Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions
The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by...
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| Autor*in: |
Miyazaki, Hiroyuki [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
s.l. Stafa-Zurich, Switzerland: 2007 |
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https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 |
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Online-Ressource (4 pages) |
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Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 |
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In: Key engineering materials - Uetikon a.S. : Trans Tech Publications, 1986, Vol. 352 (Aug. 2007), p. 45-48 |
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volume:352 ; year:2007 ; pages:45-48 |
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10.4028/www.scientific.net/KEM.352.45 doi (DE-627)NLEJ238251845 DE-627 ger DE-627 rakwb eng Miyazaki, Hiroyuki verfasserin aut Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Hyuga, Hideki oth Yoshizawa, Yuichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth In Key engineering materials Uetikon a.S. : Trans Tech Publications, 1986 Vol. 352 (Aug. 2007), p. 45-48 Online-Ressource (DE-627)NLEJ237794934 (DE-600)2073306-9 1013-9826 nnns volume:352 year:2007 pages:45-48 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 352 2007 45-48 Vol. 352 (Aug. 2007), p. 45-48 |
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10.4028/www.scientific.net/KEM.352.45 doi (DE-627)NLEJ238251845 DE-627 ger DE-627 rakwb eng Miyazaki, Hiroyuki verfasserin aut Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Hyuga, Hideki oth Yoshizawa, Yuichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth In Key engineering materials Uetikon a.S. : Trans Tech Publications, 1986 Vol. 352 (Aug. 2007), p. 45-48 Online-Ressource (DE-627)NLEJ237794934 (DE-600)2073306-9 1013-9826 nnns volume:352 year:2007 pages:45-48 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 352 2007 45-48 Vol. 352 (Aug. 2007), p. 45-48 |
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10.4028/www.scientific.net/KEM.352.45 doi (DE-627)NLEJ238251845 DE-627 ger DE-627 rakwb eng Miyazaki, Hiroyuki verfasserin aut Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Hyuga, Hideki oth Yoshizawa, Yuichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth In Key engineering materials Uetikon a.S. : Trans Tech Publications, 1986 Vol. 352 (Aug. 2007), p. 45-48 Online-Ressource (DE-627)NLEJ237794934 (DE-600)2073306-9 1013-9826 nnns volume:352 year:2007 pages:45-48 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 352 2007 45-48 Vol. 352 (Aug. 2007), p. 45-48 |
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10.4028/www.scientific.net/KEM.352.45 doi (DE-627)NLEJ238251845 DE-627 ger DE-627 rakwb eng Miyazaki, Hiroyuki verfasserin aut Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Hyuga, Hideki oth Yoshizawa, Yuichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth In Key engineering materials Uetikon a.S. : Trans Tech Publications, 1986 Vol. 352 (Aug. 2007), p. 45-48 Online-Ressource (DE-627)NLEJ237794934 (DE-600)2073306-9 1013-9826 nnns volume:352 year:2007 pages:45-48 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 352 2007 45-48 Vol. 352 (Aug. 2007), p. 45-48 |
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10.4028/www.scientific.net/KEM.352.45 doi (DE-627)NLEJ238251845 DE-627 ger DE-627 rakwb eng Miyazaki, Hiroyuki verfasserin aut Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions s.l. Stafa-Zurich, Switzerland 2007 Online-Ressource (4 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Hyuga, Hideki oth Yoshizawa, Yuichi oth Hirao, Kiyoshi oth Ohji, Tatsuki oth In Key engineering materials Uetikon a.S. : Trans Tech Publications, 1986 Vol. 352 (Aug. 2007), p. 45-48 Online-Ressource (DE-627)NLEJ237794934 (DE-600)2073306-9 1013-9826 nnns volume:352 year:2007 pages:45-48 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/KEM.352.45 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 352 2007 45-48 Vol. 352 (Aug. 2007), p. 45-48 |
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measurement of indentation fracture toughness of silicon nitride ceramics: ii, effect of the experimental conditions |
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Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions |
| abstract |
The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 |
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The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 |
| abstract_unstemmed |
The influence of two measuring conditions, the elapsed time after indentation and thecondition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed.No slow crack-growth after unloading was confirmed by optical microscopic observation of a cracktip induced by the indentation, which led to the negligible difference in fracture toughness measuredat 1 and 30 min after the indentation. Measurements with relatively new and used indenters gavealmost the same fracture toughness data, indicating that the crack lengths were hardly affected by theslight damage of the corner of the indenter. It was suggested that the large scattering of theindentation fracture toughness reported by the round-robin tests such as VAMAS was not originatedfrom these factors https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FKEM.352.45 |
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Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions |
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Hyuga, Hideki Yoshizawa, Yuichi Hirao, Kiyoshi Ohji, Tatsuki |
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