Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor film
• Photoelectron attenuation lengths (AL) through amorphous organic films were examined. • In the energy range below 9eV, AL fluctuates unlike a prediction by universal curve. • AL of photoelectron yield spectroscopy (PYS) measurements was found to be ∼3.6nm. • PYS signals still survived through an 1...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Ozawa, Yusuke [verfasserIn] |
|---|
| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2014 |
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| Schlagwörter: |
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| Umfang: |
5 |
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| Übergeordnetes Werk: |
Enthalten in: Self-healing hydrogels and their action mechanism in oil–gas drilling and development engineering: A systematic review and prospect - Bai, Yingrui ELSEVIER, 2021, the international journal on theoretical, experimental and applied aspects of electron spectroscopy, New York, NY [u.a.] |
|---|---|
| Übergeordnetes Werk: |
volume:197 ; year:2014 ; pages:17-21 ; extent:5 |
| Links: |
|---|
| DOI / URN: |
10.1016/j.elspec.2014.08.001 |
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ELV03936965X |
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| 520 | |a • Photoelectron attenuation lengths (AL) through amorphous organic films were examined. • In the energy range below 9eV, AL fluctuates unlike a prediction by universal curve. • AL of photoelectron yield spectroscopy (PYS) measurements was found to be ∼3.6nm. • PYS signals still survived through an 18nm-thick film despite such a moderate AL. • This indicates buried interfaces in practical organic devices can be accessed by PYS. | ||
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• Photoelectron attenuation lengths (AL) through amorphous organic films were examined. • In the energy range below 9eV, AL fluctuates unlike a prediction by universal curve. • AL of photoelectron yield spectroscopy (PYS) measurements was found to be ∼3.6nm. • PYS signals still survived through an 18nm-thick film despite such a moderate AL. • This indicates buried interfaces in practical organic devices can be accessed by PYS. |
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• Photoelectron attenuation lengths (AL) through amorphous organic films were examined. • In the energy range below 9eV, AL fluctuates unlike a prediction by universal curve. • AL of photoelectron yield spectroscopy (PYS) measurements was found to be ∼3.6nm. • PYS signals still survived through an 18nm-thick film despite such a moderate AL. • This indicates buried interfaces in practical organic devices can be accessed by PYS. |
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• Photoelectron attenuation lengths (AL) through amorphous organic films were examined. • In the energy range below 9eV, AL fluctuates unlike a prediction by universal curve. • AL of photoelectron yield spectroscopy (PYS) measurements was found to be ∼3.6nm. • PYS signals still survived through an 18nm-thick film despite such a moderate AL. • This indicates buried interfaces in practical organic devices can be accessed by PYS. |
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