Stresses Analysis on Coarse Grain Zn Film during Tensile Loading
The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε i...
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| Autor*in: |
Huang, Wen Jun [verfasserIn] |
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Englisch |
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s.l. Stafa-Zurich, Switzerland: 2006 |
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Online-Ressource (6 pages) |
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In: Materials science forum - Uetikon : Trans Tech Publ., 1984, Vol. 524-525 (Sept. 2006), p. 723-728 |
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volume:524-525 ; year:2006 ; pages:723-728 |
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10.4028/www.scientific.net/MSF.524-525.723 doi (DE-627)NLEJ238018830 DE-627 ger DE-627 rakwb eng Huang, Wen Jun verfasserin aut Stresses Analysis on Coarse Grain Zn Film during Tensile Loading s.l. Stafa-Zurich, Switzerland 2006 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Ji, Vincent oth Seiler, Wilfrid oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 524-525 (Sept. 2006), p. 723-728 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:524-525 year:2006 pages:723-728 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 524-525 2006 723-728 Vol. 524-525 (Sept. 2006), p. 723-728 |
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10.4028/www.scientific.net/MSF.524-525.723 doi (DE-627)NLEJ238018830 DE-627 ger DE-627 rakwb eng Huang, Wen Jun verfasserin aut Stresses Analysis on Coarse Grain Zn Film during Tensile Loading s.l. Stafa-Zurich, Switzerland 2006 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Ji, Vincent oth Seiler, Wilfrid oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 524-525 (Sept. 2006), p. 723-728 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:524-525 year:2006 pages:723-728 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 524-525 2006 723-728 Vol. 524-525 (Sept. 2006), p. 723-728 |
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10.4028/www.scientific.net/MSF.524-525.723 doi (DE-627)NLEJ238018830 DE-627 ger DE-627 rakwb eng Huang, Wen Jun verfasserin aut Stresses Analysis on Coarse Grain Zn Film during Tensile Loading s.l. Stafa-Zurich, Switzerland 2006 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Ji, Vincent oth Seiler, Wilfrid oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 524-525 (Sept. 2006), p. 723-728 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:524-525 year:2006 pages:723-728 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 524-525 2006 723-728 Vol. 524-525 (Sept. 2006), p. 723-728 |
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10.4028/www.scientific.net/MSF.524-525.723 doi (DE-627)NLEJ238018830 DE-627 ger DE-627 rakwb eng Huang, Wen Jun verfasserin aut Stresses Analysis on Coarse Grain Zn Film during Tensile Loading s.l. Stafa-Zurich, Switzerland 2006 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Ji, Vincent oth Seiler, Wilfrid oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 524-525 (Sept. 2006), p. 723-728 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:524-525 year:2006 pages:723-728 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 524-525 2006 723-728 Vol. 524-525 (Sept. 2006), p. 723-728 |
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10.4028/www.scientific.net/MSF.524-525.723 doi (DE-627)NLEJ238018830 DE-627 ger DE-627 rakwb eng Huang, Wen Jun verfasserin aut Stresses Analysis on Coarse Grain Zn Film during Tensile Loading s.l. Stafa-Zurich, Switzerland 2006 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Ji, Vincent oth Seiler, Wilfrid oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 524-525 (Sept. 2006), p. 723-728 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:524-525 year:2006 pages:723-728 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.524-525.723 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 524-525 2006 723-728 Vol. 524-525 (Sept. 2006), p. 723-728 |
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The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 |
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The advance of the XRD technique allows us to reach the properties of each coarse grain.This paper has demonstrated a new method to determine stress in a single crystal for multicrystalmaterial and this new method could be specially applied for any symmetric crystalline systems. Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. This study allows us to link the microstructure evolutionto the elastic heterogeneity at grain scale or between the grains https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.723 |
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Thestrain tensor ε is determined by the change of the metric tensor G before the initial state and afterthe deformed state in the crystal reference system. Then stress tensor at grain scale is calculated bythe Hooks law. The stress evaluations are carried out in coarse grains of a thin galvanized coatingon a steel substrate during tensile loading. 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