TEM evaluation of imaginary potentials by using thickness fringes technique at w <> 0
Gespeichert in:
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1983 |
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| Reproduktion: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 |
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| Übergeordnetes Werk: |
in: Ultramicroscopy - Amsterdam : Elsevier, 12(1983), 1-2, Seite 107 |
| Übergeordnetes Werk: |
volume:12 ; year:1983 ; number:1-2 ; pages:107 |
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