Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique
Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indi...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Arunkumar, P. [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2018transfer abstract |
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| Umfang: |
10 |
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| Übergeordnetes Werk: |
Enthalten in: Factors associated with canine resource guarding behaviour in the presence of people: A cross-sectional survey of dog owners - Jacobs, Jacquelyn A. ELSEVIER, 2017, JAL : an interdisciplinary journal of materials science and solid-state chemistry and physics, Lausanne |
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| Übergeordnetes Werk: |
volume:765 ; year:2018 ; day:15 ; month:10 ; pages:418-427 ; extent:10 |
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| DOI / URN: |
10.1016/j.jallcom.2018.06.232 |
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| 245 | 1 | 0 | |a Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique |
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| 520 | |a Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. | ||
| 520 | |a Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. | ||
| 650 | 7 | |a Thin films |2 Elsevier | |
| 650 | 7 | |a Ceria-zirconia |2 Elsevier | |
| 650 | 7 | |a EB-PVD |2 Elsevier | |
| 650 | 7 | |a Nanostructure |2 Elsevier | |
| 650 | 7 | |a Hardness |2 Elsevier | |
| 700 | 1 | |a Aarthi, U. |4 oth | |
| 700 | 1 | |a Sribalaji, M. |4 oth | |
| 700 | 1 | |a Mukherjee, B. |4 oth | |
| 700 | 1 | |a Keshri, Anup Kumar |4 oth | |
| 700 | 1 | |a Tanveer, Waqas Hassan |4 oth | |
| 700 | 1 | |a Cha, Suk-Won |4 oth | |
| 700 | 1 | |a Babu, K. Suresh |4 oth | |
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10.1016/j.jallcom.2018.06.232 doi GBV00000000000698.pica (DE-627)ELV043979459 (ELSEVIER)S0925-8388(18)32353-3 DE-627 ger DE-627 rakwb eng 630 VZ Arunkumar, P. verfasserin aut Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique 2018transfer abstract 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Thin films Elsevier Ceria-zirconia Elsevier EB-PVD Elsevier Nanostructure Elsevier Hardness Elsevier Aarthi, U. oth Sribalaji, M. oth Mukherjee, B. oth Keshri, Anup Kumar oth Tanveer, Waqas Hassan oth Cha, Suk-Won oth Babu, K. Suresh oth Enthalten in Elsevier Jacobs, Jacquelyn A. ELSEVIER Factors associated with canine resource guarding behaviour in the presence of people: A cross-sectional survey of dog owners 2017 JAL : an interdisciplinary journal of materials science and solid-state chemistry and physics Lausanne (DE-627)ELV001115774 volume:765 year:2018 day:15 month:10 pages:418-427 extent:10 https://doi.org/10.1016/j.jallcom.2018.06.232 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA AR 765 2018 15 1015 418-427 10 |
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10.1016/j.jallcom.2018.06.232 doi GBV00000000000698.pica (DE-627)ELV043979459 (ELSEVIER)S0925-8388(18)32353-3 DE-627 ger DE-627 rakwb eng 630 VZ Arunkumar, P. verfasserin aut Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique 2018transfer abstract 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Thin films Elsevier Ceria-zirconia Elsevier EB-PVD Elsevier Nanostructure Elsevier Hardness Elsevier Aarthi, U. oth Sribalaji, M. oth Mukherjee, B. oth Keshri, Anup Kumar oth Tanveer, Waqas Hassan oth Cha, Suk-Won oth Babu, K. Suresh oth Enthalten in Elsevier Jacobs, Jacquelyn A. ELSEVIER Factors associated with canine resource guarding behaviour in the presence of people: A cross-sectional survey of dog owners 2017 JAL : an interdisciplinary journal of materials science and solid-state chemistry and physics Lausanne (DE-627)ELV001115774 volume:765 year:2018 day:15 month:10 pages:418-427 extent:10 https://doi.org/10.1016/j.jallcom.2018.06.232 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA AR 765 2018 15 1015 418-427 10 |
