Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method
Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sha...
Ausführliche Beschreibung
Autor*in: |
Miyazaki, Hiroyuki [verfasserIn] |
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E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2016transfer abstract |
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Umfang: |
5 |
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Übergeordnetes Werk: |
Enthalten in: Improved differential evolution for RSSD-based localization in Gaussian mixture noise - Zhang, Yuanyuan ELSEVIER, 2023, Amsterdam [u.a.] |
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Übergeordnetes Werk: |
volume:36 ; year:2016 ; number:16 ; pages:4327-4331 ; extent:5 |
Links: |
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DOI / URN: |
10.1016/j.jeurceramsoc.2016.07.015 |
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Katalog-ID: |
ELV024658685 |
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LEADER | 01000caa a22002652 4500 | ||
---|---|---|---|
001 | ELV024658685 | ||
003 | DE-627 | ||
005 | 20230625143241.0 | ||
007 | cr uuu---uuuuu | ||
008 | 180603s2016 xx |||||o 00| ||eng c | ||
024 | 7 | |a 10.1016/j.jeurceramsoc.2016.07.015 |2 doi | |
028 | 5 | 2 | |a GBVA2016016000021.pica |
035 | |a (DE-627)ELV024658685 | ||
035 | |a (ELSEVIER)S0955-2219(16)30381-8 | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | |a 660 | |
082 | 0 | 4 | |a 660 |q DE-600 |
082 | 0 | 4 | |a 004 |q VZ |
084 | |a 54.00 |2 bkl | ||
100 | 1 | |a Miyazaki, Hiroyuki |e verfasserin |4 aut | |
245 | 1 | 0 | |a Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method |
264 | 1 | |c 2016transfer abstract | |
300 | |a 5 | ||
336 | |a nicht spezifiziert |b zzz |2 rdacontent | ||
337 | |a nicht spezifiziert |b z |2 rdamedia | ||
338 | |a nicht spezifiziert |b zu |2 rdacarrier | ||
520 | |a Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. | ||
520 | |a Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. | ||
650 | 7 | |a Oxide |2 Elsevier | |
650 | 7 | |a Substrate |2 Elsevier | |
650 | 7 | |a Toughness |2 Elsevier | |
650 | 7 | |a Insulator |2 Elsevier | |
650 | 7 | |a Ceramics |2 Elsevier | |
700 | 1 | |a Yoshizawa, Yu-ichi |4 oth | |
700 | 1 | |a Hirao, Kiyoshi |4 oth | |
700 | 1 | |a Ohji, Tatsuki |4 oth | |
700 | 1 | |a Hyuga, Hideki |4 oth | |
773 | 0 | 8 | |i Enthalten in |n Elsevier Science |a Zhang, Yuanyuan ELSEVIER |t Improved differential evolution for RSSD-based localization in Gaussian mixture noise |d 2023 |g Amsterdam [u.a.] |w (DE-627)ELV009961755 |
773 | 1 | 8 | |g volume:36 |g year:2016 |g number:16 |g pages:4327-4331 |g extent:5 |
856 | 4 | 0 | |u https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 |3 Volltext |
912 | |a GBV_USEFLAG_U | ||
912 | |a GBV_ELV | ||
912 | |a SYSFLAG_U | ||
936 | b | k | |a 54.00 |j Informatik: Allgemeines |q VZ |
951 | |a AR | ||
952 | |d 36 |j 2016 |e 16 |h 4327-4331 |g 5 | ||
953 | |2 045F |a 660 |
author_variant |
h m hm |
---|---|
matchkey_str |
miyazakihiroyukiyoshizawayuichihiraokiyo:2016----:esrmnsfrcueognsocrmchnltshogsnl |
hierarchy_sort_str |
2016transfer abstract |
bklnumber |
54.00 |
publishDate |
2016 |
allfields |
10.1016/j.jeurceramsoc.2016.07.015 doi GBVA2016016000021.pica (DE-627)ELV024658685 (ELSEVIER)S0955-2219(16)30381-8 DE-627 ger DE-627 rakwb eng 660 660 DE-600 004 VZ 54.00 bkl Miyazaki, Hiroyuki verfasserin aut Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method 2016transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Elsevier Yoshizawa, Yu-ichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth Hyuga, Hideki oth Enthalten in Elsevier Science Zhang, Yuanyuan ELSEVIER Improved differential evolution for RSSD-based localization in Gaussian mixture noise 2023 Amsterdam [u.a.] (DE-627)ELV009961755 volume:36 year:2016 number:16 pages:4327-4331 extent:5 https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.00 Informatik: Allgemeines VZ AR 36 2016 16 4327-4331 5 045F 660 |
spelling |
10.1016/j.jeurceramsoc.2016.07.015 doi GBVA2016016000021.pica (DE-627)ELV024658685 (ELSEVIER)S0955-2219(16)30381-8 DE-627 ger DE-627 rakwb eng 660 660 DE-600 004 VZ 54.00 bkl Miyazaki, Hiroyuki verfasserin aut Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method 2016transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Elsevier Yoshizawa, Yu-ichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth Hyuga, Hideki oth Enthalten in Elsevier Science Zhang, Yuanyuan ELSEVIER Improved differential evolution for RSSD-based localization in Gaussian mixture noise 2023 Amsterdam [u.a.] (DE-627)ELV009961755 volume:36 year:2016 number:16 pages:4327-4331 extent:5 https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.00 Informatik: Allgemeines VZ AR 36 2016 16 4327-4331 5 045F 660 |
