Patch averaging of electron images of GP32^*I crystals with variable thickness
The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal....
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1992 |
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| Reproduktion: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 |
|---|---|
| Übergeordnetes Werk: |
in: Journal of Structural Biology - Amsterdam : Elsevier, 108(1992), 3, Seite 245-256 |
| Übergeordnetes Werk: |
volume:108 ; year:1992 ; number:3 ; pages:245-256 |
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| 245 | 1 | 0 | |a Patch averaging of electron images of GP32^*I crystals with variable thickness |
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| 520 | |a The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. | ||
| 533 | |f Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 | ||
| 700 | 1 | |a Morgan, D.G. |4 oth | |
| 700 | 1 | |a Grant, R.A. |4 oth | |
| 700 | 1 | |a Chiu, W. |4 oth | |
| 700 | 1 | |a Frank, J. |4 oth | |
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(DE-627)NLEJ183746562 (DE-599)GBVNLZ183746562 DE-627 ger DE-627 rakwb eng Patch averaging of electron images of GP32^*I crystals with variable thickness 1992 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Morgan, D.G. oth Grant, R.A. oth Chiu, W. oth Frank, J. oth in Journal of Structural Biology Amsterdam : Elsevier 108(1992), 3, Seite 245-256 (DE-627)NLEJ183744446 (DE-600)1469822-5 1047-8477 nnns volume:108 year:1992 number:3 pages:245-256 http://dx.doi.org/10.1016/1047-8477(92)90025-6 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 108 1992 3 245-256 |
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(DE-627)NLEJ183746562 (DE-599)GBVNLZ183746562 DE-627 ger DE-627 rakwb eng Patch averaging of electron images of GP32^*I crystals with variable thickness 1992 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Morgan, D.G. oth Grant, R.A. oth Chiu, W. oth Frank, J. oth in Journal of Structural Biology Amsterdam : Elsevier 108(1992), 3, Seite 245-256 (DE-627)NLEJ183744446 (DE-600)1469822-5 1047-8477 nnns volume:108 year:1992 number:3 pages:245-256 http://dx.doi.org/10.1016/1047-8477(92)90025-6 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 108 1992 3 245-256 |
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(DE-627)NLEJ183746562 (DE-599)GBVNLZ183746562 DE-627 ger DE-627 rakwb eng Patch averaging of electron images of GP32^*I crystals with variable thickness 1992 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Morgan, D.G. oth Grant, R.A. oth Chiu, W. oth Frank, J. oth in Journal of Structural Biology Amsterdam : Elsevier 108(1992), 3, Seite 245-256 (DE-627)NLEJ183744446 (DE-600)1469822-5 1047-8477 nnns volume:108 year:1992 number:3 pages:245-256 http://dx.doi.org/10.1016/1047-8477(92)90025-6 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 108 1992 3 245-256 |
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(DE-627)NLEJ183746562 (DE-599)GBVNLZ183746562 DE-627 ger DE-627 rakwb eng Patch averaging of electron images of GP32^*I crystals with variable thickness 1992 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Morgan, D.G. oth Grant, R.A. oth Chiu, W. oth Frank, J. oth in Journal of Structural Biology Amsterdam : Elsevier 108(1992), 3, Seite 245-256 (DE-627)NLEJ183744446 (DE-600)1469822-5 1047-8477 nnns volume:108 year:1992 number:3 pages:245-256 http://dx.doi.org/10.1016/1047-8477(92)90025-6 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 108 1992 3 245-256 |
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(DE-627)NLEJ183746562 (DE-599)GBVNLZ183746562 DE-627 ger DE-627 rakwb eng Patch averaging of electron images of GP32^*I crystals with variable thickness 1992 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. Elsevier Journal Backfiles on ScienceDirect 1907 - 2002 Morgan, D.G. oth Grant, R.A. oth Chiu, W. oth Frank, J. oth in Journal of Structural Biology Amsterdam : Elsevier 108(1992), 3, Seite 245-256 (DE-627)NLEJ183744446 (DE-600)1469822-5 1047-8477 nnns volume:108 year:1992 number:3 pages:245-256 http://dx.doi.org/10.1016/1047-8477(92)90025-6 GBV_USEFLAG_H ZDB-1-SDJ GBV_NL_ARTICLE AR 108 1992 3 245-256 |
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patch averaging of electron images of gp32^*i crystals with variable thickness |
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Patch averaging of electron images of GP32^*I crystals with variable thickness |
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The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. |
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The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. |
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The combination of Fourier and correlation averaging techniques with multivariate statistical analysis and classification, a method known as patch averaging, is used to analyze untilted and tilted images of negatively stained GP32^*1 crystals, which exhibit variable thicknesses in a single crystal. Within a single image, coherent areas of the same apparent thickness can be distinguished from areas of differing thicknesses. Analysis using the phase relationships among symmetry-related reflections from reconstituted images obtained from untilted micrographs confirms the ability of the method to classify these variable thicknesses properly. Furthermore, the phases from some of the reconstituted images obtained from both untilted and tilted micrographs were found to match well with the phases in a previously determined three-dimensional data set of this crystal with pg symmetry along the crystallographic b axis. These results indicate the utility of the patch averaging procedures in the structural determination of protein crystals with different thicknesses. |
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