Metal contamination of silicon from the furnace atmosphere after crystallization
• Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals.
Autor*in: |
Kranert, C. [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2021 |
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Schlagwörter: |
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Übergeordnetes Werk: |
Enthalten in: The mental health of doctor-shoppers: Experience from a patient-led fee-for-service primary care setting - 2011, Amsterdam [u.a.] |
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Übergeordnetes Werk: |
volume:559 ; year:2021 ; day:1 ; month:04 ; pages:0 |
Links: |
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DOI / URN: |
10.1016/j.jcrysgro.2021.126026 |
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10.1016/j.jcrysgro.2021.126026 doi /cbs_pica/cbs_olc/import_discovery/elsevier/einzuspielen/GBV00000000001295.pica (DE-627)ELV053077121 (ELSEVIER)S0022-0248(21)00002-6 DE-627 ger DE-627 rakwb eng 610 VZ 570 540 VZ Kranert, C. verfasserin aut Metal contamination of silicon from the furnace atmosphere after crystallization 2021 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals. A1. Metal impurities Elsevier A1. Diffusion Elsevier B2. Semiconducting silicon Elsevier Trempa, M. oth Reimann, C. oth Friedrich, J. oth Enthalten in Elsevier The mental health of doctor-shoppers: Experience from a patient-led fee-for-service primary care setting 2011 Amsterdam [u.a.] (DE-627)ELV010662650 volume:559 year:2021 day:1 month:04 pages:0 https://doi.org/10.1016/j.jcrysgro.2021.126026 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA GBV_ILN_22 GBV_ILN_40 GBV_ILN_105 AR 559 2021 1 0401 0 |
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10.1016/j.jcrysgro.2021.126026 doi /cbs_pica/cbs_olc/import_discovery/elsevier/einzuspielen/GBV00000000001295.pica (DE-627)ELV053077121 (ELSEVIER)S0022-0248(21)00002-6 DE-627 ger DE-627 rakwb eng 610 VZ 570 540 VZ Kranert, C. verfasserin aut Metal contamination of silicon from the furnace atmosphere after crystallization 2021 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals. A1. Metal impurities Elsevier A1. Diffusion Elsevier B2. Semiconducting silicon Elsevier Trempa, M. oth Reimann, C. oth Friedrich, J. oth Enthalten in Elsevier The mental health of doctor-shoppers: Experience from a patient-led fee-for-service primary care setting 2011 Amsterdam [u.a.] (DE-627)ELV010662650 volume:559 year:2021 day:1 month:04 pages:0 https://doi.org/10.1016/j.jcrysgro.2021.126026 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA GBV_ILN_22 GBV_ILN_40 GBV_ILN_105 AR 559 2021 1 0401 0 |
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10.1016/j.jcrysgro.2021.126026 doi /cbs_pica/cbs_olc/import_discovery/elsevier/einzuspielen/GBV00000000001295.pica (DE-627)ELV053077121 (ELSEVIER)S0022-0248(21)00002-6 DE-627 ger DE-627 rakwb eng 610 VZ 570 540 VZ Kranert, C. verfasserin aut Metal contamination of silicon from the furnace atmosphere after crystallization 2021 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier • Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals. A1. Metal impurities Elsevier A1. Diffusion Elsevier B2. Semiconducting silicon Elsevier Trempa, M. oth Reimann, C. oth Friedrich, J. oth Enthalten in Elsevier The mental health of doctor-shoppers: Experience from a patient-led fee-for-service primary care setting 2011 Amsterdam [u.a.] (DE-627)ELV010662650 volume:559 year:2021 day:1 month:04 pages:0 https://doi.org/10.1016/j.jcrysgro.2021.126026 Volltext GBV_USEFLAG_U GBV_ELV SYSFLAG_U SSG-OLC-PHA GBV_ILN_22 GBV_ILN_40 GBV_ILN_105 AR 559 2021 1 0401 0 |
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metal contamination of silicon from the furnace atmosphere after crystallization |
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Metal contamination of silicon from the furnace atmosphere after crystallization |
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• Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals. |
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• Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals. |
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• Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals. |
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