X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC
Gespeichert in:
| Autor*in: |
Poust, B. [verfasserIn] |
|---|
| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
s.l. Stafa-Zurich, Switzerland: 2004 |
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| Anmerkung: |
https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 |
|---|---|
| Umfang: |
Online-Ressource (4 pages) |
| Reproduktion: |
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 |
|---|---|
| Übergeordnetes Werk: |
In: Materials science forum - Uetikon : Trans Tech Publ., 1984, Vol. 457-460 (June 2004), p. 1601-1604 |
| Übergeordnetes Werk: |
volume:457-460 ; year:2004 ; pages:1601-1604 |
| Links: |
|---|
| DOI / URN: |
10.4028/www.scientific.net/MSF.457-460.1601 |
|---|
| Katalog-ID: |
NLEJ237963957 |
|---|
| LEADER | 01000caa a22002652 4500 | ||
|---|---|---|---|
| 001 | NLEJ237963957 | ||
| 003 | DE-627 | ||
| 005 | 20210707045102.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 120216s2004 xx |||||o 00| ||eng c | ||
| 024 | 7 | |a 10.4028/www.scientific.net/MSF.457-460.1601 |2 doi | |
| 035 | |a (DE-627)NLEJ237963957 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 100 | 1 | |a Poust, B. |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| 264 | 1 | |a s.l. |a Stafa-Zurich, Switzerland |c 2004 | |
| 300 | |a Online-Ressource (4 pages) | ||
| 336 | |a nicht spezifiziert |b zzz |2 rdacontent | ||
| 337 | |a nicht spezifiziert |b z |2 rdamedia | ||
| 338 | |a nicht spezifiziert |b zu |2 rdacarrier | ||
| 500 | |a https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 | ||
| 533 | |f Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 | ||
| 700 | 1 | |a Feichtinger, P. |4 oth | |
| 700 | 1 | |a Sandhu, R. |4 oth | |
| 700 | 1 | |a Smorchkova, I.P. |4 oth | |
| 700 | 1 | |a Heying, B. |4 oth | |
| 700 | 1 | |a Block, T. |4 oth | |
| 700 | 1 | |a Wojtowicz, M. |4 oth | |
| 700 | 1 | |a Goorsky, M.S. |4 oth | |
| 773 | 0 | 8 | |i In |t Materials science forum |d Uetikon : Trans Tech Publ., 1984 |g Vol. 457-460 (June 2004), p. 1601-1604 |h Online-Ressource |w (DE-627)NLEJ237794969 |w (DE-600)2047372-2 |x 1662-9752 |7 nnns |
| 773 | 1 | 8 | |g volume:457-460 |g year:2004 |g pages:1601-1604 |
| 856 | 4 | 0 | |u https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 |q text/html |z Deutschlandweit zugänglich |3 Volltext |
| 856 | 4 | 0 | |u https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 |q text/html |z Deutschlandweit zugänglich |3 Volltext |
| 912 | |a GBV_USEFLAG_U | ||
| 912 | |a ZDB-1-SNT | ||
| 912 | |a GBV_NL_ARTICLE | ||
| 951 | |a AR | ||
| 952 | |d 457-460 |j 2004 |h 1601-1604 |y Vol. 457-460 (June 2004), p. 1601-1604 | ||
| author_variant |
b p bp |
|---|---|
| matchkey_str |
article:16629752:2004----::ryifatoiaigfabsdeeo |
| hierarchy_sort_str |
2004 |
| publishDate |
2004 |
| allfields |
10.4028/www.scientific.net/MSF.457-460.1601 doi (DE-627)NLEJ237963957 DE-627 ger DE-627 rakwb eng Poust, B. verfasserin aut X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC s.l. Stafa-Zurich, Switzerland 2004 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Feichtinger, P. oth Sandhu, R. oth Smorchkova, I.P. oth Heying, B. oth Block, T. oth Wojtowicz, M. oth Goorsky, M.S. oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 457-460 (June 2004), p. 1601-1604 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:457-460 year:2004 pages:1601-1604 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 457-460 2004 1601-1604 Vol. 457-460 (June 2004), p. 1601-1604 |
| spelling |
10.4028/www.scientific.net/MSF.457-460.1601 doi (DE-627)NLEJ237963957 DE-627 ger DE-627 rakwb eng Poust, B. verfasserin aut X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC s.l. Stafa-Zurich, Switzerland 2004 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Feichtinger, P. oth Sandhu, R. oth Smorchkova, I.P. oth Heying, B. oth Block, T. oth Wojtowicz, M. oth Goorsky, M.S. oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 457-460 (June 2004), p. 1601-1604 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:457-460 year:2004 pages:1601-1604 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 457-460 2004 1601-1604 Vol. 457-460 (June 2004), p. 1601-1604 |
| allfields_unstemmed |
10.4028/www.scientific.net/MSF.457-460.1601 doi (DE-627)NLEJ237963957 DE-627 ger DE-627 rakwb eng Poust, B. verfasserin aut X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC s.l. Stafa-Zurich, Switzerland 2004 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Feichtinger, P. oth Sandhu, R. oth Smorchkova, I.P. oth Heying, B. oth Block, T. oth Wojtowicz, M. oth Goorsky, M.S. oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 457-460 (June 2004), p. 1601-1604 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:457-460 year:2004 pages:1601-1604 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 457-460 2004 1601-1604 Vol. 457-460 (June 2004), p. 1601-1604 |
| allfieldsGer |
