X-ray diffraction study of crystals under a static electric field
This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric fiel...
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1993 |
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| Reproduktion: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 |
|---|---|
| Übergeordnetes Werk: |
in: Progress in Crystal Growth and Characterization of Materials - Amsterdam : Elsevier, 27(1993), 3-4, Seite 233-278 |
| Übergeordnetes Werk: |
volume:27 ; year:1993 ; number:3-4 ; pages:233-278 |
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NLEJ178275166 |
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| 520 | |a This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. | ||
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(DE-627)NLEJ178275166 (DE-599)GBVNLZ178275166 DE-627 ger DE-627 rakwb eng X-ray diffraction study of crystals under a static electric field 1993 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Sebastian, M.T. oth in Progress in Crystal Growth and Characterization of Materials Amsterdam : Elsevier 27(1993), 3-4, Seite 233-278 (DE-627)NLEJ177314850 (DE-600)1479022-1 0960-8974 nnns volume:27 year:1993 number:3-4 pages:233-278 http://linkinghub.elsevier.com/retrieve/pii/0960-8974(93)90025-Y GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 27 1993 3-4 233-278 |
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(DE-627)NLEJ178275166 (DE-599)GBVNLZ178275166 DE-627 ger DE-627 rakwb eng X-ray diffraction study of crystals under a static electric field 1993 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Sebastian, M.T. oth in Progress in Crystal Growth and Characterization of Materials Amsterdam : Elsevier 27(1993), 3-4, Seite 233-278 (DE-627)NLEJ177314850 (DE-600)1479022-1 0960-8974 nnns volume:27 year:1993 number:3-4 pages:233-278 http://linkinghub.elsevier.com/retrieve/pii/0960-8974(93)90025-Y GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 27 1993 3-4 233-278 |
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(DE-627)NLEJ178275166 (DE-599)GBVNLZ178275166 DE-627 ger DE-627 rakwb eng X-ray diffraction study of crystals under a static electric field 1993 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Sebastian, M.T. oth in Progress in Crystal Growth and Characterization of Materials Amsterdam : Elsevier 27(1993), 3-4, Seite 233-278 (DE-627)NLEJ177314850 (DE-600)1479022-1 0960-8974 nnns volume:27 year:1993 number:3-4 pages:233-278 http://linkinghub.elsevier.com/retrieve/pii/0960-8974(93)90025-Y GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 27 1993 3-4 233-278 |
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(DE-627)NLEJ178275166 (DE-599)GBVNLZ178275166 DE-627 ger DE-627 rakwb eng X-ray diffraction study of crystals under a static electric field 1993 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Sebastian, M.T. oth in Progress in Crystal Growth and Characterization of Materials Amsterdam : Elsevier 27(1993), 3-4, Seite 233-278 (DE-627)NLEJ177314850 (DE-600)1479022-1 0960-8974 nnns volume:27 year:1993 number:3-4 pages:233-278 http://linkinghub.elsevier.com/retrieve/pii/0960-8974(93)90025-Y GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 27 1993 3-4 233-278 |
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(DE-627)NLEJ178275166 (DE-599)GBVNLZ178275166 DE-627 ger DE-627 rakwb eng X-ray diffraction study of crystals under a static electric field 1993 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Sebastian, M.T. oth in Progress in Crystal Growth and Characterization of Materials Amsterdam : Elsevier 27(1993), 3-4, Seite 233-278 (DE-627)NLEJ177314850 (DE-600)1479022-1 0960-8974 nnns volume:27 year:1993 number:3-4 pages:233-278 http://linkinghub.elsevier.com/retrieve/pii/0960-8974(93)90025-Y GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 27 1993 3-4 233-278 |
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X-ray diffraction study of crystals under a static electric field |
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This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. |
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This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. |
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This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of α-LiIO"3, KTiOPO"4, LiN"2H"5SO"4, KNbO"3, LiNH"4SO"4, quartz, silicon etc. and the mechanism for it is discussed. |
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