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10.1016/j.jallcom.2018.06.232 doi GBV00000000000698.pica (DE-627)ELV043979459 (ELSEVIER)S0925-8388(18)32353-3 DE-627 ger DE-627 rakwb eng 630 VZ Arunkumar, P. verfasserin aut Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique 2018transfer abstract 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Thin films Elsevier Ceria-zirconia Elsevier EB-PVD Elsevier Nanostructure Elsevier Hardness Elsevier Aarthi, U. oth Sribalaji, M. oth Mukherjee, B. oth Keshri, Anup Kumar oth Tanveer, Waqas Hassan oth Cha, Suk-Won oth Babu, K. Suresh oth Enthalten in Elsevier Jacobs, Jacquelyn A. ELSEVIER Factors associated with canine resource guarding behaviour in the presence of people: A cross-sectional survey of dog owners 2017 JAL : an interdisciplinary journal of materials science and solid-state chemistry and physics Lausanne (DE-627)ELV001115774 volume:765 year:2018 day:15 month:10 pages:418-427 extent:10 https://doi.org/10.1016/j.jallcom.2018.06.232 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA AR 765 2018 15 1015 418-427 10 |
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10.1016/j.jallcom.2018.06.232 doi GBV00000000000698.pica (DE-627)ELV043979459 (ELSEVIER)S0925-8388(18)32353-3 DE-627 ger DE-627 rakwb eng 630 VZ Arunkumar, P. verfasserin aut Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique 2018transfer abstract 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Thin films Elsevier Ceria-zirconia Elsevier EB-PVD Elsevier Nanostructure Elsevier Hardness Elsevier Aarthi, U. oth Sribalaji, M. oth Mukherjee, B. oth Keshri, Anup Kumar oth Tanveer, Waqas Hassan oth Cha, Suk-Won oth Babu, K. Suresh oth Enthalten in Elsevier Jacobs, Jacquelyn A. ELSEVIER Factors associated with canine resource guarding behaviour in the presence of people: A cross-sectional survey of dog owners 2017 JAL : an interdisciplinary journal of materials science and solid-state chemistry and physics Lausanne (DE-627)ELV001115774 volume:765 year:2018 day:15 month:10 pages:418-427 extent:10 https://doi.org/10.1016/j.jallcom.2018.06.232 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA AR 765 2018 15 1015 418-427 10 |
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10.1016/j.jallcom.2018.06.232 doi GBV00000000000698.pica (DE-627)ELV043979459 (ELSEVIER)S0925-8388(18)32353-3 DE-627 ger DE-627 rakwb eng 630 VZ Arunkumar, P. verfasserin aut Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique 2018transfer abstract 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. Thin films Elsevier Ceria-zirconia Elsevier EB-PVD Elsevier Nanostructure Elsevier Hardness Elsevier Aarthi, U. oth Sribalaji, M. oth Mukherjee, B. oth Keshri, Anup Kumar oth Tanveer, Waqas Hassan oth Cha, Suk-Won oth Babu, K. Suresh oth Enthalten in Elsevier Jacobs, Jacquelyn A. ELSEVIER Factors associated with canine resource guarding behaviour in the presence of people: A cross-sectional survey of dog owners 2017 JAL : an interdisciplinary journal of materials science and solid-state chemistry and physics Lausanne (DE-627)ELV001115774 volume:765 year:2018 day:15 month:10 pages:418-427 extent:10 https://doi.org/10.1016/j.jallcom.2018.06.232 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA AR 765 2018 15 1015 418-427 10 |
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Deposition rate dependent phase/mechanical property evolution in zirconia and ceria-zirconia thin film by EB-PVD technique |
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Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. |
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Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. |
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Pure zirconia (ZrO2) and ceria (16 mol%) stabilized zirconia (CeSZr) thin films were prepared by electron beam physical vapor deposition with varying deposition rates (1, 4 and 8 Å/s) in order to correlate the phase changes to the mechanical property. X-ray diffraction and Raman spectra results indicate the presence of mixed monoclinic and tetragonal phases in ZrO2 film, but tetragonal phase dominated at lower deposition rate. However, irrespective of the deposition rate, cerium addition to ZrO2 resulted in complete stabilization of tetragonal phase. Depending on the presence of dual (ZrO2) or single (CeSZr) phase, either surface cracks or well-connected grain structure was observed in SEM, respectively. Thus, CeSZr film showed a four-fold increase in hardness in comparison to ZrO2, which can be attributed to the complete stabilization of tetragonal phase that hinders the crack propagation along the grain. Plastic deformation of CeSZr film was found to be 1.80 × 10−2 GPa, which is about ∼55% higher as compared to pure ZrO2 film (8.04 × 10−3 GPa). Thus, the development of CeSZr coating may lead to better surface protection of many components. |
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