Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy

Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such su...
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Gespeichert in:

Autor*in:	Byers, Todd A. [verfasserIn] Manuel, Jack E. [verfasserIn] Ponette-Gonzalez, Alexandra G. [verfasserIn] Gill, Thomas E. [verfasserIn] Glass, Gary A. [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2023

Schlagwörter:	PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust

Übergeordnetes Werk:	Enthalten in: Microchemical journal - Orlando, Fla. : Academic Press, 1957, 192
Übergeordnetes Werk:	volume:192

DOI / URN:	10.1016/j.microc.2023.108928

Katalog-ID:	ELV010565078

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520			\|a Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority.
650		4	\|a PIXE
650		4	\|a X-ray spectroscopy
650		4	\|a Polysulfone
650		4	\|a GeoPIXE
650		4	\|a Rainwater
650		4	\|a Dust
700	1		\|a Manuel, Jack E. \|e verfasserin \|4 aut
700	1		\|a Ponette-Gonzalez, Alexandra G. \|e verfasserin \|0 (orcid)0000-0003-2908-2938 \|4 aut
700	1		\|a Gill, Thomas E. \|e verfasserin \|0 (orcid)0000-0001-9011-4105 \|4 aut
700	1		\|a Glass, Gary A. \|e verfasserin \|4 aut
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allfields	10.1016/j.microc.2023.108928 doi (DE-627)ELV010565078 (ELSEVIER)S0026-265X(23)00546-5 DE-627 ger DE-627 rda eng 540 VZ 35.00 bkl Byers, Todd A. verfasserin (orcid)0000-0003-0704-9264 aut Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority. PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust Manuel, Jack E. verfasserin aut Ponette-Gonzalez, Alexandra G. verfasserin (orcid)0000-0003-2908-2938 aut Gill, Thomas E. verfasserin (orcid)0000-0001-9011-4105 aut Glass, Gary A. verfasserin aut Enthalten in Microchemical journal Orlando, Fla. : Academic Press, 1957 192 Online-Ressource (DE-627)267840217 (DE-600)1471165-5 (DE-576)259483729 1095-9149 nnns volume:192 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.00 Chemie: Allgemeines VZ AR 192
spelling	10.1016/j.microc.2023.108928 doi (DE-627)ELV010565078 (ELSEVIER)S0026-265X(23)00546-5 DE-627 ger DE-627 rda eng 540 VZ 35.00 bkl Byers, Todd A. verfasserin (orcid)0000-0003-0704-9264 aut Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority. PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust Manuel, Jack E. verfasserin aut Ponette-Gonzalez, Alexandra G. verfasserin (orcid)0000-0003-2908-2938 aut Gill, Thomas E. verfasserin (orcid)0000-0001-9011-4105 aut Glass, Gary A. verfasserin aut Enthalten in Microchemical journal Orlando, Fla. : Academic Press, 1957 192 Online-Ressource (DE-627)267840217 (DE-600)1471165-5 (DE-576)259483729 1095-9149 nnns volume:192 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.00 Chemie: Allgemeines VZ AR 192
allfields_unstemmed	10.1016/j.microc.2023.108928 doi (DE-627)ELV010565078 (ELSEVIER)S0026-265X(23)00546-5 DE-627 ger DE-627 rda eng 540 VZ 35.00 bkl Byers, Todd A. verfasserin (orcid)0000-0003-0704-9264 aut Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority. PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust Manuel, Jack E. verfasserin aut Ponette-Gonzalez, Alexandra G. verfasserin (orcid)0000-0003-2908-2938 aut Gill, Thomas E. verfasserin (orcid)0000-0001-9011-4105 aut Glass, Gary A. verfasserin aut Enthalten in Microchemical journal Orlando, Fla. : Academic Press, 1957 192 Online-Ressource (DE-627)267840217 (DE-600)1471165-5 (DE-576)259483729 1095-9149 nnns volume:192 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.00 Chemie: Allgemeines VZ AR 192
allfieldsGer	10.1016/j.microc.2023.108928 doi (DE-627)ELV010565078 (ELSEVIER)S0026-265X(23)00546-5 DE-627 ger DE-627 rda eng 540 VZ 35.00 bkl Byers, Todd A. verfasserin (orcid)0000-0003-0704-9264 aut Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority. PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust Manuel, Jack E. verfasserin aut Ponette-Gonzalez, Alexandra G. verfasserin (orcid)0000-0003-2908-2938 aut Gill, Thomas E. verfasserin (orcid)0000-0001-9011-4105 aut Glass, Gary A. verfasserin aut Enthalten in Microchemical journal Orlando, Fla. : Academic Press, 1957 192 Online-Ressource (DE-627)267840217 (DE-600)1471165-5 (DE-576)259483729 1095-9149 nnns volume:192 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.00 Chemie: Allgemeines VZ AR 192
