Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation
The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simulta...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Shi, Qiwei [verfasserIn] Loisnard, Dominique [verfasserIn] Dan, Chengyi [verfasserIn] Zhang, Fengguo [verfasserIn] Zhong, Hongru [verfasserIn] Li, Han [verfasserIn] Li, Yuda [verfasserIn] Chen, Zhe [verfasserIn] Wang, Haowei [verfasserIn] Roux, Stéphane [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2021 |
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| Schlagwörter: |
Integrated digital image correlation |
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| Übergeordnetes Werk: |
Enthalten in: Materials characterization - New York, NY : Science Direct, 1990, 178 |
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| Übergeordnetes Werk: |
volume:178 |
| DOI / URN: |
10.1016/j.matchar.2021.111206 |
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| Katalog-ID: |
ELV054679656 |
|---|
| LEADER | 01000caa a22002652 4500 | ||
|---|---|---|---|
| 001 | ELV054679656 | ||
| 003 | DE-627 | ||
| 005 | 20230927121921.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 210910s2021 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.1016/j.matchar.2021.111206 |2 doi | |
| 035 | |a (DE-627)ELV054679656 | ||
| 035 | |a (ELSEVIER)S1044-5803(21)00336-3 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rda | ||
| 041 | |a eng | ||
| 082 | 0 | 4 | |a 670 |q VZ |
| 084 | |a 51.30 |2 bkl | ||
| 100 | 1 | |a Shi, Qiwei |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation |
| 264 | 1 | |c 2021 | |
| 336 | |a nicht spezifiziert |b zzz |2 rdacontent | ||
| 337 | |a Computermedien |b c |2 rdamedia | ||
| 338 | |a Online-Ressource |b cr |2 rdacarrier | ||
| 520 | |a The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. | ||
| 650 | 4 | |a EBSD calibration | |
| 650 | 4 | |a High-angular-resolution EBSD | |
| 650 | 4 | |a Integrated digital image correlation | |
| 650 | 4 | |a Geometrically necessary dislocations | |
| 650 | 4 | |a Intragranular substructures | |
| 700 | 1 | |a Loisnard, Dominique |e verfasserin |4 aut | |
| 700 | 1 | |a Dan, Chengyi |e verfasserin |4 aut | |
| 700 | 1 | |a Zhang, Fengguo |e verfasserin |4 aut | |
| 700 | 1 | |a Zhong, Hongru |e verfasserin |4 aut | |
| 700 | 1 | |a Li, Han |e verfasserin |4 aut | |
| 700 | 1 | |a Li, Yuda |e verfasserin |4 aut | |
| 700 | 1 | |a Chen, Zhe |e verfasserin |4 aut | |
| 700 | 1 | |a Wang, Haowei |e verfasserin |4 aut | |
| 700 | 1 | |a Roux, Stéphane |e verfasserin |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |t Materials characterization |d New York, NY : Science Direct, 1990 |g 178 |h Online-Ressource |w (DE-627)302719288 |w (DE-600)1491951-5 |w (DE-576)259483966 |7 nnns |
| 773 | 1 | 8 | |g volume:178 |
| 912 | |a GBV_USEFLAG_U | ||
| 912 | |a GBV_ELV | ||
| 912 | |a SYSFLAG_U | ||
| 912 | |a GBV_ILN_20 | ||
| 912 | |a GBV_ILN_22 | ||
| 912 | |a GBV_ILN_23 | ||
| 912 | |a GBV_ILN_24 | ||
| 912 | |a GBV_ILN_31 | ||
| 912 | |a GBV_ILN_32 | ||
| 912 | |a GBV_ILN_40 | ||
| 912 | |a GBV_ILN_60 | ||
| 912 | |a GBV_ILN_62 | ||
| 912 | |a GBV_ILN_63 | ||
| 912 | |a GBV_ILN_65 | ||
| 912 | |a GBV_ILN_69 | ||
| 912 | |a GBV_ILN_70 | ||
| 912 | |a GBV_ILN_73 | ||
| 912 | |a GBV_ILN_74 | ||
| 912 | |a GBV_ILN_90 | ||
| 912 | |a GBV_ILN_95 | ||
| 912 | |a GBV_ILN_100 | ||
| 912 | |a GBV_ILN_105 | ||
| 912 | |a GBV_ILN_110 | ||
| 912 | |a GBV_ILN_150 | ||
| 912 | |a GBV_ILN_151 | ||
| 912 | |a GBV_ILN_224 | ||
| 912 | |a GBV_ILN_370 | ||
| 912 | |a GBV_ILN_602 | ||
| 912 | |a GBV_ILN_702 | ||
| 912 | |a GBV_ILN_2003 | ||
| 912 | |a GBV_ILN_2004 | ||
| 912 | |a GBV_ILN_2005 | ||
| 912 | |a GBV_ILN_2008 | ||
| 912 | |a GBV_ILN_2010 | ||
| 912 | |a GBV_ILN_2011 | ||
| 912 | |a GBV_ILN_2014 | ||
| 912 | |a GBV_ILN_2015 | ||
| 912 | |a GBV_ILN_2020 | ||
| 912 | |a GBV_ILN_2021 | ||
| 912 | |a GBV_ILN_2025 | ||
| 912 | |a GBV_ILN_2027 | ||
| 912 | |a GBV_ILN_2034 | ||
| 912 | |a GBV_ILN_2038 | ||
| 912 | |a GBV_ILN_2044 | ||
| 912 | |a GBV_ILN_2048 | ||
| 912 | |a GBV_ILN_2049 | ||
| 912 | |a GBV_ILN_2050 | ||
| 912 | |a GBV_ILN_2056 | ||
| 912 | |a GBV_ILN_2059 | ||
| 912 | |a GBV_ILN_2061 | ||
| 912 | |a GBV_ILN_2064 | ||
| 912 | |a GBV_ILN_2065 | ||
| 912 | |a GBV_ILN_2068 | ||
| 912 | |a GBV_ILN_2088 | ||
| 912 | |a GBV_ILN_2111 | ||
| 912 | |a GBV_ILN_2112 | ||
| 912 | |a GBV_ILN_2113 | ||
| 912 | |a GBV_ILN_2118 | ||
| 912 | |a GBV_ILN_2122 | ||
| 912 | |a GBV_ILN_2129 | ||
| 912 | |a GBV_ILN_2143 | ||
| 912 | |a GBV_ILN_2147 | ||
| 912 | |a GBV_ILN_2148 | ||
| 912 | |a GBV_ILN_2152 | ||
| 912 | |a GBV_ILN_2153 | ||
| 912 | |a GBV_ILN_2190 | ||
| 912 | |a GBV_ILN_2336 | ||
| 912 | |a GBV_ILN_2470 | ||
| 912 | |a GBV_ILN_2507 | ||
| 912 | |a GBV_ILN_2522 | ||
| 912 | |a GBV_ILN_4035 | ||
| 912 | |a GBV_ILN_4037 | ||
| 912 | |a GBV_ILN_4046 | ||
| 912 | |a GBV_ILN_4112 | ||
| 912 | |a GBV_ILN_4125 | ||
| 912 | |a GBV_ILN_4126 | ||
| 912 | |a GBV_ILN_4242 | ||
