Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers
A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation s...
Ausführliche Beschreibung
Autor*in: |
Yupeng, Zhang [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2014transfer abstract |
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Schlagwörter: |
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Umfang: |
5 |
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Übergeordnetes Werk: |
Enthalten in: SUSY effects in R b : Revisited under current experimental constraints - Su, Wei ELSEVIER, 2016transfer abstract, Amsterdam [u.a.] |
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Übergeordnetes Werk: |
volume:43 ; year:2014 ; number:11 ; pages:2597-2601 ; extent:5 |
Links: |
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DOI / URN: |
10.1016/S1875-5372(15)60009-1 |
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Katalog-ID: |
ELV033888531 |
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520 | |a A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity | ||
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10.1016/S1875-5372(15)60009-1 doi GBVA2014010000013.pica (DE-627)ELV033888531 (ELSEVIER)S1875-5372(15)60009-1 DE-627 ger DE-627 rakwb eng 670 670 DE-600 530 VZ 610 VZ 77.50 bkl Yupeng, Zhang verfasserin aut Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers 2014transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity diamond Elsevier intermetallic Elsevier Al-Ni, self-propagation joining Elsevier micro/nano-multilayers Elsevier Jianglong, Yi oth Ziyi, Luo oth Lei, Xu oth Hexing, Chen oth Mingjiang, Dai oth Enthalten in Elsevier Su, Wei ELSEVIER SUSY effects in R b : Revisited under current experimental constraints 2016transfer abstract Amsterdam [u.a.] (DE-627)ELV014078635 volume:43 year:2014 number:11 pages:2597-2601 extent:5 https://doi.org/10.1016/S1875-5372(15)60009-1 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA 77.50 Psychophysiologie VZ AR 43 2014 11 2597-2601 5 045F 670 |
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10.1016/S1875-5372(15)60009-1 doi GBVA2014010000013.pica (DE-627)ELV033888531 (ELSEVIER)S1875-5372(15)60009-1 DE-627 ger DE-627 rakwb eng 670 670 DE-600 530 VZ 610 VZ 77.50 bkl Yupeng, Zhang verfasserin aut Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers 2014transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity diamond Elsevier intermetallic Elsevier Al-Ni, self-propagation joining Elsevier micro/nano-multilayers Elsevier Jianglong, Yi oth Ziyi, Luo oth Lei, Xu oth Hexing, Chen oth Mingjiang, Dai oth Enthalten in Elsevier Su, Wei ELSEVIER SUSY effects in R b : Revisited under current experimental constraints 2016transfer abstract Amsterdam [u.a.] (DE-627)ELV014078635 volume:43 year:2014 number:11 pages:2597-2601 extent:5 https://doi.org/10.1016/S1875-5372(15)60009-1 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA 77.50 Psychophysiologie VZ AR 43 2014 11 2597-2601 5 045F 670 |
allfields_unstemmed |
10.1016/S1875-5372(15)60009-1 doi GBVA2014010000013.pica (DE-627)ELV033888531 (ELSEVIER)S1875-5372(15)60009-1 DE-627 ger DE-627 rakwb eng 670 670 DE-600 530 VZ 610 VZ 77.50 bkl Yupeng, Zhang verfasserin aut Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers 2014transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity diamond Elsevier intermetallic Elsevier Al-Ni, self-propagation joining Elsevier micro/nano-multilayers Elsevier Jianglong, Yi oth Ziyi, Luo oth Lei, Xu oth Hexing, Chen oth Mingjiang, Dai oth Enthalten in Elsevier Su, Wei ELSEVIER SUSY effects in R b : Revisited under current experimental constraints 2016transfer abstract Amsterdam [u.a.] (DE-627)ELV014078635 volume:43 year:2014 number:11 pages:2597-2601 extent:5 https://doi.org/10.1016/S1875-5372(15)60009-1 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA 77.50 Psychophysiologie VZ AR 43 2014 11 2597-2601 5 045F 670 |
allfieldsGer |
10.1016/S1875-5372(15)60009-1 doi GBVA2014010000013.pica (DE-627)ELV033888531 (ELSEVIER)S1875-5372(15)60009-1 DE-627 ger DE-627 rakwb eng 670 670 DE-600 530 VZ 610 VZ 77.50 bkl Yupeng, Zhang verfasserin aut Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers 2014transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity diamond Elsevier intermetallic Elsevier Al-Ni, self-propagation joining Elsevier micro/nano-multilayers Elsevier Jianglong, Yi oth Ziyi, Luo oth Lei, Xu oth Hexing, Chen oth Mingjiang, Dai oth Enthalten in Elsevier Su, Wei ELSEVIER SUSY effects in R b : Revisited under current experimental constraints 2016transfer abstract Amsterdam [u.a.] (DE-627)ELV014078635 volume:43 year:2014 number:11 pages:2597-2601 extent:5 https://doi.org/10.1016/S1875-5372(15)60009-1 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA 77.50 Psychophysiologie VZ AR 43 2014 11 2597-2601 5 045F 670 |
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10.1016/S1875-5372(15)60009-1 doi GBVA2014010000013.pica (DE-627)ELV033888531 (ELSEVIER)S1875-5372(15)60009-1 DE-627 ger DE-627 rakwb eng 670 670 DE-600 530 VZ 610 VZ 77.50 bkl Yupeng, Zhang verfasserin aut Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers 2014transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity diamond Elsevier intermetallic Elsevier Al-Ni, self-propagation joining Elsevier micro/nano-multilayers Elsevier Jianglong, Yi oth Ziyi, Luo oth Lei, Xu oth Hexing, Chen oth Mingjiang, Dai oth Enthalten in Elsevier Su, Wei ELSEVIER SUSY effects in R b : Revisited under current experimental constraints 2016transfer abstract Amsterdam [u.a.] (DE-627)ELV014078635 volume:43 year:2014 number:11 pages:2597-2601 extent:5 https://doi.org/10.1016/S1875-5372(15)60009-1 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA 77.50 Psychophysiologie VZ AR 43 2014 11 2597-2601 5 045F 670 |
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Enthalten in SUSY effects in R b : Revisited under current experimental constraints Amsterdam [u.a.] volume:43 year:2014 number:11 pages:2597-2601 extent:5 |
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Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers |
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Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers |
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Yupeng, Zhang |
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SUSY effects in R b : Revisited under current experimental constraints |
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structural view study on diamond and copper bonding with alni micro/nano multilayers |
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Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers |
abstract |
A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity |
abstractGer |
A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity |
abstract_unstemmed |
A novel high thermal conductivity joining between diamond heat sink and light emitting diode (LED) chip was investigated. AlNi nano/micro-multilayers were fabricated and used to test the bonding of copper and diamond by self-propagation. The thermal analysis results and micro structure observation show that the bilayer (one alternative sputtering period of aluminium and nickel layers) of the mulilayer will influence the heat release of propagation reaction, and hence help to control the bonding process with steady. The influence of the vanadium addition and the magneto-conductivity of nickel element on the structures of the multilyers were also discussed, which has relation with the bilayer either. The quality of the diamond-copper joint by nano-multilayer bonding is better than that of the silver glue bonding in shearing strength and thermal conductivity |
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Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers |
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https://doi.org/10.1016/S1875-5372(15)60009-1 |
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Jianglong, Yi Ziyi, Luo Lei, Xu Hexing, Chen Mingjiang, Dai |
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