Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids
We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the thre...
Ausführliche Beschreibung
Autor*in: |
Lee, Hong Seok [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2015transfer abstract |
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Umfang: |
5 |
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Übergeordnetes Werk: |
Enthalten in: Can digital technologies improve health? - The Lancet ELSEVIER, 2021, physics, chemistry and materials science, Amsterdam [u.a.] |
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Übergeordnetes Werk: |
volume:15 ; year:2015 ; number:3 ; pages:302-306 ; extent:5 |
Links: |
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DOI / URN: |
10.1016/j.cap.2015.01.001 |
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Katalog-ID: |
ELV034457984 |
---|
LEADER | 01000caa a22002652 4500 | ||
---|---|---|---|
001 | ELV034457984 | ||
003 | DE-627 | ||
005 | 20230625200958.0 | ||
007 | cr uuu---uuuuu | ||
008 | 180603s2015 xx |||||o 00| ||eng c | ||
024 | 7 | |a 10.1016/j.cap.2015.01.001 |2 doi | |
028 | 5 | 2 | |a GBVA2015007000001.pica |
035 | |a (DE-627)ELV034457984 | ||
035 | |a (ELSEVIER)S1567-1739(15)00002-4 | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | |a 530 | |
082 | 0 | 4 | |a 530 |q DE-600 |
100 | 1 | |a Lee, Hong Seok |e verfasserin |4 aut | |
245 | 1 | 0 | |a Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
264 | 1 | |c 2015transfer abstract | |
300 | |a 5 | ||
336 | |a nicht spezifiziert |b zzz |2 rdacontent | ||
337 | |a nicht spezifiziert |b z |2 rdamedia | ||
338 | |a nicht spezifiziert |b zu |2 rdacarrier | ||
520 | |a We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. | ||
520 | |a We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. | ||
650 | 7 | |a Phase retrieval |2 Elsevier | |
650 | 7 | |a Surface shape measurement |2 Elsevier | |
650 | 7 | |a Phase measuring deflectometry |2 Elsevier | |
700 | 1 | |a Shin, Sanghoon |4 oth | |
700 | 1 | |a Lee, Heonjoo |4 oth | |
700 | 1 | |a Yu, Younghun |4 oth | |
773 | 0 | 8 | |i Enthalten in |n Elsevier Science |a The Lancet ELSEVIER |t Can digital technologies improve health? |d 2021 |d physics, chemistry and materials science |g Amsterdam [u.a.] |w (DE-627)ELV006885837 |
773 | 1 | 8 | |g volume:15 |g year:2015 |g number:3 |g pages:302-306 |g extent:5 |
856 | 4 | 0 | |u https://doi.org/10.1016/j.cap.2015.01.001 |3 Volltext |
912 | |a GBV_USEFLAG_U | ||
912 | |a GBV_ELV | ||
912 | |a SYSFLAG_U | ||
951 | |a AR | ||
952 | |d 15 |j 2015 |e 3 |h 302-306 |g 5 | ||
953 | |2 045F |a 530 |
author_variant |
h s l hs hsl |
---|---|
matchkey_str |
leehongseokshinsanghoonleeheonjooyuyoung:2015----:eemnnteirotcllmnsraepoieuigrnmsin |
hierarchy_sort_str |
2015transfer abstract |
publishDate |
2015 |
allfields |
10.1016/j.cap.2015.01.001 doi GBVA2015007000001.pica (DE-627)ELV034457984 (ELSEVIER)S1567-1739(15)00002-4 DE-627 ger DE-627 rakwb eng 530 530 DE-600 Lee, Hong Seok verfasserin aut Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids 2015transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Elsevier Shin, Sanghoon oth Lee, Heonjoo oth Yu, Younghun oth Enthalten in Elsevier Science The Lancet ELSEVIER Can digital technologies improve health? 2021 physics, chemistry and materials science Amsterdam [u.a.] (DE-627)ELV006885837 volume:15 year:2015 number:3 pages:302-306 extent:5 https://doi.org/10.1016/j.cap.2015.01.001 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U AR 15 2015 3 302-306 5 045F 530 |
spelling |
10.1016/j.cap.2015.01.001 doi GBVA2015007000001.pica (DE-627)ELV034457984 (ELSEVIER)S1567-1739(15)00002-4 DE-627 ger DE-627 rakwb eng 530 530 DE-600 Lee, Hong Seok verfasserin aut Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids 2015transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Elsevier Shin, Sanghoon oth Lee, Heonjoo oth Yu, Younghun oth Enthalten in Elsevier Science The Lancet ELSEVIER Can digital technologies improve health? 2021 physics, chemistry and materials science Amsterdam [u.a.] (DE-627)ELV006885837 volume:15 year:2015 number:3 pages:302-306 extent:5 https://doi.org/10.1016/j.cap.2015.01.001 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U AR 15 2015 3 302-306 5 045F 530 |
allfields_unstemmed |
10.1016/j.cap.2015.01.001 doi GBVA2015007000001.pica (DE-627)ELV034457984 (ELSEVIER)S1567-1739(15)00002-4 DE-627 ger DE-627 rakwb eng 530 530 DE-600 Lee, Hong Seok verfasserin aut Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids 2015transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Elsevier Shin, Sanghoon oth Lee, Heonjoo oth Yu, Younghun oth Enthalten in Elsevier Science The Lancet ELSEVIER Can digital technologies improve health? 2021 physics, chemistry and materials science Amsterdam [u.a.] (DE-627)ELV006885837 volume:15 year:2015 number:3 pages:302-306 extent:5 https://doi.org/10.1016/j.cap.2015.01.001 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U AR 15 2015 3 302-306 5 045F 530 |
allfieldsGer |
