_ILN_2148
912			\|a GBV_ILN_2152
912			\|a GBV_ILN_2153
912			\|a GBV_ILN_2190
912			\|a GBV_ILN_2336
912			\|a GBV_ILN_2470
912			\|a GBV_ILN_2507
912			\|a GBV_ILN_2522
912			\|a GBV_ILN_4035
912			\|a GBV_ILN_4037
912			\|a GBV_ILN_4046
912			\|a GBV_ILN_4112
912			\|a GBV_ILN_4125
912			\|a GBV_ILN_4126
912			\|a GBV_ILN_4242
912			\|a GBV_ILN_4251
912			\|a GBV_ILN_4305
912			\|a GBV_ILN_4313
912			\|a GBV_ILN_4322
912			\|a GBV_ILN_4323
912			\|a GBV_ILN_4324
912			\|a GBV_ILN_4325
912			\|a GBV_ILN_4326
912			\|a GBV_ILN_4333
912			\|a GBV_ILN_4334
912			\|a GBV_ILN_4335
912			\|a GBV_ILN_4338
912			\|a GBV_ILN_4393
936	b	k	\|a 50.21 \|j Messtechnik
951			\|a AR
952			\|d 189

Indexfelder

author_variant	v s t vs vst f c fc m e c me mec g p t gp gpt
matchkey_str	tavaresvitorsilvacalliarifelipecostamont:2021----:erlgclvlainfhifunefhdtcinaeitoaigehtnee
hierarchy_sort_str	2021
bklnumber	50.21
publishDate	2021
allfields	10.1016/j.measurement.2021.110631 doi (DE-627)ELV007302371 (ELSEVIER)S0263-2241(21)01501-3 DE-627 ger DE-627 rda eng 660 DE-600 50.21 bkl Tavares, Vitor Silva verfasserin aut Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4. Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology Calliari, Felipe verfasserin aut Costa Monteiro, Elisabeth verfasserin aut Temporão, Guilherme Penello verfasserin aut Enthalten in Measurement Amsterdam [u.a.] : Elsevier Science, 1983 189 Online-Ressource (DE-627)320404927 (DE-600)2000550-7 (DE-576)259484342 nnns volume:189 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 50.21 Messtechnik AR 189
spelling	10.1016/j.measurement.2021.110631 doi (DE-627)ELV007302371 (ELSEVIER)S0263-2241(21)01501-3 DE-627 ger DE-627 rda eng 660 DE-600 50.21 bkl Tavares, Vitor Silva verfasserin aut Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4. Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology Calliari, Felipe verfasserin aut Costa Monteiro, Elisabeth verfasserin aut Temporão, Guilherme Penello verfasserin aut Enthalten in Measurement Amsterdam [u.a.] : Elsevier Science, 1983 189 Online-Ressource (DE-627)320404927 (DE-600)2000550-7 (DE-576)259484342 nnns volume:189 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 50.21 Messtechnik AR 189
allfields_unstemmed	10.1016/j.measurement.2021.110631 doi (DE-627)ELV007302371 (ELSEVIER)S0263-2241(21)01501-3 DE-627 ger DE-627 rda eng 660 DE-600 50.21 bkl Tavares, Vitor Silva verfasserin aut Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4. Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology Calliari, Felipe verfasserin aut Costa Monteiro, Elisabeth verfasserin aut Temporão, Guilherme Penello verfasserin aut Enthalten in Measurement Amsterdam [u.a.] : Elsevier Science, 1983 189 Online-Ressource (DE-627)320404927 (DE-600)2000550-7 (DE-576)259484342 nnns volume:189 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 50.21 Messtechnik AR 189
allfieldsGer	10.1016/j.measurement.2021.110631 doi (DE-627)ELV007302371 (ELSEVIER)S0263-2241(21)01501-3 DE-627 ger DE-627 rda eng 660 DE-600 50.21 bkl Tavares, Vitor Silva verfasserin aut Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4. Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology Calliari, Felipe verfasserin aut Costa Monteiro, Elisabeth verfasserin aut Temporão, Guilherme Penello verfasserin aut Enthalten in Measurement Amsterdam [u.a.] : Elsevier Science, 1983 189 Online-Ressource (DE-627)320404927 (DE-600)2000550-7 (DE-576)259484342 nnns volume:189 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 50.21 Messtechnik AR 189
allfieldsSound	10.1016/j.measurement.2021.110631 doi (DE-627)ELV007302371 (ELSEVIER)S0263-2241(21)01501-3 DE-627 ger DE-627 rda eng 660 DE-600 50.21 bkl Tavares, Vitor Silva verfasserin aut Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4. Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology Calliari, Felipe verfasserin aut Costa Monteiro, Elisabeth verfasserin aut Temporão, Guilherme Penello verfasserin aut Enthalten in Measurement Amsterdam [u.a.] : Elsevier Science, 1983 189 Online-Ressource (DE-627)320404927 (DE-600)2000550-7 (DE-576)259484342 nnns volume:189 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 50.21 Messtechnik AR 189
