Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures
• A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid ther...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Li, Xuedong [verfasserIn] |
|---|
| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
2014 |
|---|
| Schlagwörter: |
|---|
| Umfang: |
5 |
|---|
| Übergeordnetes Werk: |
Enthalten in: Characterising shape patterns using features derived from best-fitting ellipsoids - Gontar, Amelia ELSEVIER, 2018, a journal devoted to applied physics and chemistry of surfaces and interfaces, Amsterdam |
|---|---|
| Übergeordnetes Werk: |
volume:314 ; year:2014 ; day:30 ; month:09 ; pages:124-128 ; extent:5 |
| Links: |
|---|
| DOI / URN: |
10.1016/j.apsusc.2014.06.149 |
|---|
| Katalog-ID: |
ELV012154687 |
|---|
| LEADER | 01000caa a22002652 4500 | ||
|---|---|---|---|
| 001 | ELV012154687 | ||
| 003 | DE-627 | ||
| 005 | 20230623094558.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 180602s2014 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.1016/j.apsusc.2014.06.149 |2 doi | |
| 028 | 5 | 2 | |a GBVA2014006000011.pica |
| 035 | |a (DE-627)ELV012154687 | ||
| 035 | |a (ELSEVIER)S0169-4332(14)01467-6 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 082 | 0 | |a 670 |a 530 |a 660 | |
| 082 | 0 | 4 | |a 670 |q DE-600 |
| 082 | 0 | 4 | |a 530 |q DE-600 |
| 082 | 0 | 4 | |a 660 |q DE-600 |
| 082 | 0 | 4 | |a 000 |a 150 |q VZ |
| 084 | |a 54.74 |2 bkl | ||
| 100 | 1 | |a Li, Xuedong |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures |
| 264 | 1 | |c 2014 | |
| 300 | |a 5 | ||
| 336 | |a nicht spezifiziert |b zzz |2 rdacontent | ||
| 337 | |a nicht spezifiziert |b z |2 rdamedia | ||
| 338 | |a nicht spezifiziert |b zu |2 rdacarrier | ||
| 520 | |a • A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). | ||
| 650 | 7 | |a Crystallization |2 Elsevier | |
| 650 | 7 | |a Multilayer thin films |2 Elsevier | |
| 650 | 7 | |a Percentage pyrochlore |2 Elsevier | |
| 650 | 7 | |a Loss of Pb |2 Elsevier | |
| 700 | 1 | |a Liu, Hong |4 oth | |
| 700 | 1 | |a Liu, Gang |4 oth | |
| 700 | 1 | |a Xiao, Dingquan |4 oth | |
| 700 | 1 | |a Zhu, Jianguo |4 oth | |
| 773 | 0 | 8 | |i Enthalten in |n Elsevier |a Gontar, Amelia ELSEVIER |t Characterising shape patterns using features derived from best-fitting ellipsoids |d 2018 |d a journal devoted to applied physics and chemistry of surfaces and interfaces |g Amsterdam |w (DE-627)ELV000097942 |
| 773 | 1 | 8 | |g volume:314 |g year:2014 |g day:30 |g month:09 |g pages:124-128 |g extent:5 |
| 856 | 4 | 0 | |u https://doi.org/10.1016/j.apsusc.2014.06.149 |3 Volltext |
| 912 | |a GBV_USEFLAG_U | ||
| 912 | |a GBV_ELV | ||
| 912 | |a SYSFLAG_U | ||
| 936 | b | k | |a 54.74 |j Maschinelles Sehen |q VZ |
| 951 | |a AR | ||
| 952 | |d 314 |j 2014 |b 30 |c 0930 |h 124-128 |g 5 | ||
| 953 | |2 045F |a 670 | ||
| author_variant |
x l xl |
|---|---|
| matchkey_str |
lixuedongliuhongliugangxiaodingquanzhuji:2014----:ilcrcnfrolcrcrprisf0oine0ps0t0o0pto05bc5 |
| hierarchy_sort_str |
2014 |
| bklnumber |
54.74 |
| publishDate |
2014 |
| allfields |
10.1016/j.apsusc.2014.06.149 doi GBVA2014006000011.pica (DE-627)ELV012154687 (ELSEVIER)S0169-4332(14)01467-6 DE-627 ger DE-627 rakwb eng 670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl Li, Xuedong verfasserin aut Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures 2014 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Elsevier Liu, Hong oth Liu, Gang oth Xiao, Dingquan oth Zhu, Jianguo oth Enthalten in Elsevier Gontar, Amelia ELSEVIER Characterising shape patterns using features derived from best-fitting ellipsoids 2018 a journal devoted to applied physics and chemistry of surfaces and interfaces Amsterdam (DE-627)ELV000097942 volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 https://doi.org/10.1016/j.apsusc.2014.06.149 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.74 Maschinelles Sehen VZ AR 314 2014 30 0930 124-128 5 045F 670 |
| spelling |
10.1016/j.apsusc.2014.06.149 doi GBVA2014006000011.pica (DE-627)ELV012154687 (ELSEVIER)S0169-4332(14)01467-6 DE-627 ger DE-627 rakwb eng 670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl Li, Xuedong verfasserin aut Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures 2014 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Elsevier Liu, Hong oth Liu, Gang oth Xiao, Dingquan oth Zhu, Jianguo oth Enthalten in Elsevier Gontar, Amelia ELSEVIER Characterising shape patterns using features derived from best-fitting ellipsoids 2018 a journal devoted to applied physics and chemistry of surfaces and interfaces Amsterdam (DE-627)ELV000097942 volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 https://doi.org/10.1016/j.apsusc.2014.06.149 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.74 Maschinelles Sehen VZ AR 314 2014 30 0930 124-128 5 045F 670 |
