A new method to reduce the statistical and systematic uncertainty of chance coincidence backgrounds measured with waveform digitizers

A new method for measuring chance-coincidence backgrounds during the collection of coincidence data is presented. The method relies on acquiring data with near-zero dead time, which is now realistic due to the increasing deployment of flash electronic-digitizer (waveform digitizer) techniques. An ex...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

O׳Donnell, J.M. [verfasserIn]

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2016transfer abstract

Schlagwörter:

Systematic uncertainty

Waveform digitizer

Chance coincidence background

Statistical uncertainty

Umfang:

8

Übergeordnetes Werk:

Enthalten in: The efficacy of EEG-biofeedback for acute pain management, a randomized sham-controlled study of a tailored protocol - Ide, C.V. ELSEVIER, 2017, a journal on accelerators, instrumentation and techniques applied to research in nuclear and atomic physics, materials science and related fields in physics, Amsterdam

Übergeordnetes Werk:

volume:805 ; year:2016 ; day:1 ; month:01 ; pages:87-94 ; extent:8

Links:

Volltext

DOI / URN:

10.1016/j.nima.2015.07.044

Katalog-ID:

ELV019162588

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