language	English
source	Enthalten in Measurement 189 volume:189
sourceStr	Enthalten in Measurement 189 volume:189
format_phy_str_mv	Article
bklname	Messtechnik
institution	findex.gbv.de
topic_facet	Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology
dewey-raw	660
isfreeaccess_bool	false
container_title	Measurement
authorswithroles_txt_mv	Tavares, Vitor Silva @@aut@@ Calliari, Felipe @@aut@@ Costa Monteiro, Elisabeth @@aut@@ Temporão, Guilherme Penello @@aut@@
publishDateDaySort_date	2021-01-01T00:00:00Z
hierarchy_top_id	320404927
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id	ELV007302371
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author	Tavares, Vitor Silva
spellingShingle	Tavares, Vitor Silva ddc 660 bkl 50.21 misc Single-photon detector misc Single-photon avalanche diode misc Gate width misc Measurement uncertainty misc Quantum metrology Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
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topic_title	660 DE-600 50.21 bkl Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation Single-photon detector Single-photon avalanche diode Gate width Measurement uncertainty Quantum metrology
topic	ddc 660 bkl 50.21 misc Single-photon detector misc Single-photon avalanche diode misc Gate width misc Measurement uncertainty misc Quantum metrology
topic_unstemmed	ddc 660 bkl 50.21 misc Single-photon detector misc Single-photon avalanche diode misc Gate width misc Measurement uncertainty misc Quantum metrology
topic_browse	ddc 660 bkl 50.21 misc Single-photon detector misc Single-photon avalanche diode misc Gate width misc Measurement uncertainty misc Quantum metrology
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title	Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
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title_full	Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
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author_browse	Tavares, Vitor Silva Calliari, Felipe Costa Monteiro, Elisabeth Temporão, Guilherme Penello
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title_sort	metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
title_auth	Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
abstract	In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4.
abstractGer	In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4.
abstract_unstemmed	In this paper, we propose a method for evaluating the impact of the detection gate width of an InGaAs/InP single-photon avalanche diode detector by analyzing the probability of detecting 0 or 1 photon as a function of the optical attenuation and the consequent variation of the average number of photons per gate measured by the detector ( μ ¯ ). With a detection efficiency η of 15 % and a dead time of 1 µs, considering gate widths of 4 ns, 8 ns, 12 ns, 16 ns, and 20 ns, an adequate optical power range for calibrating a single-photon avalanche diode detector was obtained in the range of 0.15 nW to 10 nW, with linear behavior and low measurement uncertainty of calibration curve fittings for 4 ns and 8 ns gate widths, respectively, associated with products μ ¯ η of 0.32 × 10-4 to 190 × 10-4 and 2.90 × 10-4 to 140 × 10-4.
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title_short	Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation
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author2	Calliari, Felipe Costa Monteiro, Elisabeth Temporão, Guilherme Penello
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up_date	2024-07-07T00:17:30.821Z
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Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation

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