| allfields_unstemmed |
10.1016/j.apsusc.2014.06.149 doi GBVA2014006000011.pica (DE-627)ELV012154687 (ELSEVIER)S0169-4332(14)01467-6 DE-627 ger DE-627 rakwb eng 670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl Li, Xuedong verfasserin aut Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures 2014 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Elsevier Liu, Hong oth Liu, Gang oth Xiao, Dingquan oth Zhu, Jianguo oth Enthalten in Elsevier Gontar, Amelia ELSEVIER Characterising shape patterns using features derived from best-fitting ellipsoids 2018 a journal devoted to applied physics and chemistry of surfaces and interfaces Amsterdam (DE-627)ELV000097942 volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 https://doi.org/10.1016/j.apsusc.2014.06.149 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.74 Maschinelles Sehen VZ AR 314 2014 30 0930 124-128 5 045F 670 |
| allfieldsGer |
10.1016/j.apsusc.2014.06.149 doi GBVA2014006000011.pica (DE-627)ELV012154687 (ELSEVIER)S0169-4332(14)01467-6 DE-627 ger DE-627 rakwb eng 670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl Li, Xuedong verfasserin aut Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures 2014 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Elsevier Liu, Hong oth Liu, Gang oth Xiao, Dingquan oth Zhu, Jianguo oth Enthalten in Elsevier Gontar, Amelia ELSEVIER Characterising shape patterns using features derived from best-fitting ellipsoids 2018 a journal devoted to applied physics and chemistry of surfaces and interfaces Amsterdam (DE-627)ELV000097942 volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 https://doi.org/10.1016/j.apsusc.2014.06.149 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.74 Maschinelles Sehen VZ AR 314 2014 30 0930 124-128 5 045F 670 |
| allfieldsSound |
10.1016/j.apsusc.2014.06.149 doi GBVA2014006000011.pica (DE-627)ELV012154687 (ELSEVIER)S0169-4332(14)01467-6 DE-627 ger DE-627 rakwb eng 670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl Li, Xuedong verfasserin aut Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures 2014 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Elsevier Liu, Hong oth Liu, Gang oth Xiao, Dingquan oth Zhu, Jianguo oth Enthalten in Elsevier Gontar, Amelia ELSEVIER Characterising shape patterns using features derived from best-fitting ellipsoids 2018 a journal devoted to applied physics and chemistry of surfaces and interfaces Amsterdam (DE-627)ELV000097942 volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 https://doi.org/10.1016/j.apsusc.2014.06.149 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.74 Maschinelles Sehen VZ AR 314 2014 30 0930 124-128 5 045F 670 |
| language |
English |
| source |
Enthalten in Characterising shape patterns using features derived from best-fitting ellipsoids Amsterdam volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 |
| sourceStr |
Enthalten in Characterising shape patterns using features derived from best-fitting ellipsoids Amsterdam volume:314 year:2014 day:30 month:09 pages:124-128 extent:5 |
| format_phy_str_mv |
Article |
| bklname |
Maschinelles Sehen |
| institution |
findex.gbv.de |
| topic_facet |
Crystallization Multilayer thin films Percentage pyrochlore Loss of Pb |
| dewey-raw |
670 |
| isfreeaccess_bool |
false |
| container_title |
Characterising shape patterns using features derived from best-fitting ellipsoids |
| authorswithroles_txt_mv |
Li, Xuedong @@aut@@ Liu, Hong @@oth@@ Liu, Gang @@oth@@ Xiao, Dingquan @@oth@@ Zhu, Jianguo @@oth@@ |
| publishDateDaySort_date |
2014-01-30T00:00:00Z |
| hierarchy_top_id |
ELV000097942 |
| dewey-sort |
3670 |
| id |
ELV012154687 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV012154687</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230623094558.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">180602s2014 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.apsusc.2014.06.149</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">GBVA2014006000011.pica</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV012154687</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S0169-4332(14)01467-6</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">670</subfield><subfield code="a">530</subfield><subfield code="a">660</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">660</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">000</subfield><subfield code="a">150</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">54.74</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Li, Xuedong</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">5</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">• A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work).