allfields_unstemmed |
10.1016/j.jeurceramsoc.2016.07.015 doi GBVA2016016000021.pica (DE-627)ELV024658685 (ELSEVIER)S0955-2219(16)30381-8 DE-627 ger DE-627 rakwb eng 660 660 DE-600 004 VZ 54.00 bkl Miyazaki, Hiroyuki verfasserin aut Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method 2016transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Elsevier Yoshizawa, Yu-ichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth Hyuga, Hideki oth Enthalten in Elsevier Science Zhang, Yuanyuan ELSEVIER Improved differential evolution for RSSD-based localization in Gaussian mixture noise 2023 Amsterdam [u.a.] (DE-627)ELV009961755 volume:36 year:2016 number:16 pages:4327-4331 extent:5 https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.00 Informatik: Allgemeines VZ AR 36 2016 16 4327-4331 5 045F 660 |
allfieldsGer |
10.1016/j.jeurceramsoc.2016.07.015 doi GBVA2016016000021.pica (DE-627)ELV024658685 (ELSEVIER)S0955-2219(16)30381-8 DE-627 ger DE-627 rakwb eng 660 660 DE-600 004 VZ 54.00 bkl Miyazaki, Hiroyuki verfasserin aut Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method 2016transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Elsevier Yoshizawa, Yu-ichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth Hyuga, Hideki oth Enthalten in Elsevier Science Zhang, Yuanyuan ELSEVIER Improved differential evolution for RSSD-based localization in Gaussian mixture noise 2023 Amsterdam [u.a.] (DE-627)ELV009961755 volume:36 year:2016 number:16 pages:4327-4331 extent:5 https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.00 Informatik: Allgemeines VZ AR 36 2016 16 4327-4331 5 045F 660 |
allfieldsSound |
10.1016/j.jeurceramsoc.2016.07.015 doi GBVA2016016000021.pica (DE-627)ELV024658685 (ELSEVIER)S0955-2219(16)30381-8 DE-627 ger DE-627 rakwb eng 660 660 DE-600 004 VZ 54.00 bkl Miyazaki, Hiroyuki verfasserin aut Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method 2016transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Elsevier Yoshizawa, Yu-ichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth Hyuga, Hideki oth Enthalten in Elsevier Science Zhang, Yuanyuan ELSEVIER Improved differential evolution for RSSD-based localization in Gaussian mixture noise 2023 Amsterdam [u.a.] (DE-627)ELV009961755 volume:36 year:2016 number:16 pages:4327-4331 extent:5 https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 54.00 Informatik: Allgemeines VZ AR 36 2016 16 4327-4331 5 045F 660 |
language |
English |
source |
Enthalten in Improved differential evolution for RSSD-based localization in Gaussian mixture noise Amsterdam [u.a.] volume:36 year:2016 number:16 pages:4327-4331 extent:5 |
sourceStr |
Enthalten in Improved differential evolution for RSSD-based localization in Gaussian mixture noise Amsterdam [u.a.] volume:36 year:2016 number:16 pages:4327-4331 extent:5 |
format_phy_str_mv |
Article |
bklname |
Informatik: Allgemeines |
institution |
findex.gbv.de |
topic_facet |
Oxide Substrate Toughness Insulator Ceramics |
dewey-raw |
660 |
isfreeaccess_bool |
false |
container_title |
Improved differential evolution for RSSD-based localization in Gaussian mixture noise |
authorswithroles_txt_mv |
Miyazaki, Hiroyuki @@aut@@ Yoshizawa, Yu-ichi @@oth@@ Hirao, Kiyoshi @@oth@@ Ohji, Tatsuki @@oth@@ Hyuga, Hideki @@oth@@ |
publishDateDaySort_date |
2016-01-01T00:00:00Z |
hierarchy_top_id |
ELV009961755 |
dewey-sort |
3660 |
id |
ELV024658685 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV024658685</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230625143241.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">180603s2016 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.jeurceramsoc.2016.07.015</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">GBVA2016016000021.pica</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV024658685</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S0955-2219(16)30381-8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">660</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">660</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">54.