Surface analysis of corrosion inhibitor films by XPS and ToFSIMS
Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selectio...
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1995 |
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| Umfang: |
10 |
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| Reproduktion: |
Springer Online Journal Archives 1860-2002 |
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| Übergeordnetes Werk: |
in: Microchimica acta - 1937, 120(1995) vom: Jan./Apr., Seite 149-158 |
| Übergeordnetes Werk: |
volume:120 ; year:1995 ; month:01/04 ; pages:149-158 ; extent:10 |
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| 520 | |a Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. | ||
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(DE-627)NLEJ20776834X DE-627 ger DE-627 rakwb eng Surface analysis of corrosion inhibitor films by XPS and ToFSIMS 1995 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. Springer Online Journal Archives 1860-2002 Swift, Andrew J. oth in Microchimica acta 1937 120(1995) vom: Jan./Apr., Seite 149-158 (DE-627)NLEJ188993894 (DE-600)1462152-6 1436-5073 nnns volume:120 year:1995 month:01/04 pages:149-158 extent:10 http://dx.doi.org/10.1007/BF01244428 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 120 1995 1/4 149-158 10 |
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(DE-627)NLEJ20776834X DE-627 ger DE-627 rakwb eng Surface analysis of corrosion inhibitor films by XPS and ToFSIMS 1995 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. Springer Online Journal Archives 1860-2002 Swift, Andrew J. oth in Microchimica acta 1937 120(1995) vom: Jan./Apr., Seite 149-158 (DE-627)NLEJ188993894 (DE-600)1462152-6 1436-5073 nnns volume:120 year:1995 month:01/04 pages:149-158 extent:10 http://dx.doi.org/10.1007/BF01244428 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 120 1995 1/4 149-158 10 |
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(DE-627)NLEJ20776834X DE-627 ger DE-627 rakwb eng Surface analysis of corrosion inhibitor films by XPS and ToFSIMS 1995 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. Springer Online Journal Archives 1860-2002 Swift, Andrew J. oth in Microchimica acta 1937 120(1995) vom: Jan./Apr., Seite 149-158 (DE-627)NLEJ188993894 (DE-600)1462152-6 1436-5073 nnns volume:120 year:1995 month:01/04 pages:149-158 extent:10 http://dx.doi.org/10.1007/BF01244428 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 120 1995 1/4 149-158 10 |
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(DE-627)NLEJ20776834X DE-627 ger DE-627 rakwb eng Surface analysis of corrosion inhibitor films by XPS and ToFSIMS 1995 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. Springer Online Journal Archives 1860-2002 Swift, Andrew J. oth in Microchimica acta 1937 120(1995) vom: Jan./Apr., Seite 149-158 (DE-627)NLEJ188993894 (DE-600)1462152-6 1436-5073 nnns volume:120 year:1995 month:01/04 pages:149-158 extent:10 http://dx.doi.org/10.1007/BF01244428 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 120 1995 1/4 149-158 10 |
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(DE-627)NLEJ20776834X DE-627 ger DE-627 rakwb eng Surface analysis of corrosion inhibitor films by XPS and ToFSIMS 1995 10 nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. Springer Online Journal Archives 1860-2002 Swift, Andrew J. oth in Microchimica acta 1937 120(1995) vom: Jan./Apr., Seite 149-158 (DE-627)NLEJ188993894 (DE-600)1462152-6 1436-5073 nnns volume:120 year:1995 month:01/04 pages:149-158 extent:10 http://dx.doi.org/10.1007/BF01244428 GBV_USEFLAG_U ZDB-1-SOJ GBV_NL_ARTICLE AR 120 1995 1/4 149-158 10 |
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Surface analysis of corrosion inhibitor films by XPS and ToFSIMS |
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Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. |
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Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. |
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Abstract In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated. |
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