10.1016/j.cap.2015.01.001 doi GBVA2015007000001.pica (DE-627)ELV034457984 (ELSEVIER)S1567-1739(15)00002-4 DE-627 ger DE-627 rakwb eng 530 530 DE-600 Lee, Hong Seok verfasserin aut Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids 2015transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Elsevier Shin, Sanghoon oth Lee, Heonjoo oth Yu, Younghun oth Enthalten in Elsevier Science The Lancet ELSEVIER Can digital technologies improve health? 2021 physics, chemistry and materials science Amsterdam [u.a.] (DE-627)ELV006885837 volume:15 year:2015 number:3 pages:302-306 extent:5 https://doi.org/10.1016/j.cap.2015.01.001 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U AR 15 2015 3 302-306 5 045F 530 |
allfieldsSound |
10.1016/j.cap.2015.01.001 doi GBVA2015007000001.pica (DE-627)ELV034457984 (ELSEVIER)S1567-1739(15)00002-4 DE-627 ger DE-627 rakwb eng 530 530 DE-600 Lee, Hong Seok verfasserin aut Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids 2015transfer abstract 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Elsevier Shin, Sanghoon oth Lee, Heonjoo oth Yu, Younghun oth Enthalten in Elsevier Science The Lancet ELSEVIER Can digital technologies improve health? 2021 physics, chemistry and materials science Amsterdam [u.a.] (DE-627)ELV006885837 volume:15 year:2015 number:3 pages:302-306 extent:5 https://doi.org/10.1016/j.cap.2015.01.001 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U AR 15 2015 3 302-306 5 045F 530 |
language |
English |
source |
Enthalten in Can digital technologies improve health? Amsterdam [u.a.] volume:15 year:2015 number:3 pages:302-306 extent:5 |
sourceStr |
Enthalten in Can digital technologies improve health? Amsterdam [u.a.] volume:15 year:2015 number:3 pages:302-306 extent:5 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Phase retrieval Surface shape measurement Phase measuring deflectometry |
dewey-raw |
530 |
isfreeaccess_bool |
false |
container_title |
Can digital technologies improve health? |
authorswithroles_txt_mv |
Lee, Hong Seok @@aut@@ Shin, Sanghoon @@oth@@ Lee, Heonjoo @@oth@@ Yu, Younghun @@oth@@ |
publishDateDaySort_date |
2015-01-01T00:00:00Z |
hierarchy_top_id |
ELV006885837 |
dewey-sort |
3530 |
id |
ELV034457984 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV034457984</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230625200958.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">180603s2015 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.cap.2015.01.001</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">GBVA2015007000001.pica</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV034457984</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S1567-1739(15)00002-4</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Lee, Hong Seok</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015transfer abstract</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">5</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Phase retrieval</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Surface shape measurement</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Phase measuring deflectometry</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shin, Sanghoon</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lee, Heonjoo</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yu, Younghun</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="n">Elsevier Science</subfield><subfield code="a">The Lancet ELSEVIER</subfield><subfield code="t">Can digital technologies improve health?</subfield><subfield code="d">2021</subfield><subfield code="d">physics, chemistry and materials science</subfield><subfield code="g">Amsterdam [u.a.]</subfield><subfield code="w">(DE-627)ELV006885837</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:15</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:3</subfield><subfield code="g">pages:302-306</subfield><subfield code="g">extent:5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1016/j.cap.2015.01.001</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">15</subfield><subfield code="j">2015</subfield><subfield code="e">3</subfield><subfield code="h">302-306</subfield><subfield code="g">5</subfield></datafield><datafield tag="953" ind1=" " ind2=" "><subfield code="2">045F</subfield><subfield code="a">530</subfield></datafield></record></collection>
|
author |
Lee, Hong Seok |
spellingShingle |
Lee, Hong Seok ddc 530 Elsevier Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
authorStr |
Lee, Hong Seok |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)ELV006885837 |
format |
electronic Article |
dewey-ones |
530 - Physics |
delete_txt_mv |
keep |
author_role |
aut |
collection |
elsevier |
remote_str |
true |
illustrated |
Not Illustrated |
topic_title |
530 530 DE-600 Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry Elsevier |
topic |
ddc 530 Elsevier Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry |
topic_unstemmed |
ddc 530 Elsevier Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry |
topic_browse |
ddc 530 Elsevier Phase retrieval Elsevier Surface shape measurement Elsevier Phase measuring deflectometry |
format_facet |
Elektronische Aufsätze Aufsätze Elektronische Ressource |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
zu |
author2_variant |
