Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method

Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sha...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Miyazaki, Hiroyuki [verfasserIn]

Yoshizawa, Yu-ichi

Hirao, Kiyoshi

Ohji, Tatsuki

Hyuga, Hideki

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2016transfer abstract

Schlagwörter:

Oxide

Substrate

Toughness

Insulator

Ceramics

Umfang:

5

Übergeordnetes Werk:

Enthalten in: Improved differential evolution for RSSD-based localization in Gaussian mixture noise - Zhang, Yuanyuan ELSEVIER, 2023, Amsterdam [u.a.]

Übergeordnetes Werk:

volume:36 ; year:2016 ; number:16 ; pages:4327-4331 ; extent:5

Links:

Volltext

DOI / URN:

10.1016/j.jeurceramsoc.2016.07.015

Katalog-ID:

ELV024658685

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