Investigation of oxygen diffusion behavior in terbium using 18O2 isotopic tracking by high resolution SIMS

High resolution secondary ion mass spectrometry (SIMS) analysis has been used to study the oxidation mechanisms when high purity terbium (Tb) metal is exposed to corroding environments containing 18O2 isotope. The diffusion coefficients for 18O in Tb at a natural atmosphere can be calculated, which...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Li, Guoling [verfasserIn]

Li, Li

Hao, Jialong

Zheng, Jie

Tian, Wenhuai

Li, Xingguo

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2016transfer abstract

Schlagwörter:

NanoSIMS

Isotopic tracers

Terbium

Oxidation

Diffusion

Umfang:

4

Übergeordnetes Werk:

Enthalten in: New associations and host status: Infestability of kiwifruit by the fruit fly species - Follett, Peter A. ELSEVIER, 2018, an interdisciplinary journal affiliated with the Materials Research Society and the Materials Society Japan, devoted to the rapid publication of short communications on the science, applications and processing of materials, New York, NY [u.a.]

Übergeordnetes Werk:

volume:176 ; year:2016 ; day:1 ; month:08 ; pages:253-256 ; extent:4

Links:

Volltext

DOI / URN:

10.1016/j.matlet.2016.04.128

Katalog-ID:

ELV01917649X

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