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Miyazaki, Hiroyuki</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2016transfer abstract</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">5</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Oxide</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Substrate</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Toughness</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Insulator</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Ceramics</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yoshizawa, Yu-ichi</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hirao, Kiyoshi</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ohji, Tatsuki</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hyuga, Hideki</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="n">Elsevier Science</subfield><subfield code="a">Zhang, Yuanyuan ELSEVIER</subfield><subfield code="t">Improved differential evolution for RSSD-based localization in Gaussian mixture noise</subfield><subfield code="d">2023</subfield><subfield code="g">Amsterdam [u.a.]</subfield><subfield code="w">(DE-627)ELV009961755</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:36</subfield><subfield code="g">year:2016</subfield><subfield code="g">number:16</subfield><subfield code="g">pages:4327-4331</subfield><subfield code="g">extent:5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1016/j.jeurceramsoc.2016.07.015</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">54.00</subfield><subfield code="j">Informatik: Allgemeines</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">36</subfield><subfield code="j">2016</subfield><subfield code="e">16</subfield><subfield code="h">4327-4331</subfield><subfield code="g">5</subfield></datafield><datafield tag="953" ind1=" " ind2=" "><subfield code="2">045F</subfield><subfield code="a">660</subfield></datafield></record></collection>
|
author |
Miyazaki, Hiroyuki |
spellingShingle |
Miyazaki, Hiroyuki ddc 660 ddc 004 bkl 54.00 Elsevier Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method |
authorStr |
Miyazaki, Hiroyuki |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)ELV009961755 |
format |
electronic Article |
dewey-ones |
660 - Chemical engineering 004 - Data processing & computer science |
delete_txt_mv |
keep |
author_role |
aut |
collection |
elsevier |
remote_str |
true |
illustrated |
Not Illustrated |
topic_title |
660 660 DE-600 004 VZ 54.00 bkl Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics Elsevier |
topic |
ddc 660 ddc 004 bkl 54.00 Elsevier Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics |
topic_unstemmed |
ddc 660 ddc 004 bkl 54.00 Elsevier Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics |
topic_browse |
ddc 660 ddc 004 bkl 54.00 Elsevier Oxide Elsevier Substrate Elsevier Toughness Elsevier Insulator Elsevier Ceramics |
format_facet |
Elektronische Aufsätze Aufsätze Elektronische Ressource |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
zu |
author2_variant |
y i y yiy k h kh t o to h h hh |
hierarchy_parent_title |
Improved differential evolution for RSSD-based localization in Gaussian mixture noise |
hierarchy_parent_id |
ELV009961755 |
dewey-tens |
660 - Chemical engineering 000 - Computer science, knowledge & systems |
hierarchy_top_title |
Improved differential evolution for RSSD-based localization in Gaussian mixture noise |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)ELV009961755 |
title |
Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method |
ctrlnum |
(DE-627)ELV024658685 (ELSEVIER)S0955-2219(16)30381-8 |
title_full |
Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method |
author_sort |
Miyazaki, Hiroyuki |
journal |
Improved differential evolution for RSSD-based localization in Gaussian mixture noise |
journalStr |
Improved differential evolution for RSSD-based localization in Gaussian mixture noise |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
600 - Technology 000 - Computer science, information & general works |
recordtype |
marc |
publishDateSort |
2016 |
contenttype_str_mv |
zzz |
container_start_page |
4327 |
author_browse |
Miyazaki, Hiroyuki |
container_volume |
36 |
physical |
5 |
class |
660 660 DE-600 004 VZ 54.00 bkl |
format_se |
Elektronische Aufsätze |
author-letter |
Miyazaki, Hiroyuki |
doi_str_mv |
10.1016/j.jeurceramsoc.2016.07.015 |
dewey-full |
660 004 |
title_sort |
measurements of fracture toughness of ceramic thin plates through single-edge v-notch plate method |
title_auth |
Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method |
abstract |
Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. |
abstractGer |
Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. |
abstract_unstemmed |
Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates. |
collection_details |
GBV_USEFLAG_U GBV_ELV SYSFLAG_U |
container_issue |
16 |
title_short |
Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method |
url |
https://doi.org/10.1016/j.jeurceramsoc.2016.07.015 |
remote_bool |
true |
author2 |
Yoshizawa, Yu-ichi Hirao, Kiyoshi Ohji, Tatsuki Hyuga, Hideki |
author2Str |
Yoshizawa, Yu-ichi Hirao, Kiyoshi Ohji, Tatsuki Hyuga, Hideki |
ppnlink |
ELV009961755 |
mediatype_str_mv |
z |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth oth oth |
doi_str |
10.1016/j.jeurceramsoc.2016.07.015 |
up_date |
2024-07-06T22:00:49.208Z |
_version_ |
1803868699842576384 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV024658685</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230625143241.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">180603s2016 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.jeurceramsoc.2016.07.015</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">GBVA2016016000021.pica</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV024658685</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S0955-2219(16)30381-8</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">660</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">660</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">54.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Miyazaki, Hiroyuki</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Measurements of fracture toughness of ceramic thin plates through single-edge V-notch plate method</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2016transfer abstract</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">5</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Round-robin tests on the single-edge V-notch plate (SEVNP) method were conducted successfully to evaluate the fracture toughness of Al2O3, AlN and Si3N4 thin plates whose grain sizes were more than 2μm. A straight-through notch was introduced into a plate with the thickness of 0.32 or 0.64mm and sharpened by means of razor blade with diamond pasts to prepare a V notch. The V-notched thin specimens were loaded in a special 3pt-fixture with a vertical thin slit to determine the flexural strength. Reasonable consistencies in the resultant fracture toughness were attained between laboratories regardless of the thickness of ceramic plate, indicating the SEVNP method can be an effective test technique for measurements of fracture toughness of the ceramic thin plates.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Oxide</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Substrate</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Toughness</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Insulator</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Ceramics</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yoshizawa, Yu-ichi</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hirao, Kiyoshi</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ohji, Tatsuki</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hyuga, Hideki</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="n">Elsevier Science</subfield><subfield code="a">Zhang, Yuanyuan ELSEVIER</subfield><subfield code="t">Improved differential evolution for RSSD-based localization in Gaussian mixture noise</subfield><subfield code="d">2023</subfield><subfield code="g">Amsterdam [u.a.]</subfield><subfield code="w">(DE-627)ELV009961755</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:36</subfield><subfield code="g">year:2016</subfield><subfield code="g">number:16</subfield><subfield code="g">pages:4327-4331</subfield><subfield code="g">extent:5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1016/j.jeurceramsoc.2016.07.015</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">54.00</subfield><subfield code="j">Informatik: Allgemeines</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">36</subfield><subfield code="j">2016</subfield><subfield code="e">16</subfield><subfield code="h">4327-4331</subfield><subfield code="g">5</subfield></datafield><datafield tag="953" ind1=" " ind2=" "><subfield code="2">045F</subfield><subfield code="a">660</subfield></datafield></record></collection>
|
score |
7.399083 |