Automated defect inspection system for CMOS image sensor with micro multi-layer non-spherical lens module
• Used the Retinex algorithm to correct the brightness of the multilayer lens module. • Generated a state-of-the-art experimental machine to solve the depth of field. • Utilized the defect integrity and defect sharpness to avoid extensive defects. • Compared single-scale Retinex with multiple-scale...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Jeffrey Kuo, Chung-Feng [verfasserIn] |
|---|
| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
2017 |
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| Schlagwörter: |
Micro multi-layer aspherical lens module |
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| Umfang: |
12 |
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| Übergeordnetes Werk: |
Enthalten in: Tilting at windmills? Electoral repercussions of wind turbine projects in Minnesota - Bayulgen, Oksan ELSEVIER, 2021, Dearborn, Mich |
|---|---|
| Übergeordnetes Werk: |
volume:45 ; year:2017 ; pages:248-259 ; extent:12 |
| Links: |
|---|
| DOI / URN: |
10.1016/j.jmsy.2017.10.004 |
|---|
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ELV041332903 |
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| 520 | |a • Used the Retinex algorithm to correct the brightness of the multilayer lens module. • Generated a state-of-the-art experimental machine to solve the depth of field. • Utilized the defect integrity and defect sharpness to avoid extensive defects. • Compared single-scale Retinex with multiple-scale Retinex for brightness correction. | ||
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Automated defect inspection system for CMOS image sensor with micro multi-layer non-spherical lens module |
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• Used the Retinex algorithm to correct the brightness of the multilayer lens module. • Generated a state-of-the-art experimental machine to solve the depth of field. • Utilized the defect integrity and defect sharpness to avoid extensive defects. • Compared single-scale Retinex with multiple-scale Retinex for brightness correction. |
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• Used the Retinex algorithm to correct the brightness of the multilayer lens module. • Generated a state-of-the-art experimental machine to solve the depth of field. • Utilized the defect integrity and defect sharpness to avoid extensive defects. • Compared single-scale Retinex with multiple-scale Retinex for brightness correction. |
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• Used the Retinex algorithm to correct the brightness of the multilayer lens module. • Generated a state-of-the-art experimental machine to solve the depth of field. • Utilized the defect integrity and defect sharpness to avoid extensive defects. • Compared single-scale Retinex with multiple-scale Retinex for brightness correction. |
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Automated defect inspection system for CMOS image sensor with micro multi-layer non-spherical lens module |
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