Fracture analysis of an orthotropic strip with imperfect piezoelectric coating containing multiple defects
• Analytical model is presented for the analysis of a coating-substrate structures. • Distributed dislocation technique is used to construct integral equations. • Dislocation densities are employed to determine field intensity factors. • Formulation is applicable for several defects with arbitrary p...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Bayat, J. [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2015 |
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| Schlagwörter: |
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| Umfang: |
9 |
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| Übergeordnetes Werk: |
Enthalten in: Au- and Pd-modified porous Co film supported on Ni foam substrate as the high performance catalysts for H2O2 electroreduction - Yang, Fan ELSEVIER, 2014transfer abstract, Amsterdam |
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| Übergeordnetes Werk: |
volume:77 ; year:2015 ; pages:41-49 ; extent:9 |
| Links: |
|---|
| DOI / URN: |
10.1016/j.tafmec.2015.01.009 |
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10.1016/j.tafmec.2015.01.009 doi GBVA2015004000005.pica (DE-627)ELV028682726 (ELSEVIER)S0167-8442(14)20057-7 DE-627 ger DE-627 rakwb eng 670 670 DE-600 620 VZ 690 VZ 50.92 bkl Bayat, J. verfasserin aut Fracture analysis of an orthotropic strip with imperfect piezoelectric coating containing multiple defects 2015 9 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • Analytical model is presented for the analysis of a coating-substrate structures. • Distributed dislocation technique is used to construct integral equations. • Dislocation densities are employed to determine field intensity factors. • Formulation is applicable for several defects with arbitrary patterns. Piezoelectric layer Elsevier Stress intensity factors Elsevier Orthotropic strip Elsevier Imperfect bonding Elsevier Multiple defects Elsevier Ayatollahi, M. oth Bagheri, R. oth Enthalten in North-Holland Yang, Fan ELSEVIER Au- and Pd-modified porous Co film supported on Ni foam substrate as the high performance catalysts for H2O2 electroreduction 2014transfer abstract Amsterdam (DE-627)ELV017516803 volume:77 year:2015 pages:41-49 extent:9 https://doi.org/10.1016/j.tafmec.2015.01.009 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U 50.92 Meerestechnik VZ AR 77 2015 41-49 9 045F 670 |
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• Analytical model is presented for the analysis of a coating-substrate structures. • Distributed dislocation technique is used to construct integral equations. • Dislocation densities are employed to determine field intensity factors. • Formulation is applicable for several defects with arbitrary patterns. |
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