</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Crystallization</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Multilayer thin films</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Percentage pyrochlore</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Loss of Pb</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Hong</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Gang</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Xiao, Dingquan</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhu, Jianguo</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="n">Elsevier</subfield><subfield code="a">Gontar, Amelia ELSEVIER</subfield><subfield code="t">Characterising shape patterns using features derived from best-fitting ellipsoids</subfield><subfield code="d">2018</subfield><subfield code="d">a journal devoted to applied physics and chemistry of surfaces and interfaces</subfield><subfield code="g">Amsterdam</subfield><subfield code="w">(DE-627)ELV000097942</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:314</subfield><subfield code="g">year:2014</subfield><subfield code="g">day:30</subfield><subfield code="g">month:09</subfield><subfield code="g">pages:124-128</subfield><subfield code="g">extent:5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1016/j.apsusc.2014.06.149</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">54.74</subfield><subfield code="j">Maschinelles Sehen</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">314</subfield><subfield code="j">2014</subfield><subfield code="b">30</subfield><subfield code="c">0930</subfield><subfield code="h">124-128</subfield><subfield code="g">5</subfield></datafield><datafield tag="953" ind1=" " ind2=" "><subfield code="2">045F</subfield><subfield code="a">670</subfield></datafield></record></collection>
|
| author |
Li, Xuedong |
| spellingShingle |
Li, Xuedong ddc 670 ddc 530 ddc 660 ddc 000 bkl 54.74 Elsevier Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures |
| authorStr |
Li, Xuedong |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)ELV000097942 |
| format |
electronic Article |
| dewey-ones |
670 - Manufacturing 530 - Physics 660 - Chemical engineering 000 - Computer science, information & general works 150 - Psychology |
| delete_txt_mv |
keep |
| author_role |
aut |
| collection |
elsevier |
| remote_str |
true |
| illustrated |
Not Illustrated |
| topic_title |
670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb Elsevier |
| topic |
ddc 670 ddc 530 ddc 660 ddc 000 bkl 54.74 Elsevier Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb |
| topic_unstemmed |
ddc 670 ddc 530 ddc 660 ddc 000 bkl 54.74 Elsevier Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb |
| topic_browse |
ddc 670 ddc 530 ddc 660 ddc 000 bkl 54.74 Elsevier Crystallization Elsevier Multilayer thin films Elsevier Percentage pyrochlore Elsevier Loss of Pb |
| format_facet |
Elektronische Aufsätze Aufsätze Elektronische Ressource |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
zu |
| author2_variant |
h l hl g l gl d x dx j z jz |
| hierarchy_parent_title |
Characterising shape patterns using features derived from best-fitting ellipsoids |
| hierarchy_parent_id |
ELV000097942 |
| dewey-tens |
670 - Manufacturing 530 - Physics 660 - Chemical engineering 000 - Computer science, knowledge & systems 150 - Psychology |
| hierarchy_top_title |
Characterising shape patterns using features derived from best-fitting ellipsoids |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)ELV000097942 |
| title |
Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures |
| ctrlnum |
(DE-627)ELV012154687 (ELSEVIER)S0169-4332(14)01467-6 |
| title_full |
Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures |
| author_sort |
Li, Xuedong |
| journal |
Characterising shape patterns using features derived from best-fitting ellipsoids |
| journalStr |
Characterising shape patterns using features derived from best-fitting ellipsoids |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
600 - Technology 500 - Science 000 - Computer science, information & general works 100 - Philosophy & psychology |
| recordtype |
marc |
| publishDateSort |
2014 |
| contenttype_str_mv |
zzz |
| container_start_page |
124 |
| author_browse |
Li, Xuedong |
| container_volume |
314 |
| physical |
5 |
