Metal contamination of silicon from the furnace atmosphere after crystallization

• Metals like iron, cobalt and nickel are introduced into silicon crystals from furnace. • Charge carrier lifetime is substantially reduced by contamination from gas phase. • Lifetime profiles used to evaluate the in-diffusion of the metals.

Gespeichert in:
Autor*in:

Kranert, C. [verfasserIn]

Trempa, M.

Reimann, C.

Friedrich, J.

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2021

Schlagwörter:

A1. Metal impurities

A1. Diffusion

B2. Semiconducting silicon

Übergeordnetes Werk:

Enthalten in: The mental health of doctor-shoppers: Experience from a patient-led fee-for-service primary care setting - 2011, Amsterdam [u.a.]

Übergeordnetes Werk:

volume:559 ; year:2021 ; day:1 ; month:04 ; pages:0

Links:

Volltext

DOI / URN:

10.1016/j.jcrysgro.2021.126026

Katalog-ID:

ELV053077121

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