RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s
Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for...
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| Autor*in: |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1989 |
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| Reproduktion: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 |
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| Übergeordnetes Werk: |
in: Journal of Crystal Growth - Amsterdam : Elsevier, 96(1989), 2, Seite 413-418 |
| Übergeordnetes Werk: |
volume:96 ; year:1989 ; number:2 ; pages:413-418 |
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| 520 | |a Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. | ||
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(DE-627)NLEJ177649798 (DE-599)GBVNLZ177649798 DE-627 ger DE-627 rakwb eng RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s 1989 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Tsukeva, E.A. oth Djuneva, K.D. oth Peneva, S.K. oth Sevov, S.H. oth in Journal of Crystal Growth Amsterdam : Elsevier 96(1989), 2, Seite 413-418 (DE-627)NLEJ177047224 (DE-600)1466514-1 0022-0248 nnns volume:96 year:1989 number:2 pages:413-418 http://linkinghub.elsevier.com/retrieve/pii/0022-0248(89)90540-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 96 1989 2 413-418 |
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(DE-627)NLEJ177649798 (DE-599)GBVNLZ177649798 DE-627 ger DE-627 rakwb eng RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s 1989 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Tsukeva, E.A. oth Djuneva, K.D. oth Peneva, S.K. oth Sevov, S.H. oth in Journal of Crystal Growth Amsterdam : Elsevier 96(1989), 2, Seite 413-418 (DE-627)NLEJ177047224 (DE-600)1466514-1 0022-0248 nnns volume:96 year:1989 number:2 pages:413-418 http://linkinghub.elsevier.com/retrieve/pii/0022-0248(89)90540-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 96 1989 2 413-418 |
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(DE-627)NLEJ177649798 (DE-599)GBVNLZ177649798 DE-627 ger DE-627 rakwb eng RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s 1989 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Tsukeva, E.A. oth Djuneva, K.D. oth Peneva, S.K. oth Sevov, S.H. oth in Journal of Crystal Growth Amsterdam : Elsevier 96(1989), 2, Seite 413-418 (DE-627)NLEJ177047224 (DE-600)1466514-1 0022-0248 nnns volume:96 year:1989 number:2 pages:413-418 http://linkinghub.elsevier.com/retrieve/pii/0022-0248(89)90540-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 96 1989 2 413-418 |
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(DE-627)NLEJ177649798 (DE-599)GBVNLZ177649798 DE-627 ger DE-627 rakwb eng RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s 1989 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Tsukeva, E.A. oth Djuneva, K.D. oth Peneva, S.K. oth Sevov, S.H. oth in Journal of Crystal Growth Amsterdam : Elsevier 96(1989), 2, Seite 413-418 (DE-627)NLEJ177047224 (DE-600)1466514-1 0022-0248 nnns volume:96 year:1989 number:2 pages:413-418 http://linkinghub.elsevier.com/retrieve/pii/0022-0248(89)90540-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 96 1989 2 413-418 |
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(DE-627)NLEJ177649798 (DE-599)GBVNLZ177649798 DE-627 ger DE-627 rakwb eng RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s 1989 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Tsukeva, E.A. oth Djuneva, K.D. oth Peneva, S.K. oth Sevov, S.H. oth in Journal of Crystal Growth Amsterdam : Elsevier 96(1989), 2, Seite 413-418 (DE-627)NLEJ177047224 (DE-600)1466514-1 0022-0248 nnns volume:96 year:1989 number:2 pages:413-418 http://linkinghub.elsevier.com/retrieve/pii/0022-0248(89)90540-X GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 96 1989 2 413-418 |
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RHEED study of thin tin films grown at deposition rates of 2 to 10 Å/s |
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Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. |
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Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. |
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Reflection high energy electron diffraction (RHEED) investigations of vapour grown at ~6x10^-^4 Pa thin tin films are reported. The results show difference in the structure of the tin in films grown at one and the same deposition rate, but from different evaporation experiments. Possible reasons for these observations are discussed. |
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