| 912 | |a GBV_ILN_4251 | ||
| 912 | |a GBV_ILN_4305 | ||
| 912 | |a GBV_ILN_4313 | ||
| 912 | |a GBV_ILN_4322 | ||
| 912 | |a GBV_ILN_4323 | ||
| 912 | |a GBV_ILN_4324 | ||
| 912 | |a GBV_ILN_4325 | ||
| 912 | |a GBV_ILN_4326 | ||
| 912 | |a GBV_ILN_4333 | ||
| 912 | |a GBV_ILN_4334 | ||
| 912 | |a GBV_ILN_4335 | ||
| 912 | |a GBV_ILN_4338 | ||
| 912 | |a GBV_ILN_4393 | ||
| 936 | b | k | |a 51.30 |j Werkstoffprüfung |j Werkstoffuntersuchung |q VZ |
| 951 | |a AR | ||
| 952 | |d 178 | ||
| author_variant |
q s qs d l dl c d cd f z fz h z hz h l hl y l yl z c zc h w hw s r sr |
|---|---|
| matchkey_str |
shiqiweiloisnarddominiquedanchengyizhang:2021----:airtoocytlrettoadatrcneoesuignert |
| hierarchy_sort_str |
2021 |
| bklnumber |
51.30 |
| publishDate |
2021 |
| allfields |
10.1016/j.matchar.2021.111206 doi (DE-627)ELV054679656 (ELSEVIER)S1044-5803(21)00336-3 DE-627 ger DE-627 rda eng 670 VZ 51.30 bkl Shi, Qiwei verfasserin aut Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures Loisnard, Dominique verfasserin aut Dan, Chengyi verfasserin aut Zhang, Fengguo verfasserin aut Zhong, Hongru verfasserin aut Li, Han verfasserin aut Li, Yuda verfasserin aut Chen, Zhe verfasserin aut Wang, Haowei verfasserin aut Roux, Stéphane verfasserin aut Enthalten in Materials characterization New York, NY : Science Direct, 1990 178 Online-Ressource (DE-627)302719288 (DE-600)1491951-5 (DE-576)259483966 nnns volume:178 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 51.30 Werkstoffprüfung Werkstoffuntersuchung VZ AR 178 |
| spelling |
10.1016/j.matchar.2021.111206 doi (DE-627)ELV054679656 (ELSEVIER)S1044-5803(21)00336-3 DE-627 ger DE-627 rda eng 670 VZ 51.30 bkl Shi, Qiwei verfasserin aut Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures Loisnard, Dominique verfasserin aut Dan, Chengyi verfasserin aut Zhang, Fengguo verfasserin aut Zhong, Hongru verfasserin aut Li, Han verfasserin aut Li, Yuda verfasserin aut Chen, Zhe verfasserin aut Wang, Haowei verfasserin aut Roux, Stéphane verfasserin aut Enthalten in Materials characterization New York, NY : Science Direct, 1990 178 Online-Ressource (DE-627)302719288 (DE-600)1491951-5 (DE-576)259483966 nnns volume:178 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 51.30 Werkstoffprüfung Werkstoffuntersuchung VZ AR 178 |
| allfields_unstemmed |
10.1016/j.matchar.2021.111206 doi (DE-627)ELV054679656 (ELSEVIER)S1044-5803(21)00336-3 DE-627 ger DE-627 rda eng 670 VZ 51.30 bkl Shi, Qiwei verfasserin aut Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures Loisnard, Dominique verfasserin aut Dan, Chengyi verfasserin aut Zhang, Fengguo verfasserin aut Zhong, Hongru verfasserin aut Li, Han verfasserin aut Li, Yuda verfasserin aut Chen, Zhe verfasserin aut Wang, Haowei verfasserin aut Roux, Stéphane verfasserin aut Enthalten in Materials characterization New York, NY : Science Direct, 1990 178 Online-Ressource (DE-627)302719288 (DE-600)1491951-5 (DE-576)259483966 nnns volume:178 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 51.30 Werkstoffprüfung Werkstoffuntersuchung VZ AR 178 |
| allfieldsGer |
10.1016/j.matchar.2021.111206 doi (DE-627)ELV054679656 (ELSEVIER)S1044-5803(21)00336-3 DE-627 ger DE-627 rda eng 670 VZ 51.30 bkl Shi, Qiwei verfasserin aut Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures Loisnard, Dominique verfasserin aut Dan, Chengyi verfasserin aut Zhang, Fengguo verfasserin aut Zhong, Hongru verfasserin aut Li, Han verfasserin aut Li, Yuda verfasserin aut Chen, Zhe verfasserin aut Wang, Haowei verfasserin aut Roux, Stéphane verfasserin aut Enthalten in Materials characterization New York, NY : Science Direct, 1990 178 Online-Ressource (DE-627)302719288 (DE-600)1491951-5 (DE-576)259483966 nnns volume:178 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 51.30 Werkstoffprüfung Werkstoffuntersuchung VZ AR 178 |
| allfieldsSound |
10.1016/j.matchar.2021.111206 doi (DE-627)ELV054679656 (ELSEVIER)S1044-5803(21)00336-3 DE-627 ger DE-627 rda eng 670 VZ 51.30 bkl Shi, Qiwei verfasserin aut Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation 2021 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures Loisnard, Dominique verfasserin aut Dan, Chengyi verfasserin aut Zhang, Fengguo verfasserin aut Zhong, Hongru verfasserin aut Li, Han verfasserin aut Li, Yuda verfasserin aut Chen, Zhe verfasserin aut Wang, Haowei verfasserin aut Roux, Stéphane verfasserin aut Enthalten in Materials characterization New York, NY : Science Direct, 1990 178 Online-Ressource (DE-627)302719288 (DE-600)1491951-5 (DE-576)259483966 nnns volume:178 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 51.30 Werkstoffprüfung Werkstoffuntersuchung VZ AR 178 |
| language |
English |
| source |
Enthalten in Materials characterization 178 volume:178 |
| sourceStr |
Enthalten in Materials characterization 178 volume:178 |
| format_phy_str_mv |
Article |
| bklname |
Werkstoffprüfung Werkstoffuntersuchung |
| institution |
findex.gbv.de |
| topic_facet |
EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures |
