Oxide-oxide interactions studied by transmission electron microscopy
Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this me...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1967 |
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| Umfang: |
5 |
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| Reproduktion: |
Springer Online Journal Archives 1860-2002 |
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| Übergeordnetes Werk: |
in: Journal of materials science - 1966, 2(1967) vom: Jan., Seite 28-32 |
| Übergeordnetes Werk: |
volume:2 ; year:1967 ; month:01 ; pages:28-32 ; extent:5 |
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| 520 | |a Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. | ||
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(DE-627)NLEJ194576256 DE-627 ger DE-627 rakwb eng Oxide-oxide interactions studied by transmission electron microscopy 1967 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. Springer Online Journal Archives 1860-2002 Pilliar, R. M. oth Carruthers, T. G. oth Nutting, J. oth in Journal of materials science 1966 2(1967) vom: Jan., Seite 28-32 (DE-627)NLEJ188987134 (DE-600)2015305-3 1573-4803 nnns volume:2 year:1967 month:01 pages:28-32 extent:5 http://dx.doi.org/10.1007/BF00550049 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 2 1967 1 28-32 5 |
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(DE-627)NLEJ194576256 DE-627 ger DE-627 rakwb eng Oxide-oxide interactions studied by transmission electron microscopy 1967 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. Springer Online Journal Archives 1860-2002 Pilliar, R. M. oth Carruthers, T. G. oth Nutting, J. oth in Journal of materials science 1966 2(1967) vom: Jan., Seite 28-32 (DE-627)NLEJ188987134 (DE-600)2015305-3 1573-4803 nnns volume:2 year:1967 month:01 pages:28-32 extent:5 http://dx.doi.org/10.1007/BF00550049 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 2 1967 1 28-32 5 |
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(DE-627)NLEJ194576256 DE-627 ger DE-627 rakwb eng Oxide-oxide interactions studied by transmission electron microscopy 1967 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. Springer Online Journal Archives 1860-2002 Pilliar, R. M. oth Carruthers, T. G. oth Nutting, J. oth in Journal of materials science 1966 2(1967) vom: Jan., Seite 28-32 (DE-627)NLEJ188987134 (DE-600)2015305-3 1573-4803 nnns volume:2 year:1967 month:01 pages:28-32 extent:5 http://dx.doi.org/10.1007/BF00550049 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 2 1967 1 28-32 5 |
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(DE-627)NLEJ194576256 DE-627 ger DE-627 rakwb eng Oxide-oxide interactions studied by transmission electron microscopy 1967 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. Springer Online Journal Archives 1860-2002 Pilliar, R. M. oth Carruthers, T. G. oth Nutting, J. oth in Journal of materials science 1966 2(1967) vom: Jan., Seite 28-32 (DE-627)NLEJ188987134 (DE-600)2015305-3 1573-4803 nnns volume:2 year:1967 month:01 pages:28-32 extent:5 http://dx.doi.org/10.1007/BF00550049 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 2 1967 1 28-32 5 |
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(DE-627)NLEJ194576256 DE-627 ger DE-627 rakwb eng Oxide-oxide interactions studied by transmission electron microscopy 1967 5 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. Springer Online Journal Archives 1860-2002 Pilliar, R. M. oth Carruthers, T. G. oth Nutting, J. oth in Journal of materials science 1966 2(1967) vom: Jan., Seite 28-32 (DE-627)NLEJ188987134 (DE-600)2015305-3 1573-4803 nnns volume:2 year:1967 month:01 pages:28-32 extent:5 http://dx.doi.org/10.1007/BF00550049 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 2 1967 1 28-32 5 |
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oxide-oxide interactions studied by transmission electron microscopy |
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Oxide-oxide interactions studied by transmission electron microscopy |
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Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. |
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Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. |
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Abstract The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers. An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion. |
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