Crack propagation of Si nanofilm accompanied by initial stage of wet oxidation
Display Omitted
Gespeichert in:
| Autor*in: |
Sun, Yu [verfasserIn] |
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| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
2020 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: Characterising shape patterns using features derived from best-fitting ellipsoids - Gontar, Amelia ELSEVIER, 2018, a journal devoted to applied physics and chemistry of surfaces and interfaces, Amsterdam |
|---|---|
| Übergeordnetes Werk: |
volume:505 ; year:2020 ; day:1 ; month:03 ; pages:0 |
| Links: |
|---|
| DOI / URN: |
10.1016/j.apsusc.2019.144200 |
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