| dewey-raw |
670 |
| isfreeaccess_bool |
false |
| container_title |
Materials characterization |
| authorswithroles_txt_mv |
Shi, Qiwei @@aut@@ Loisnard, Dominique @@aut@@ Dan, Chengyi @@aut@@ Zhang, Fengguo @@aut@@ Zhong, Hongru @@aut@@ Li, Han @@aut@@ Li, Yuda @@aut@@ Chen, Zhe @@aut@@ Wang, Haowei @@aut@@ Roux, Stéphane @@aut@@ |
| publishDateDaySort_date |
2021-01-01T00:00:00Z |
| hierarchy_top_id |
302719288 |
| dewey-sort |
3670 |
| id |
ELV054679656 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV054679656</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230927121921.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">210910s2021 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.matchar.2021.111206</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV054679656</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S1044-5803(21)00336-3</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.30</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shi, Qiwei</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2021</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">EBSD calibration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">High-angular-resolution EBSD</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated digital image correlation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Geometrically necessary dislocations</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Intragranular substructures</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Loisnard, Dominique</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dan, Chengyi</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhang, Fengguo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhong, Hongru</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Han</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Yuda</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chen, Zhe</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wang, Haowei</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roux, Stéphane</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Materials characterization</subfield><subfield code="d">New York, NY : Science Direct, 1990</subfield><subfield code="g">178</subfield><subfield code="h">Online-Ressource</subfield><subfield code="w">(DE-627)302719288</subfield><subfield code="w">(DE-600)1491951-5</subfield><subfield code="w">(DE-576)259483966</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:178</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_74</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_90</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_100</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_150</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_224</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_702</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2003</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2008</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2010</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2011</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2020</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2021</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2025</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2027</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2034</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2038</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2044</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2048</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2049</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2050</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2056</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2059</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2061</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2064</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2065</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2068</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2088</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2111</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2113</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2118</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2122</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2129</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2143</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2147</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2148</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2152</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2153</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2190</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2470</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2507</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2522</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4035</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4242</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4251</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4326</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4333</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4334</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4393</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">51.30</subfield><subfield code="j">Werkstoffprüfung</subfield><subfield code="j">Werkstoffuntersuchung</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">178</subfield></datafield></record></collection>
