Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm
To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined backgroun...
Ausführliche Beschreibung
Autor*in: |
Chen, Tao [verfasserIn] Dong, Le [verfasserIn] Liao, XianQi [verfasserIn] Zheng, RuMeng [verfasserIn] Hu, WeiWen [verfasserIn] Zheng, Qi [verfasserIn] Wu, NanXing [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2023 |
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Schlagwörter: |
Defect stitching determination |
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Übergeordnetes Werk: |
Enthalten in: Optics & laser technology - Amsterdam [u.a.] : Elsevier Science, 1971, 169 |
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Übergeordnetes Werk: |
volume:169 |
DOI / URN: |
10.1016/j.optlastec.2023.110025 |
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Katalog-ID: |
ELV065176502 |
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245 | 1 | 0 | |a Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm |
264 | 1 | |c 2023 | |
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520 | |a To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. | ||
650 | 4 | |a ZrO2 bearing ball | |
650 | 4 | |a Surface representation defect | |
650 | 4 | |a Defect stitching determination | |
650 | 4 | |a Complete defect stitching | |
650 | 4 | |a Self-defined background balance | |
650 | 4 | |a Representation defect enhancement | |
700 | 1 | |a Dong, Le |e verfasserin |4 aut | |
700 | 1 | |a Liao, XianQi |e verfasserin |4 aut | |
700 | 1 | |a Zheng, RuMeng |e verfasserin |4 aut | |
700 | 1 | |a Hu, WeiWen |e verfasserin |4 aut | |
700 | 1 | |a Zheng, Qi |e verfasserin |4 aut | |
700 | 1 | |a Wu, NanXing |e verfasserin |0 (orcid)0000-0001-8544-4417 |4 aut | |
773 | 0 | 8 | |i Enthalten in |t Optics & laser technology |d Amsterdam [u.a.] : Elsevier Science, 1971 |g 169 |h Online-Ressource |w (DE-627)319950689 |w (DE-600)2000654-8 |w (DE-576)255266731 |x 1879-2545 |7 nnns |
773 | 1 | 8 | |g volume:169 |
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allfields |
10.1016/j.optlastec.2023.110025 doi (DE-627)ELV065176502 (ELSEVIER)S0030-3992(23)00918-0 DE-627 ger DE-627 rda eng 530 620 VZ 50.37 bkl 53.75 bkl 33.18 bkl 33.38 bkl Chen, Tao verfasserin aut Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement Dong, Le verfasserin aut Liao, XianQi verfasserin aut Zheng, RuMeng verfasserin aut Hu, WeiWen verfasserin aut Zheng, Qi verfasserin aut Wu, NanXing verfasserin (orcid)0000-0001-8544-4417 aut Enthalten in Optics & laser technology Amsterdam [u.a.] : Elsevier Science, 1971 169 Online-Ressource (DE-627)319950689 (DE-600)2000654-8 (DE-576)255266731 1879-2545 nnns volume:169 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.37 Technische Optik VZ 53.75 Optische Nachrichtentechnik VZ 33.18 Optik VZ 33.38 Quantenoptik nichtlineare Optik VZ AR 169 |
spelling |
10.1016/j.optlastec.2023.110025 doi (DE-627)ELV065176502 (ELSEVIER)S0030-3992(23)00918-0 DE-627 ger DE-627 rda eng 530 620 VZ 50.37 bkl 53.75 bkl 33.18 bkl 33.38 bkl Chen, Tao verfasserin aut Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement Dong, Le verfasserin aut Liao, XianQi verfasserin aut Zheng, RuMeng verfasserin aut Hu, WeiWen verfasserin aut Zheng, Qi verfasserin aut Wu, NanXing verfasserin (orcid)0000-0001-8544-4417 aut Enthalten in Optics & laser technology Amsterdam [u.a.] : Elsevier Science, 1971 169 Online-Ressource (DE-627)319950689 (DE-600)2000654-8 (DE-576)255266731 1879-2545 nnns volume:169 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.37 Technische Optik VZ 53.75 Optische Nachrichtentechnik VZ 33.18 Optik VZ 33.38 Quantenoptik nichtlineare Optik VZ AR 169 |
allfields_unstemmed |
10.1016/j.optlastec.2023.110025 doi (DE-627)ELV065176502 (ELSEVIER)S0030-3992(23)00918-0 DE-627 ger DE-627 rda eng 530 620 VZ 50.37 bkl 53.75 bkl 33.18 bkl 33.38 bkl Chen, Tao verfasserin aut Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement Dong, Le verfasserin aut Liao, XianQi verfasserin aut Zheng, RuMeng verfasserin aut Hu, WeiWen verfasserin aut Zheng, Qi verfasserin aut Wu, NanXing verfasserin (orcid)0000-0001-8544-4417 aut Enthalten in Optics & laser technology Amsterdam [u.a.] : Elsevier Science, 1971 169 Online-Ressource (DE-627)319950689 (DE-600)2000654-8 (DE-576)255266731 1879-2545 nnns volume:169 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.37 Technische Optik VZ 53.75 Optische Nachrichtentechnik VZ 33.18 Optik VZ 33.38 Quantenoptik nichtlineare Optik VZ AR 169 |
allfieldsGer |