s s ss h l hl y y yy |
hierarchy_parent_title |
Can digital technologies improve health? |
hierarchy_parent_id |
ELV006885837 |
dewey-tens |
530 - Physics |
hierarchy_top_title |
Can digital technologies improve health? |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)ELV006885837 |
title |
Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
ctrlnum |
(DE-627)ELV034457984 (ELSEVIER)S1567-1739(15)00002-4 |
title_full |
Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
author_sort |
Lee, Hong Seok |
journal |
Can digital technologies improve health? |
journalStr |
Can digital technologies improve health? |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
500 - Science |
recordtype |
marc |
publishDateSort |
2015 |
contenttype_str_mv |
zzz |
container_start_page |
302 |
author_browse |
Lee, Hong Seok |
container_volume |
15 |
physical |
5 |
class |
530 530 DE-600 |
format_se |
Elektronische Aufsätze |
author-letter |
Lee, Hong Seok |
doi_str_mv |
10.1016/j.cap.2015.01.001 |
dewey-full |
530 |
title_sort |
determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
title_auth |
Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
abstract |
We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. |
abstractGer |
We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. |
abstract_unstemmed |
We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components. |
collection_details |
GBV_USEFLAG_U GBV_ELV SYSFLAG_U |
container_issue |
3 |
title_short |
Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids |
url |
https://doi.org/10.1016/j.cap.2015.01.001 |
remote_bool |
true |
author2 |
Shin, Sanghoon Lee, Heonjoo Yu, Younghun |
author2Str |
Shin, Sanghoon Lee, Heonjoo Yu, Younghun |
ppnlink |
ELV006885837 |
mediatype_str_mv |
z |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth oth |
doi_str |
10.1016/j.cap.2015.01.001 |
up_date |
2024-07-06T21:10:42.386Z |
_version_ |
1803865546961190912 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV034457984</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230625200958.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">180603s2015 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.cap.2015.01.001</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">GBVA2015007000001.pica</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV034457984</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S1567-1739(15)00002-4</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">DE-600</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Lee, Hong Seok</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015transfer abstract</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">5</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">We propose a method for simultaneously measuring the front and back surface profiles of transparent optical components. The proposed method combines dual wavelength transmission deflectometry with liquids to record distorted phases at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back surfaces of the lens. We propose a theoretical model to determine the surface information, and the imaging of achromatic lenses is experimentally demonstrated. Unlike conventional transmission deflectometry, our proposed method supports direct observation of the front and back surface profiles of the optical elements. Compared with other techniques such as interferometry, the proposed setup is simpler to align, has lower cost, and does not require coherent illumination. The proposed method can be applied to normal transmission deflectometry for determining the three-dimensional surface profiles of optical components.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Phase retrieval</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Surface shape measurement</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Phase measuring deflectometry</subfield><subfield code="2">Elsevier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shin, Sanghoon</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lee, Heonjoo</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yu, Younghun</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="n">Elsevier Science</subfield><subfield code="a">The Lancet ELSEVIER</subfield><subfield code="t">Can digital technologies improve health?</subfield><subfield code="d">2021</subfield><subfield code="d">physics, chemistry and materials science</subfield><subfield code="g">Amsterdam [u.a.]</subfield><subfield code="w">(DE-627)ELV006885837</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:15</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:3</subfield><subfield code="g">pages:302-306</subfield><subfield code="g">extent:5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1016/j.cap.2015.01.001</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">15</subfield><subfield code="j">2015</subfield><subfield code="e">3</subfield><subfield code="h">302-306</subfield><subfield code="g">5</subfield></datafield><datafield tag="953" ind1=" " ind2=" "><subfield code="2">045F</subfield><subfield code="a">530</subfield></datafield></record></collection>
|
score |
7.4001913 |