Synchrotron-Excited Luminescence and Converting of Defects and Quantum Dots in Modified Silica Films

Optically active defects in modified silicon oxide films on a silicon substrate have been studied by low-temperature photoluminescence (PL) spectroscopy using excitation by synchrotron radiation in the vacuum ultraviolet region. Films of dry thermal silicon oxide obtained by treatment of stoichiomet...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Pustovarov, V.A. [verfasserIn]

Zatsepin, A.F. [verfasserIn]

Biryukov, D.Yu. [verfasserIn]

Aliev, V.Sh. [verfasserIn]

Iskhakzay, R.M.Kh. [verfasserIn]

Gritsenko, V.A. [verfasserIn]

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2022

Schlagwörter:

Silicon oxide films

Photoluminescence

Synchrotron radiation

Oxygen-deficient centers

Quantum dots

Excitons

Übergeordnetes Werk:

Enthalten in: Journal of non-crystalline solids - Amsterdam [u.a.] : Elsevier Science, 1968, 602

Übergeordnetes Werk:

volume:602

DOI / URN:

10.1016/j.jnoncrysol.2022.122077

Katalog-ID:

ELV008995095

Nicht das Richtige dabei?

Schreiben Sie uns!