The effect of ion beams on the composition of Cu"2O(111) surfaces
Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of th...
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| Autor*in: |
|---|
| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
1983 |
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| Reproduktion: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 |
|---|---|
| Übergeordnetes Werk: |
in: Applications of Surface Science - Amsterdam : Elsevier, 14(1983), 3-4, Seite 233-248 |
| Übergeordnetes Werk: |
volume:14 ; year:1983 ; number:3-4 ; pages:233-248 |
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| 520 | |a Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. | ||
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(DE-627)NLEJ177739371 (DE-599)GBVNLZ177739371 DE-627 ger DE-627 rakwb eng The effect of ion beams on the composition of Cu"2O(111) surfaces 1983 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Herion, J. oth Scharl, G. oth Tapiero, M. oth in Applications of Surface Science Amsterdam : Elsevier 14(1983), 3-4, Seite 233-248 (DE-627)NLEJ177315199 (DE-600)2190934-9 0378-5963 nnns volume:14 year:1983 number:3-4 pages:233-248 http://linkinghub.elsevier.com/retrieve/pii/0378-5963(83)90039-9 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 14 1983 3-4 233-248 |
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(DE-627)NLEJ177739371 (DE-599)GBVNLZ177739371 DE-627 ger DE-627 rakwb eng The effect of ion beams on the composition of Cu"2O(111) surfaces 1983 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Herion, J. oth Scharl, G. oth Tapiero, M. oth in Applications of Surface Science Amsterdam : Elsevier 14(1983), 3-4, Seite 233-248 (DE-627)NLEJ177315199 (DE-600)2190934-9 0378-5963 nnns volume:14 year:1983 number:3-4 pages:233-248 http://linkinghub.elsevier.com/retrieve/pii/0378-5963(83)90039-9 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 14 1983 3-4 233-248 |
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(DE-627)NLEJ177739371 (DE-599)GBVNLZ177739371 DE-627 ger DE-627 rakwb eng The effect of ion beams on the composition of Cu"2O(111) surfaces 1983 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Herion, J. oth Scharl, G. oth Tapiero, M. oth in Applications of Surface Science Amsterdam : Elsevier 14(1983), 3-4, Seite 233-248 (DE-627)NLEJ177315199 (DE-600)2190934-9 0378-5963 nnns volume:14 year:1983 number:3-4 pages:233-248 http://linkinghub.elsevier.com/retrieve/pii/0378-5963(83)90039-9 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 14 1983 3-4 233-248 |
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(DE-627)NLEJ177739371 (DE-599)GBVNLZ177739371 DE-627 ger DE-627 rakwb eng The effect of ion beams on the composition of Cu"2O(111) surfaces 1983 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Herion, J. oth Scharl, G. oth Tapiero, M. oth in Applications of Surface Science Amsterdam : Elsevier 14(1983), 3-4, Seite 233-248 (DE-627)NLEJ177315199 (DE-600)2190934-9 0378-5963 nnns volume:14 year:1983 number:3-4 pages:233-248 http://linkinghub.elsevier.com/retrieve/pii/0378-5963(83)90039-9 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 14 1983 3-4 233-248 |
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(DE-627)NLEJ177739371 (DE-599)GBVNLZ177739371 DE-627 ger DE-627 rakwb eng The effect of ion beams on the composition of Cu"2O(111) surfaces 1983 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Herion, J. oth Scharl, G. oth Tapiero, M. oth in Applications of Surface Science Amsterdam : Elsevier 14(1983), 3-4, Seite 233-248 (DE-627)NLEJ177315199 (DE-600)2190934-9 0378-5963 nnns volume:14 year:1983 number:3-4 pages:233-248 http://linkinghub.elsevier.com/retrieve/pii/0378-5963(83)90039-9 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 14 1983 3-4 233-248 |
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effect of ion beams on the composition of cu"2o(111) surfaces |
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The effect of ion beams on the composition of Cu"2O(111) surfaces |
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Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. |
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Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. |
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Cu"2O(111) surfaces were studied under conditions typically used in Auger depth profiling, i.e. under electron and ion bombardment. Compositional changes were measured with AES as function of energy and mass of the ions. By increasing the ion energy from 0.5 to 4 keV and the atomic weight of the bombarding gas from 20 to 131, an increase of the oxygen-to-copper ratio by about 1% and 2.5%, respectively, was obtained. The Auger line shapes were not markedly influenced by a change of the ion energy. The oxygen-to-copper ratio increased by several percent during ion bombardment of a sample which was prepared by cleaving in situ. Heating to at least 150^oC leads to a decrease of the oxygen enrichment as well as of the concentration of implanted Ar. No electron beam effects could be detected in these experiments. |
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