Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry

Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is...
Ausführliche Beschreibung

Gespeichert in:

Autor*in:	Karabiyik, Ufuk [verfasserIn] Mao, Min Satija, Sushil K. Esker, Alan R.

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2014transfer abstract

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment - Zucker, Ines ELSEVIER, 2017, international journal on the science and technology of condensed matter films, Amsterdam [u.a.]
Übergeordnetes Werk:	volume:565 ; year:2014 ; day:28 ; month:08 ; pages:72-78 ; extent:7

Links:	Volltext

DOI / URN:	10.1016/j.tsf.2014.06.050

Katalog-ID:	ELV02773093X

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520			\|a Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error.
520			\|a Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error.
700	1		\|a Mao, Min \|4 oth
700	1		\|a Satija, Sushil K. \|4 oth
700	1		\|a Esker, Alan R. \|4 oth
773	0	8	\|i Enthalten in \|n Elsevier \|a Zucker, Ines ELSEVIER \|t Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment \|d 2017 \|d international journal on the science and technology of condensed matter films \|g Amsterdam [u.a.] \|w (DE-627)ELV000692654
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author_variant	u k uk
matchkey_str	karabiyikufukmaominsatijasushilkeskerala:2014----:eemntootikessnrfatvidcsfoyetiflsyutp
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allfields	10.1016/j.tsf.2014.06.050 doi GBVA2014001000022.pica (DE-627)ELV02773093X (ELSEVIER)S0040-6090(14)00714-7 DE-627 ger DE-627 rakwb eng 070 660 070 DE-600 660 DE-600 333.7 610 VZ 43.12 bkl 43.13 bkl 44.13 bkl Karabiyik, Ufuk verfasserin aut Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry 2014transfer abstract 7 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Mao, Min oth Satija, Sushil K. oth Esker, Alan R. oth Enthalten in Elsevier Zucker, Ines ELSEVIER Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment 2017 international journal on the science and technology of condensed matter films Amsterdam [u.a.] (DE-627)ELV000692654 volume:565 year:2014 day:28 month:08 pages:72-78 extent:7 https://doi.org/10.1016/j.tsf.2014.06.050 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA SSG-OPC-GGO 43.12 Umweltchemie VZ 43.13 Umwelttoxikologie VZ 44.13 Medizinische Ökologie VZ AR 565 2014 28 0828 72-78 7 045F 070
spelling	10.1016/j.tsf.2014.06.050 doi GBVA2014001000022.pica (DE-627)ELV02773093X (ELSEVIER)S0040-6090(14)00714-7 DE-627 ger DE-627 rakwb eng 070 660 070 DE-600 660 DE-600 333.7 610 VZ 43.12 bkl 43.13 bkl 44.13 bkl Karabiyik, Ufuk verfasserin aut Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry 2014transfer abstract 7 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Mao, Min oth Satija, Sushil K. oth Esker, Alan R. oth Enthalten in Elsevier Zucker, Ines ELSEVIER Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment 2017 international journal on the science and technology of condensed matter films Amsterdam [u.a.] (DE-627)ELV000692654 volume:565 year:2014 day:28 month:08 pages:72-78 extent:7 https://doi.org/10.1016/j.tsf.2014.06.050 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA SSG-OPC-GGO 43.12 Umweltchemie VZ 43.13 Umwelttoxikologie VZ 44.13 Medizinische Ökologie VZ AR 565 2014 28 0828 72-78 7 045F 070
allfields_unstemmed	10.1016/j.tsf.2014.06.050 doi GBVA2014001000022.pica (DE-627)ELV02773093X (ELSEVIER)S0040-6090(14)00714-7 DE-627 ger DE-627 rakwb eng 070 660 070 DE-600 660 DE-600 333.7 610 VZ 43.12 bkl 43.13 bkl 44.13 bkl Karabiyik, Ufuk verfasserin aut Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry 2014transfer abstract 7 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Mao, Min oth Satija, Sushil K. oth Esker, Alan R. oth Enthalten in Elsevier Zucker, Ines ELSEVIER Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment 2017 international journal on the science and technology of condensed matter films Amsterdam [u.a.] (DE-627)ELV000692654 volume:565 year:2014 day:28 month:08 pages:72-78 extent:7 https://doi.org/10.1016/j.tsf.2014.06.050 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA SSG-OPC-GGO 43.12 Umweltchemie VZ 43.13 Umwelttoxikologie VZ 44.13 Medizinische Ökologie VZ AR 565 2014 28 0828 72-78 7 045F 070
