Application of low-energy ion scattering to studies of growth
The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic...
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| Autor*in: |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1994 |
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| Reproduktion: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 |
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| Übergeordnetes Werk: |
in: Applied Surface Science - Amsterdam : Elsevier, 75(1994), 1-4, Seite 133-138 |
| Übergeordnetes Werk: |
volume:75 ; year:1994 ; number:1-4 ; pages:133-138 |
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| 520 | |a The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. | ||
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(DE-627)NLEJ177643102 (DE-599)GBVNLZ177643102 DE-627 ger DE-627 rakwb eng Application of low-energy ion scattering to studies of growth 1994 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Brongersma, H.H. oth Jacobs, J.-P. oth in Applied Surface Science Amsterdam : Elsevier 75(1994), 1-4, Seite 133-138 (DE-627)NLEJ177332875 (DE-600)2002520-8 0169-4332 nnns volume:75 year:1994 number:1-4 pages:133-138 http://linkinghub.elsevier.com/retrieve/pii/0169-4332(94)90149-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 75 1994 1-4 133-138 |
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(DE-627)NLEJ177643102 (DE-599)GBVNLZ177643102 DE-627 ger DE-627 rakwb eng Application of low-energy ion scattering to studies of growth 1994 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Brongersma, H.H. oth Jacobs, J.-P. oth in Applied Surface Science Amsterdam : Elsevier 75(1994), 1-4, Seite 133-138 (DE-627)NLEJ177332875 (DE-600)2002520-8 0169-4332 nnns volume:75 year:1994 number:1-4 pages:133-138 http://linkinghub.elsevier.com/retrieve/pii/0169-4332(94)90149-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 75 1994 1-4 133-138 |
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(DE-627)NLEJ177643102 (DE-599)GBVNLZ177643102 DE-627 ger DE-627 rakwb eng Application of low-energy ion scattering to studies of growth 1994 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Brongersma, H.H. oth Jacobs, J.-P. oth in Applied Surface Science Amsterdam : Elsevier 75(1994), 1-4, Seite 133-138 (DE-627)NLEJ177332875 (DE-600)2002520-8 0169-4332 nnns volume:75 year:1994 number:1-4 pages:133-138 http://linkinghub.elsevier.com/retrieve/pii/0169-4332(94)90149-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 75 1994 1-4 133-138 |
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(DE-627)NLEJ177643102 (DE-599)GBVNLZ177643102 DE-627 ger DE-627 rakwb eng Application of low-energy ion scattering to studies of growth 1994 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Brongersma, H.H. oth Jacobs, J.-P. oth in Applied Surface Science Amsterdam : Elsevier 75(1994), 1-4, Seite 133-138 (DE-627)NLEJ177332875 (DE-600)2002520-8 0169-4332 nnns volume:75 year:1994 number:1-4 pages:133-138 http://linkinghub.elsevier.com/retrieve/pii/0169-4332(94)90149-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 75 1994 1-4 133-138 |
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(DE-627)NLEJ177643102 (DE-599)GBVNLZ177643102 DE-627 ger DE-627 rakwb eng Application of low-energy ion scattering to studies of growth 1994 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Brongersma, H.H. oth Jacobs, J.-P. oth in Applied Surface Science Amsterdam : Elsevier 75(1994), 1-4, Seite 133-138 (DE-627)NLEJ177332875 (DE-600)2002520-8 0169-4332 nnns volume:75 year:1994 number:1-4 pages:133-138 http://linkinghub.elsevier.com/retrieve/pii/0169-4332(94)90149-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 75 1994 1-4 133-138 |
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The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. |
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The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. |
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The possibilities of low-energy ion scattering spectroscopy for surface analysis are discussed. By choosing the proper experimental conditions the structure of single crystal surfaces can be determined very accurately. Furthermore, low-energy ion scattering (LEIS) can be used to determine the atomic composition of the outermost atomic layer of any (crystalline or not) surface. This extreme surface sensitivity makes LEIS an ideal tool to investigate growth mechanisms. The results for calcined powders of oxidic spinels suggest that only one or two principal planes occur at the surface. This greatly facilitates the interpretation and application of LEIS to growth on powders. Some applications to study the growth mechanism of supported catalysts are presented. |
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