10.4028/www.scientific.net/MSF.457-460.1601 doi (DE-627)NLEJ237963957 DE-627 ger DE-627 rakwb eng Poust, B. verfasserin aut X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC s.l. Stafa-Zurich, Switzerland 2004 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Feichtinger, P. oth Sandhu, R. oth Smorchkova, I.P. oth Heying, B. oth Block, T. oth Wojtowicz, M. oth Goorsky, M.S. oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 457-460 (June 2004), p. 1601-1604 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:457-460 year:2004 pages:1601-1604 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 457-460 2004 1601-1604 Vol. 457-460 (June 2004), p. 1601-1604 |
| allfieldsSound |
10.4028/www.scientific.net/MSF.457-460.1601 doi (DE-627)NLEJ237963957 DE-627 ger DE-627 rakwb eng Poust, B. verfasserin aut X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC s.l. Stafa-Zurich, Switzerland 2004 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Feichtinger, P. oth Sandhu, R. oth Smorchkova, I.P. oth Heying, B. oth Block, T. oth Wojtowicz, M. oth Goorsky, M.S. oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 457-460 (June 2004), p. 1601-1604 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:457-460 year:2004 pages:1601-1604 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 457-460 2004 1601-1604 Vol. 457-460 (June 2004), p. 1601-1604 |
| language |
English |
| source |
In Materials science forum Vol. 457-460 (June 2004), p. 1601-1604 volume:457-460 year:2004 pages:1601-1604 |
| sourceStr |
In Materials science forum Vol. 457-460 (June 2004), p. 1601-1604 volume:457-460 year:2004 pages:1601-1604 |
| format_phy_str_mv |
Article |
| institution |
findex.gbv.de |
| isfreeaccess_bool |
false |
| container_title |
Materials science forum |
| authorswithroles_txt_mv |
Poust, B. @@aut@@ Feichtinger, P. @@oth@@ Sandhu, R. @@oth@@ Smorchkova, I.P. @@oth@@ Heying, B. @@oth@@ Block, T. @@oth@@ Wojtowicz, M. @@oth@@ Goorsky, M.S. @@oth@@ |
| publishDateDaySort_date |
2004-01-01T00:00:00Z |
| hierarchy_top_id |
NLEJ237794969 |
| id |
NLEJ237963957 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">NLEJ237963957</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20210707045102.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">120216s2004 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.4028/www.scientific.net/MSF.457-460.1601</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)NLEJ237963957</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Poust, B.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">s.l.</subfield><subfield code="a">Stafa-Zurich, Switzerland</subfield><subfield code="c">2004</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Online-Ressource (4 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="f">Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Feichtinger, P.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sandhu, R.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Smorchkova, I.P.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Heying, B.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Block, T.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wojtowicz, M.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Goorsky, M.S.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">In</subfield><subfield code="t">Materials science forum</subfield><subfield code="d">Uetikon : Trans Tech Publ., 1984</subfield><subfield code="g">Vol. 457-460 (June 2004), p. 1601-1604</subfield><subfield code="h">Online-Ressource</subfield><subfield code="w">(DE-627)NLEJ237794969</subfield><subfield code="w">(DE-600)2047372-2</subfield><subfield code="x">1662-9752</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:457-460</subfield><subfield code="g">year:2004</subfield><subfield code="g">pages:1601-1604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601</subfield><subfield code="q">text/html</subfield><subfield code="z">Deutschlandweit zugänglich</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601</subfield><subfield code="q">text/html</subfield><subfield code="z">Deutschlandweit zugänglich</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-1-SNT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_NL_ARTICLE</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">457-460</subfield><subfield code="j">2004</subfield><subfield code="h">1601-1604</subfield><subfield code="y">Vol. 457-460 (June 2004), p. 1601-1604</subfield></datafield></record></collection>
|
| series2 |
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 |
| author |
Poust, B. |
| spellingShingle |
Poust, B. X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| authorStr |
Poust, B. |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)NLEJ237794969 |
| format |
electronic Article |
| delete_txt_mv |
keep |
| author_role |
aut |
| collection |
NL |
| publishPlace |
s.l. Stafa-Zurich, Switzerland |
| remote_str |
true |
| illustrated |
Not Illustrated |
| issn |
1662-9752 |
| topic_title |
X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| format_facet |
Elektronische Aufsätze Aufsätze Elektronische Ressource |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
zu |
| author2_variant |