|
| author |
Shi, Qiwei |
| spellingShingle |
Shi, Qiwei ddc 670 bkl 51.30 misc EBSD calibration misc High-angular-resolution EBSD misc Integrated digital image correlation misc Geometrically necessary dislocations misc Intragranular substructures Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation |
| authorStr |
Shi, Qiwei |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)302719288 |
| format |
electronic Article |
| dewey-ones |
670 - Manufacturing |
| delete_txt_mv |
keep |
| author_role |
aut aut aut aut aut aut aut aut aut aut |
| collection |
elsevier |
| remote_str |
true |
| illustrated |
Not Illustrated |
| topic_title |
670 VZ 51.30 bkl Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation EBSD calibration High-angular-resolution EBSD Integrated digital image correlation Geometrically necessary dislocations Intragranular substructures |
| topic |
ddc 670 bkl 51.30 misc EBSD calibration misc High-angular-resolution EBSD misc Integrated digital image correlation misc Geometrically necessary dislocations misc Intragranular substructures |
| topic_unstemmed |
ddc 670 bkl 51.30 misc EBSD calibration misc High-angular-resolution EBSD misc Integrated digital image correlation misc Geometrically necessary dislocations misc Intragranular substructures |
| topic_browse |
ddc 670 bkl 51.30 misc EBSD calibration misc High-angular-resolution EBSD misc Integrated digital image correlation misc Geometrically necessary dislocations misc Intragranular substructures |
| format_facet |
Elektronische Aufsätze Aufsätze Elektronische Ressource |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
cr |
| hierarchy_parent_title |
Materials characterization |
| hierarchy_parent_id |
302719288 |
| dewey-tens |
670 - Manufacturing |
| hierarchy_top_title |
Materials characterization |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)302719288 (DE-600)1491951-5 (DE-576)259483966 |
| title |
Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation |
| ctrlnum |
(DE-627)ELV054679656 (ELSEVIER)S1044-5803(21)00336-3 |
| title_full |
Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation |
| author_sort |
Shi, Qiwei |
| journal |
Materials characterization |
| journalStr |
Materials characterization |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
600 - Technology |
| recordtype |
marc |
| publishDateSort |
2021 |
| contenttype_str_mv |
zzz |
| author_browse |
Shi, Qiwei Loisnard, Dominique Dan, Chengyi Zhang, Fengguo Zhong, Hongru Li, Han Li, Yuda Chen, Zhe Wang, Haowei Roux, Stéphane |
| container_volume |
178 |
| class |
670 VZ 51.30 bkl |
| format_se |
Elektronische Aufsätze |
| author-letter |
Shi, Qiwei |
| doi_str_mv |
10.1016/j.matchar.2021.111206 |
| dewey-full |
670 |
| author2-role |
verfasserin |
| title_sort |
calibration of crystal orientation and pattern center of ebsd using integrated digital image correlation |
| title_auth |
Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation |
| abstract |
The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. |
| abstractGer |
The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. |
| abstract_unstemmed |
The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities. |
| collection_details |
GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_224 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2008 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2038 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4393 |
| title_short |
Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation |
| remote_bool |
true |
| author2 |
Loisnard, Dominique Dan, Chengyi Zhang, Fengguo Zhong, Hongru Li, Han Li, Yuda Chen, Zhe Wang, Haowei Roux, Stéphane |
| author2Str |
Loisnard, Dominique Dan, Chengyi Zhang, Fengguo Zhong, Hongru Li, Han Li, Yuda Chen, Zhe Wang, Haowei Roux, Stéphane |
| ppnlink |
302719288 |
| mediatype_str_mv |
c |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| doi_str |
10.1016/j.matchar.2021.111206 |
| up_date |
2024-07-06T22:23:59.271Z |
| _version_ |