10.1016/j.optlastec.2023.110025 doi (DE-627)ELV065176502 (ELSEVIER)S0030-3992(23)00918-0 DE-627 ger DE-627 rda eng 530 620 VZ 50.37 bkl 53.75 bkl 33.18 bkl 33.38 bkl Chen, Tao verfasserin aut Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement Dong, Le verfasserin aut Liao, XianQi verfasserin aut Zheng, RuMeng verfasserin aut Hu, WeiWen verfasserin aut Zheng, Qi verfasserin aut Wu, NanXing verfasserin (orcid)0000-0001-8544-4417 aut Enthalten in Optics & laser technology Amsterdam [u.a.] : Elsevier Science, 1971 169 Online-Ressource (DE-627)319950689 (DE-600)2000654-8 (DE-576)255266731 1879-2545 nnns volume:169 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.37 Technische Optik VZ 53.75 Optische Nachrichtentechnik VZ 33.18 Optik VZ 33.38 Quantenoptik nichtlineare Optik VZ AR 169 |
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10.1016/j.optlastec.2023.110025 doi (DE-627)ELV065176502 (ELSEVIER)S0030-3992(23)00918-0 DE-627 ger DE-627 rda eng 530 620 VZ 50.37 bkl 53.75 bkl 33.18 bkl 33.38 bkl Chen, Tao verfasserin aut Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm 2023 nicht spezifiziert zzz rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement Dong, Le verfasserin aut Liao, XianQi verfasserin aut Zheng, RuMeng verfasserin aut Hu, WeiWen verfasserin aut Zheng, Qi verfasserin aut Wu, NanXing verfasserin (orcid)0000-0001-8544-4417 aut Enthalten in Optics & laser technology Amsterdam [u.a.] : Elsevier Science, 1971 169 Online-Ressource (DE-627)319950689 (DE-600)2000654-8 (DE-576)255266731 1879-2545 nnns volume:169 GBV_USEFLAG_U GBV_ELV SYSFLAG_U GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_150 GBV_ILN_151 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_370 GBV_ILN_602 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2007 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2034 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2106 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2470 GBV_ILN_2507 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.37 Technische Optik VZ 53.75 Optische Nachrichtentechnik VZ 33.18 Optik VZ 33.38 Quantenoptik nichtlineare Optik VZ AR 169 |
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ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement |
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Chen, Tao @@aut@@ Dong, Le @@aut@@ Liao, XianQi @@aut@@ Zheng, RuMeng @@aut@@ Hu, WeiWen @@aut@@ Zheng, Qi @@aut@@ Wu, NanXing @@aut@@ |
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Chen, Tao ddc 530 bkl 50.37 bkl 53.75 bkl 33.18 bkl 33.38 misc ZrO2 bearing ball misc Surface representation defect misc Defect stitching determination misc Complete defect stitching misc Self-defined background balance misc Representation defect enhancement Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm |
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530 620 VZ 50.37 bkl 53.75 bkl 33.18 bkl 33.38 bkl Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm ZrO2 bearing ball Surface representation defect Defect stitching determination Complete defect stitching Self-defined background balance Representation defect enhancement |
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ddc 530 bkl 50.37 bkl 53.75 bkl 33.18 bkl 33.38 misc ZrO2 bearing ball misc Surface representation defect misc Defect stitching determination misc Complete defect stitching misc Self-defined background balance misc Representation defect enhancement |
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Defect enhancement method for ZrO2-bearing spherical surface representation based on complete defect stitching and self-defined background balancing algorithm |
abstract |
To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. |
abstractGer |
To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. |
abstract_unstemmed |
To address the problems of difficulty in extracting complete defects and high interference of surface background in the process of ZrO2 bearing ball defect detection. A method of ZrO2 bearing ball surface representation defect enhancement based on complete defect stitching and self-defined background balance algorithm is proposed. To determine the location of complete defects, we propose a scanning and acquisition scheme for sub-aperture images and quickly stitch the edges of sub-aperture images. The image feature point gradient definition is optimized, and a less error Euclidean distance finding method is used for feature point matching. The stitched complete defect image is smooth and has high pixel accuracy. The background feature layer of the complete defect image is extracted for background gray leveling, and this process is introduced into the γ-value calculation process. The γ setting allows the image to be self-defined enhancement, outputting a fully defective image with a balanced background and outstanding defects. The average gradient is reduced by more than 90% after complete defect image enhancement, and the information entropy is preserved by about 40%. The defect edges of the image are intact, and the fine texture of the defect features is preserved. |
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|
score |
7.4012785 |