Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face

Gespeichert in:

Autor*in:	Senzaki, Junji [verfasserIn] Kojima, Kazutoshi Suzuki, Takaya Fukuda, Kenji

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	s.l. Stafa-Zurich, Switzerland: 2003

Anmerkung:	https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.433-436.613
Umfang:	Online-Ressource (4 pages)

Reproduktion:	Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Übergeordnetes Werk:	In: Materials science forum - Uetikon : Trans Tech Publ., 1984, Vol. 433-436 (Sept. 2003), p. 613-616
Übergeordnetes Werk:	volume:433-436 ; year:2003 ; pages:613-616

Links:	Volltext Volltext

DOI / URN:	10.4028/www.scientific.net/MSF.433-436.613

Katalog-ID:	NLEJ23794667X

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allfields	10.4028/www.scientific.net/MSF.433-436.613 doi (DE-627)NLEJ23794667X DE-627 ger DE-627 rakwb eng Senzaki, Junji verfasserin aut Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face s.l. Stafa-Zurich, Switzerland 2003 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.433-436.613 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Kojima, Kazutoshi oth Suzuki, Takaya oth Fukuda, Kenji oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 433-436 (Sept. 2003), p. 613-616 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:433-436 year:2003 pages:613-616 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 433-436 2003 613-616 Vol. 433-436 (Sept. 2003), p. 613-616
spelling	10.4028/www.scientific.net/MSF.433-436.613 doi (DE-627)NLEJ23794667X DE-627 ger DE-627 rakwb eng Senzaki, Junji verfasserin aut Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face s.l. Stafa-Zurich, Switzerland 2003 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.433-436.613 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Kojima, Kazutoshi oth Suzuki, Takaya oth Fukuda, Kenji oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 433-436 (Sept. 2003), p. 613-616 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:433-436 year:2003 pages:613-616 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 433-436 2003 613-616 Vol. 433-436 (Sept. 2003), p. 613-616
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allfieldsGer	10.4028/www.scientific.net/MSF.433-436.613 doi (DE-627)NLEJ23794667X DE-627 ger DE-627 rakwb eng Senzaki, Junji verfasserin aut Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face s.l. Stafa-Zurich, Switzerland 2003 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.433-436.613 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Kojima, Kazutoshi oth Suzuki, Takaya oth Fukuda, Kenji oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 433-436 (Sept. 2003), p. 613-616 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:433-436 year:2003 pages:613-616 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 433-436 2003 613-616 Vol. 433-436 (Sept. 2003), p. 613-616
allfieldsSound	10.4028/www.scientific.net/MSF.433-436.613 doi (DE-627)NLEJ23794667X DE-627 ger DE-627 rakwb eng Senzaki, Junji verfasserin aut Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face s.l. Stafa-Zurich, Switzerland 2003 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.433-436.613 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Kojima, Kazutoshi oth Suzuki, Takaya oth Fukuda, Kenji oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 433-436 (Sept. 2003), p. 613-616 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:433-436 year:2003 pages:613-616 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.433-436.613 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 433-436 2003 613-616 Vol. 433-436 (Sept. 2003), p. 613-616
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title_sort	effective normal field dependence of inversion channel mobility in 4h-sic mosfets on the (11-20) face
title_auth	Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face
abstract	https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.433-436.613
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title_short	Effective Normal Field Dependence of Inversion Channel Mobility in 4H-SiC MOSFETs on the (11-20) Face
url	https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.433-436.613 https://doi.org//10.4028/www.scientific.net/MSF.433-436.613
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