allfieldsSound	10.1016/j.microc.2023.108928 doi (DE-627)ELV010565078 (ELSEVIER)S0026-265X(23)00546-5 DE-627 ger DE-627 rda eng 540 VZ 35.00 bkl Byers, Todd A. verfasserin (orcid)0000-0003-0704-9264 aut Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority. PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust Manuel, Jack E. verfasserin aut Ponette-Gonzalez, Alexandra G. verfasserin (orcid)0000-0003-2908-2938 aut Gill, Thomas E. verfasserin (orcid)0000-0001-9011-4105 aut Glass, Gary A. verfasserin aut Enthalten in Microchemical journal Orlando, Fla. : Academic Press, 1957 192 Online-Ressource (DE-627)267840217 (DE-600)1471165-5 (DE-576)259483729 1095-9149 nnns volume:192 GBV_USEFLAG_U SYSFLAG_U GBV_ELV SSG-OLC-PHA GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2088 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.00 Chemie: Allgemeines VZ AR 192
language	English
source	Enthalten in Microchemical journal 192 volume:192
sourceStr	Enthalten in Microchemical journal 192 volume:192
format_phy_str_mv	Article
bklname	Chemie: Allgemeines
institution	findex.gbv.de
topic_facet	PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust
dewey-raw	540
isfreeaccess_bool	false
container_title	Microchemical journal
authorswithroles_txt_mv	Byers, Todd A. @@aut@@ Manuel, Jack E. @@aut@@ Ponette-Gonzalez, Alexandra G. @@aut@@ Gill, Thomas E. @@aut@@ Glass, Gary A. @@aut@@
publishDateDaySort_date	2023-01-01T00:00:00Z
hierarchy_top_id	267840217
dewey-sort	3540
id	ELV010565078
language_de	englisch
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author	Byers, Todd A.
spellingShingle	Byers, Todd A. ddc 540 bkl 35.00 misc PIXE misc X-ray spectroscopy misc Polysulfone misc GeoPIXE misc Rainwater misc Dust Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy
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topic_title	540 VZ 35.00 bkl Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy PIXE X-ray spectroscopy Polysulfone GeoPIXE Rainwater Dust
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title	Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy
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title_full	Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy
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title_sort	analysis of rain-deposited dust on polysulfone membranes using proton-induced x-ray emission spectroscopy
title_auth	Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy
abstract	Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority.
abstractGer	Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority.
abstract_unstemmed	Proton-induced X-ray emission spectroscopy (PIXE) is a long-established method of nondestructive elemental analysis for environmental samples. While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. Polysulfone is shown to be an appropriate substrate for PIXE analysis of environmental samples, especially when quantification of low-Z elements is not a priority.
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title_short	Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy
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author2	Manuel, Jack E. Ponette-Gonzalez, Alexandra G. Gill, Thomas E. Glass, Gary A.
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up_date	2024-07-06T18:26:21.235Z
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While a standard method of recovery of solids from rainwater involves filtration onto polysulfone media, PIXE analysis has not typically been used on such substrates. We describe methodologies of the University of North Texas Ion Beam Laboratory for PIXE analysis of dust in Texas rainwater on polysulfone membranes from the National Atmospheric Deposition Program (NADP). PIXE analyses utilized a 2 MeV proton beam of 1 × 1 mm2 spot size with beam currents of 1–5nA. A 100 µm Al absorber attenuated X-rays produced by S native to the polysulfone and minimized pileup, allowing use of higher beam currents at the expense of detecting elements of Z < 22. Uniformity of dust deposition on the membranes was evaluated by utilizing Fe concentration as a dust tracer. Areas of uniform particulate deposition with comparable results to averages across the entire membrane were located, allowing reduced acquisition time. GeoPIXE software was used for quantitative analysis, and 18 elements (Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, As, Se, Br, Rb, Sr, Y, Zr, Hg and Pb) were investigated for a collaborative project. Average minimum detection limits (MDL) were ≤ 10 ng/cm2 for 21 > Z greater than 36 and 10–30 ng/cm2 for 36 < Z < 83. 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Analysis of rain-deposited dust on polysulfone membranes using proton-induced X-ray emission spectroscopy

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