Monitoring of Defects in Thermal Oxides during Electrical Stress

Gespeichert in:

Autor*in:	Caputo, Domenico [verfasserIn] Irrera, Fernanda Palma, Fabrizio

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	s.l. Stafa-Zurich, Switzerland: 2001

Anmerkung:	https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FSSP.82-84.237
Umfang:	Online-Ressource (6 pages)

Reproduktion:	Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Übergeordnetes Werk:	In: Solid state phenomena - Uetikon : Trans Tech Publ., 1988, Vol. 82-84 (Nov. 2001), p. 237-242
Übergeordnetes Werk:	volume:82-84 ; year:2001 ; pages:237-242

Links:	Volltext Volltext

DOI / URN:	10.4028/www.scientific.net/SSP.82-84.237

Katalog-ID:	NLEJ238347982

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spelling	10.4028/www.scientific.net/SSP.82-84.237 doi (DE-627)NLEJ238347982 DE-627 ger DE-627 rakwb eng Caputo, Domenico verfasserin aut Monitoring of Defects in Thermal Oxides during Electrical Stress s.l. Stafa-Zurich, Switzerland 2001 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FSSP.82-84.237 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Irrera, Fernanda oth Palma, Fabrizio oth In Solid state phenomena Uetikon : Trans Tech Publ., 1988 Vol. 82-84 (Nov. 2001), p. 237-242 Online-Ressource (DE-627)NLEJ237794926 (DE-600)2051138-3 1662-9779 nnns volume:82-84 year:2001 pages:237-242 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 82-84 2001 237-242 Vol. 82-84 (Nov. 2001), p. 237-242
allfields_unstemmed	10.4028/www.scientific.net/SSP.82-84.237 doi (DE-627)NLEJ238347982 DE-627 ger DE-627 rakwb eng Caputo, Domenico verfasserin aut Monitoring of Defects in Thermal Oxides during Electrical Stress s.l. Stafa-Zurich, Switzerland 2001 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FSSP.82-84.237 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Irrera, Fernanda oth Palma, Fabrizio oth In Solid state phenomena Uetikon : Trans Tech Publ., 1988 Vol. 82-84 (Nov. 2001), p. 237-242 Online-Ressource (DE-627)NLEJ237794926 (DE-600)2051138-3 1662-9779 nnns volume:82-84 year:2001 pages:237-242 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 82-84 2001 237-242 Vol. 82-84 (Nov. 2001), p. 237-242
allfieldsGer	10.4028/www.scientific.net/SSP.82-84.237 doi (DE-627)NLEJ238347982 DE-627 ger DE-627 rakwb eng Caputo, Domenico verfasserin aut Monitoring of Defects in Thermal Oxides during Electrical Stress s.l. Stafa-Zurich, Switzerland 2001 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FSSP.82-84.237 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Irrera, Fernanda oth Palma, Fabrizio oth In Solid state phenomena Uetikon : Trans Tech Publ., 1988 Vol. 82-84 (Nov. 2001), p. 237-242 Online-Ressource (DE-627)NLEJ237794926 (DE-600)2051138-3 1662-9779 nnns volume:82-84 year:2001 pages:237-242 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 82-84 2001 237-242 Vol. 82-84 (Nov. 2001), p. 237-242
allfieldsSound	10.4028/www.scientific.net/SSP.82-84.237 doi (DE-627)NLEJ238347982 DE-627 ger DE-627 rakwb eng Caputo, Domenico verfasserin aut Monitoring of Defects in Thermal Oxides during Electrical Stress s.l. Stafa-Zurich, Switzerland 2001 Online-Ressource (6 pages) nicht spezifiziert zzz rdacontent nicht spezifiziert z rdamedia nicht spezifiziert zu rdacarrier https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FSSP.82-84.237 Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008 Irrera, Fernanda oth Palma, Fabrizio oth In Solid state phenomena Uetikon : Trans Tech Publ., 1988 Vol. 82-84 (Nov. 2001), p. 237-242 Online-Ressource (DE-627)NLEJ237794926 (DE-600)2051138-3 1662-9779 nnns volume:82-84 year:2001 pages:237-242 https://www.tib.eu/de/openurl/search/?pid=doi:10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext https://doi.org//10.4028/www.scientific.net/SSP.82-84.237 text/html Deutschlandweit zugänglich Volltext GBV_USEFLAG_U ZDB-1-SNT GBV_NL_ARTICLE AR 82-84 2001 237-242 Vol. 82-84 (Nov. 2001), p. 237-242
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title_sort	monitoring of defects in thermal oxides during electrical stress
title_auth	Monitoring of Defects in Thermal Oxides during Electrical Stress
abstract	https://getinfo.de/app/details?id=transtech:doi~10.4028%252Fwww.scientific.net%252FSSP.82-84.237
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title_short	Monitoring of Defects in Thermal Oxides during Electrical Stress
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