The Investigation of 4H-SiC/SiO<sub>2</sub> Interfaces by Optical and Electrical Measurements
Gespeichert in:
| Autor*in: |
Ishida, Yuuki [verfasserIn] |
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Englisch |
| Erschienen: |
s.l. Stafa-Zurich, Switzerland: 2002 |
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https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.389-393.1013 |
|---|---|
| Umfang: |
Online-Ressource (4 pages) |
| Reproduktion: |
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 |
|---|---|
| Übergeordnetes Werk: |
In: Materials science forum - Uetikon : Trans Tech Publ., 1984, Vol. 389-393 (Apr. 2002), p. 1013-1016 |
| Übergeordnetes Werk: |
volume:389-393 ; year:2002 ; pages:1013-1016 |
| Links: |
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| DOI / URN: |
10.4028/www.scientific.net/MSF.389-393.1013 |
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10.4028/www.scientific.net/MSF.389-393.1013 doi (DE-627)NLEJ237921642 DE-627 ger DE-627 rakwb eng Ishida, Yuuki verfasserin aut The Investigation of 4H-SiC/SiO<sub>2</sub> Interfaces by Optical and Electrical Measurements s.l. Stafa-Zurich, Switzerland 2002 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.389-393.1013 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Takahashi, Tetsuo oth Okumura, Hajime oth Jikimoto, Tamotsu oth Tsuchida, Hidekazu oth Yoshikawa, Masahito oth Tomioka, Yuichi oth Midorikawa, M. oth Hijikata, Yasuto oth Yoshida, Sadafumi oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 389-393 (Apr. 2002), p. 1013-1016 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:389-393 year:2002 pages:1013-1016 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.389-393.1013 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.389-393.1013 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 389-393 2002 1013-1016 Vol. 389-393 (Apr. 2002), p. 1013-1016 |
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