1803870157430325248 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">ELV054679656</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230927121921.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">210910s2021 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.matchar.2021.111206</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)ELV054679656</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ELSEVIER)S1044-5803(21)00336-3</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.30</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shi, Qiwei</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2021</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, an Integrated Digital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2 degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">EBSD calibration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">High-angular-resolution EBSD</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated digital image correlation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Geometrically necessary dislocations</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Intragranular substructures</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Loisnard, Dominique</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dan, Chengyi</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhang, Fengguo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhong, Hongru</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Han</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Yuda</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chen, Zhe</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wang, Haowei</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roux, Stéphane</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Materials characterization</subfield><subfield code="d">New York, NY : Science Direct, 1990</subfield><subfield code="g">178</subfield><subfield code="h">Online-Ressource</subfield><subfield code="w">(DE-627)302719288</subfield><subfield code="w">(DE-600)1491951-5</subfield><subfield code="w">(DE-576)259483966</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:178</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ELV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_74</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_90</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_100</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_150</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_224</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_702</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2003</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2008</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2010</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2011</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2020</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2021</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2025</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2027</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2034</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2038</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2044</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2048</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2049</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2050</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2056</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2059</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2061</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2064</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2065</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2068</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2088</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2111</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2113</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2118</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2122</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2129</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2143</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2147</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2148</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2152</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2153</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2190</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2470</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2507</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2522</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4035</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4242</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4251</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4326</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4333</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4334</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4393</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">51.30</subfield><subfield code="j">Werkstoffprüfung</subfield><subfield code="j">Werkstoffuntersuchung</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">178</subfield></datafield></record></collection>
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| score |
7.4019012 |