p f pf r s rs i s is b h bh t b tb m w mw m g mg |
| hierarchy_parent_title |
Materials science forum |
| hierarchy_parent_id |
NLEJ237794969 |
| hierarchy_top_title |
Materials science forum |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)NLEJ237794969 (DE-600)2047372-2 |
| title |
X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| ctrlnum |
(DE-627)NLEJ237963957 |
| title_full |
X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| author_sort |
Poust, B. |
| journal |
Materials science forum |
| journalStr |
Materials science forum |
| lang_code |
eng |
| isOA_bool |
false |
| recordtype |
marc |
| publishDateSort |
2004 |
| contenttype_str_mv |
zzz |
| container_start_page |
1601 |
| author_browse |
Poust, B. |
| container_volume |
457-460 |
| physical |
Online-Ressource (4 pages) |
| format_se |
Elektronische Aufsätze |
| author-letter |
Poust, B. |
| doi_str_mv |
10.4028/www.scientific.net/MSF.457-460.1601 |
| title_sort |
x-ray diffraction imaging of gan-based heterostructures on sic |
| title_auth |
X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| abstract |
https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 |
| abstractGer |
https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 |
| abstract_unstemmed |
https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601 |
| collection_details |
GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE |
| title_short |
X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC |
| url |
https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601 https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601 |
| remote_bool |
true |
| author2 |
Feichtinger, P. Sandhu, R. Smorchkova, I.P. Heying, B. Block, T. Wojtowicz, M. Goorsky, M.S. |
| author2Str |
Feichtinger, P. Sandhu, R. Smorchkova, I.P. Heying, B. Block, T. Wojtowicz, M. Goorsky, M.S. |
| ppnlink |
NLEJ237794969 |
| mediatype_str_mv |
z |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| author2_role |
oth oth oth oth oth oth oth |
| doi_str |
10.4028/www.scientific.net/MSF.457-460.1601 |
| up_date |
2024-07-06T03:23:12.232Z |
| _version_ |
1803798385517395968 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">NLEJ237963957</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20210707045102.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">120216s2004 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.4028/www.scientific.net/MSF.457-460.1601</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)NLEJ237963957</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Poust, B.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-Ray Diffraction Imaging of GaN-Based Heterostructures on SiC</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">s.l.</subfield><subfield code="a">Stafa-Zurich, Switzerland</subfield><subfield code="c">2004</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Online-Ressource (4 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zzz</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">z</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">nicht spezifiziert</subfield><subfield code="b">zu</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.457-460.1601</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="f">Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Feichtinger, P.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sandhu, R.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Smorchkova, I.P.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Heying, B.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Block, T.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wojtowicz, M.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Goorsky, M.S.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">In</subfield><subfield code="t">Materials science forum</subfield><subfield code="d">Uetikon : Trans Tech Publ., 1984</subfield><subfield code="g">Vol. 457-460 (June 2004), p. 1601-1604</subfield><subfield code="h">Online-Ressource</subfield><subfield code="w">(DE-627)NLEJ237794969</subfield><subfield code="w">(DE-600)2047372-2</subfield><subfield code="x">1662-9752</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:457-460</subfield><subfield code="g">year:2004</subfield><subfield code="g">pages:1601-1604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.457-460.1601</subfield><subfield code="q">text/html</subfield><subfield code="z">Deutschlandweit zugänglich</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org//10.4028/www.scientific.net/MSF.457-460.1601</subfield><subfield code="q">text/html</subfield><subfield code="z">Deutschlandweit zugänglich</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_U</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-1-SNT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_NL_ARTICLE</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">457-460</subfield><subfield code="j">2004</subfield><subfield code="h">1601-1604</subfield><subfield code="y">Vol. 457-460 (June 2004), p. 1601-1604</subfield></datafield></record></collection>
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