allfieldsGer	10.1016/j.tsf.2014.06.050 doi GBVA2014001000022.pica (DE-627)ELV02773093X (ELSEVIER)S0040-6090(14)00714-7 DE-627 ger DE-627 rakwb eng 070 660 070 DE-600 660 DE-600 333.7 610 VZ 43.12 bkl 43.13 bkl 44.13 bkl Karabiyik, Ufuk verfasserin aut Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry 2014transfer abstract 7 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Mao, Min oth Satija, Sushil K. oth Esker, Alan R. oth Enthalten in Elsevier Zucker, Ines ELSEVIER Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment 2017 international journal on the science and technology of condensed matter films Amsterdam [u.a.] (DE-627)ELV000692654 volume:565 year:2014 day:28 month:08 pages:72-78 extent:7 https://doi.org/10.1016/j.tsf.2014.06.050 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA SSG-OPC-GGO 43.12 Umweltchemie VZ 43.13 Umwelttoxikologie VZ 44.13 Medizinische Ökologie VZ AR 565 2014 28 0828 72-78 7 045F 070
allfieldsSound	10.1016/j.tsf.2014.06.050 doi GBVA2014001000022.pica (DE-627)ELV02773093X (ELSEVIER)S0040-6090(14)00714-7 DE-627 ger DE-627 rakwb eng 070 660 070 DE-600 660 DE-600 333.7 610 VZ 43.12 bkl 43.13 bkl 44.13 bkl Karabiyik, Ufuk verfasserin aut Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry 2014transfer abstract 7 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error. Mao, Min oth Satija, Sushil K. oth Esker, Alan R. oth Enthalten in Elsevier Zucker, Ines ELSEVIER Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment 2017 international journal on the science and technology of condensed matter films Amsterdam [u.a.] (DE-627)ELV000692654 volume:565 year:2014 day:28 month:08 pages:72-78 extent:7 https://doi.org/10.1016/j.tsf.2014.06.050 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA SSG-OPC-GGO 43.12 Umweltchemie VZ 43.13 Umwelttoxikologie VZ 44.13 Medizinische Ökologie VZ AR 565 2014 28 0828 72-78 7 045F 070
language	English
source	Enthalten in Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment Amsterdam [u.a.] volume:565 year:2014 day:28 month:08 pages:72-78 extent:7
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container_title	Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment
authorswithroles_txt_mv	Karabiyik, Ufuk @@aut@@ Mao, Min @@oth@@ Satija, Sushil K. @@oth@@ Esker, Alan R. @@oth@@
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author	Karabiyik, Ufuk
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topic_title	070 660 070 DE-600 660 DE-600 333.7 610 VZ 43.12 bkl 43.13 bkl 44.13 bkl Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry
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title	Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry
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title_full	Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry
author_sort	Karabiyik, Ufuk
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journalStr	Formation and degradation of N-oxide venlafaxine during ozonation and biological post-treatment
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title_sort	determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry
title_auth	Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry
abstract	Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error.
abstractGer	Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error.
abstract_unstemmed	Single wavelength ellipsometry measurements at Brewster's angle and in multiple incident media provide a powerful technique for characterizing ultrathin (<20–30nm) polymer films. Only one ellipsometric parameter (i.e. amplitude ratio) is obtained at Brewster's angle since phase shift is 90°. By conducting the experiments in different ambient media, simultaneous determinations of a film's thickness and refractive index for ultrathin polymer films are possible at Brewster's angle. Poly(tert-butyl acrylate) (PtBA) Langmuir–Blodgett films serve as a model system for the simultaneous determination of thickness and refractive index (1.45±0.01 at 632nm). Thickness measurements on films of variable thickness agree with X-ray reflectivity results ±0.8nm. The method is also applicable to spincoated films where refractive indices of PtBA, polystyrene and poly(methyl methacrylate) are found to agree with literature values within experimental error.
collection_details	GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA SSG-OPC-GGO
title_short	Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry
url	https://doi.org/10.1016/j.tsf.2014.06.050
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author2	Mao, Min Satija, Sushil K. Esker, Alan R.
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doi_str	10.1016/j.tsf.2014.06.050
up_date	2024-07-06T16:59:31.616Z
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