Measurements of the optical absorption coefficient of Ar8+ ion implanted silicon layers using the photothermal radiometry and the modulated free carrier absorption methods

• The optical absorption of Ar8+ implanted layers in p-type silicon is presented. • Optical absorption indicates the amorphization of the implanted layer. • Decrease of the lifetime of carriers in argon implanted layers is observed.

Gespeichert in:
Autor*in:

Chrobak, Ł. [verfasserIn]

Maliński, M.

Pawlak, M.

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2014

Schlagwörter:

PTR method

Optical properties of implanted layers

Silicon

MFCA method

Plasma waves

Umfang:

5

Übergeordnetes Werk:

Enthalten in: 274: Low-dose aspirin improves trophoblastic function in early-onset pre-eclampsia - da Silva Costa, Fabricio ELSEVIER, 2014, an international research journal, Amsterdam [u.a.]

Übergeordnetes Werk:

volume:67 ; year:2014 ; pages:604-608 ; extent:5

Links:

Volltext

DOI / URN:

10.1016/j.infrared.2014.10.009

Katalog-ID:

ELV02296598X

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