| class |
670 530 660 670 DE-600 530 DE-600 660 DE-600 000 150 VZ 54.74 bkl |
| format_se |
Elektronische Aufsätze |
| author-letter |
Li, Xuedong |
| doi_str_mv |
10.1016/j.apsusc.2014.06.149 |
| dewey-full |
670 530 660 000 150 |
| title_sort |
dielectric and ferroelectric properties of (100)-oriented 0.9pb(sc0.5ta0.5)o3 -0.1%pbtio3/0.55pb(sc0.5ta0.5)o3-0.45%pbtio3 heterostructures |
| title_auth |
Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures |
| abstract |
• A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). |
| abstractGer |
• A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). |
| abstract_unstemmed |
• A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work). |
| collection_details |
GBV_USEFLAG_U GBV_ELV SYSFLAG_U |
| title_short |
Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures |
| url |
https://doi.org/10.1016/j.apsusc.2014.06.149 |
| remote_bool |
true |
| author2 |
Liu, Hong Liu, Gang Xiao, Dingquan Zhu, Jianguo |
| author2Str |
Liu, Hong Liu, Gang Xiao, Dingquan Zhu, Jianguo |
| ppnlink |
ELV000097942 |
| mediatype_str_mv |
z |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| author2_role |
oth oth oth oth |
| doi_str |
10.1016/j.apsusc.2014.06.149 |
| up_date |
2024-07-06T21:37:54.717Z |
| _version_ |
1803867258584301568 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV012154687</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230623094558.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">180602s2014 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.apsusc.2014.06.149</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">GBVA2014006000011.pica</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV012154687</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S0169-4332(14)01467-6</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">670</subfield><subfield code="a">530</subfield><subfield code="a">660</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">660</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">000</subfield><subfield code="a">150</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">54.74</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Li, Xuedong</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc0.5Ta0.5)O3 -0.1%PbTiO3/0.55Pb(Sc0.5Ta0.5)O3-0.45%PbTiO3 heterostructures</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">5</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">• A new multilayer system of (PSTT10/PSTT45). • Lowered anneal temperature compared to our previous work (on PSTT5), the reason was analysed. • Enhanced ferroelectric and dielectric properties. The physical mechanisms of enhanced electrical properties were discussed in detail. • Two-steps rapid thermal annealing was also used (used in our previous work).</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Crystallization</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Multilayer thin films</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Percentage pyrochlore</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Loss of Pb</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Hong</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Gang</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Xiao, Dingquan</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhu, Jianguo</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="n">Elsevier</subfield><subfield code="a">Gontar, Amelia ELSEVIER</subfield><subfield code="t">Characterising shape patterns using features derived from best-fitting ellipsoids</subfield><subfield code="d">2018</subfield><subfield code="d">a journal devoted to applied physics and chemistry of surfaces and interfaces</subfield><subfield code="g">Amsterdam</subfield><subfield code="w">(DE-627)ELV000097942</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:314</subfield><subfield code="g">year:2014</subfield><subfield code="g">day:30</subfield><subfield code="g">month:09</subfield><subfield code="g">pages:124-128</subfield><subfield code="g">extent:5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1016/j.apsusc.2014.06.149</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">54.74</subfield><subfield code="j">Maschinelles Sehen</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">314</subfield><subfield code="j">2014</subfield><subfield code="b">30</subfield><subfield code="c">0930</subfield><subfield code="h">124-128</subfield><subfield code="g">5</subfield></datafield><datafield tag="953" ind1=" " ind2=" "><subfield code="2">045F</subfield><subfield code="a">670</subfield></datafield></record></collection>
|
| score |
7.398883 |