X-ray absorption near-edge structure and extended x-ray absorption fine-structure investigation of Pd silicides

X-ray absorption spectroscopy is used to investigate the near-L-edge structures of Pd in pure Pd and bulk Pd2Si and PdSi silicides. Possible many-body effects are suggested to explain the apparent discrepancy between the occurrence of L2,3 white lines and the 4d hole filling in Pd silicides. The int...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

De Crescenzi, M.

Format:

E-Artikel

Erschienen:

1985

Umfang:

Online-Ressource

11

Reproduktion:

APS Digital Backfile Archive 1893-2003

Übergeordnetes Werk:

Enthalten in: Physical review / B - College Park, Md. : APS, 1970, 32(1985), 2, Seite 612-622

Übergeordnetes Werk:

volume:32 ; year:1985 ; number:2 ; pages:612-622 ; extent:11

Links:

Link aufrufen

Katalog-ID:

NLEJ249463849

Nicht das Richtige dabei?

Schreiben Sie uns!