Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon
Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by...
Ausführliche Beschreibung
Autor*in: |
Muto, Shunsuke [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
s.l. Stafa-Zurich, Switzerland: 2007 |
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Anmerkung: |
https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 |
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Umfang: |
Online-Ressource (4 pages) |
Reproduktion: |
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 |
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Übergeordnetes Werk: |
In: Materials science forum - Uetikon : Trans Tech Publ., 1984, Vol. 561-565 (Oct. 2007), p. 1127-1130 |
Übergeordnetes Werk: |
volume:561-565 ; year:2007 ; pages:1127-1130 |
Links: |
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DOI / URN: |
10.4028/www.scientific.net/MSF.561-565.1127 |
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NLEJ238060969 |
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10.4028/www.scientific.net/MSF.561-565.1127 doi (DE-627)NLEJ238060969 DE-627 ger DE-627 rakwb eng Muto, Shunsuke verfasserin aut Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Vasin, A.V. oth Ishikawa, Yukari oth Shibata, Noriyoshi oth Salonen, Jarno oth Lehto, Vesa Pekka oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 561-565 (Oct. 2007), p. 1127-1130 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:561-565 year:2007 pages:1127-1130 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 561-565 2007 1127-1130 Vol. 561-565 (Oct. 2007), p. 1127-1130 |
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10.4028/www.scientific.net/MSF.561-565.1127 doi (DE-627)NLEJ238060969 DE-627 ger DE-627 rakwb eng Muto, Shunsuke verfasserin aut Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Vasin, A.V. oth Ishikawa, Yukari oth Shibata, Noriyoshi oth Salonen, Jarno oth Lehto, Vesa Pekka oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 561-565 (Oct. 2007), p. 1127-1130 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:561-565 year:2007 pages:1127-1130 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 561-565 2007 1127-1130 Vol. 561-565 (Oct. 2007), p. 1127-1130 |
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10.4028/www.scientific.net/MSF.561-565.1127 doi (DE-627)NLEJ238060969 DE-627 ger DE-627 rakwb eng Muto, Shunsuke verfasserin aut Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Vasin, A.V. oth Ishikawa, Yukari oth Shibata, Noriyoshi oth Salonen, Jarno oth Lehto, Vesa Pekka oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 561-565 (Oct. 2007), p. 1127-1130 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:561-565 year:2007 pages:1127-1130 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 561-565 2007 1127-1130 Vol. 561-565 (Oct. 2007), p. 1127-1130 |
allfieldsGer |
10.4028/www.scientific.net/MSF.561-565.1127 doi (DE-627)NLEJ238060969 DE-627 ger DE-627 rakwb eng Muto, Shunsuke verfasserin aut Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Vasin, A.V. oth Ishikawa, Yukari oth Shibata, Noriyoshi oth Salonen, Jarno oth Lehto, Vesa Pekka oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 561-565 (Oct. 2007), p. 1127-1130 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:561-565 year:2007 pages:1127-1130 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 561-565 2007 1127-1130 Vol. 561-565 (Oct. 2007), p. 1127-1130 |
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10.4028/www.scientific.net/MSF.561-565.1127 doi (DE-627)NLEJ238060969 DE-627 ger DE-627 rakwb eng Muto, Shunsuke verfasserin aut Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Vasin, A.V. oth Ishikawa, Yukari oth Shibata, Noriyoshi oth Salonen, Jarno oth Lehto, Vesa Pekka oth In Materials science forum Uetikon : Trans Tech Publ., 1984 Vol. 561-565 (Oct. 2007), p. 1127-1130 Online-Ressource (DE-627)NLEJ237794969 (DE-600)2047372-2 1662-9752 nnns volume:561-565 year:2007 pages:1127-1130 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/MSF.561-565.1127 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 561-565 2007 1127-1130 Vol. 561-565 (Oct. 2007), p. 1127-1130 |
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nano-order structural analysis of white light-emitting silicon oxide prepared by successive thermal carbonization/oxidation of the porous silicon |
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Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon |
abstract |
Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 |
abstractGer |
Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 |
abstract_unstemmed |
Recently the present authors’ group found that porous silicon showed strong and stablewhite/white-blue light emission after successive thermal carbonization and oxidation by water vapor.This material can be considered as a price-competitive solid-state white-light source. We examinedthese layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electronmicroscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer wascompletely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phaseswere present in the 1073 K oxidized sample of stronger emission, while carbon complexes includingSi and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM imagesshowed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It isassumed that the strong light-emitting properties are controlled by the size and internal chemicalbonding states of carbon clusters incorporated https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FMSF.561-565.1127 |
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title_short |
Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon |
url |
https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/MSF.561-565.1127 https://doi.org//10.4028/www.scientific.net/MSF.561-565.1127 |
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author2 |
Vasin, A.V. Ishikawa, Yukari Shibata, Noriyoshi Salonen, Jarno Lehto, Vesa Pekka |
author2Str |
Vasin, A.V. Ishikawa, Yukari Shibata, Noriyoshi Salonen, Jarno Lehto, Vesa Pekka |
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doi_str |
10.4028/www.scientific.net/MSF.561-565.1127 |
up_date |
2024-07-06T03:46:07.820Z |
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