Analytical method of gigabit trench doping uniformity by secondary ion mass spectrometry
Autor*in: |
Matsuo, Naoto [verfasserIn] |
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Format: |
Artikel |
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Erschienen: |
1996 |
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Systematik: |
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Umfang: |
2 |
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Übergeordnetes Werk: |
Enthalten in: Journal of vacuum science and technology / B - New York, NY : Inst., 1983, 14(1996), 4, Seite 2770-2771 |
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Übergeordnetes Werk: |
volume:14 ; year:1996 ; number:4 ; pages:2770-2771 ; extent:2 |
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SW960906 (DE-627)OLC1503842576 (DE-599)GBVOLC1503842576 DE-627 ger DE-627 rakwb 530 UA 4922 AVZ rvk Matsuo, Naoto verfasserin aut Analytical method of gigabit trench doping uniformity by secondary ion mass spectrometry 1996 2 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Tsukamoto, Kazuyoshi oth Miyoshi, Tadaki oth Enthalten in Journal of vacuum science and technology / B New York, NY : Inst., 1983 14(1996), 4, Seite 2770-2771 (DE-627)13062845X (DE-600)797726-8 (DE-576)016134419 2166-2746 nnns volume:14 year:1996 number:4 pages:2770-2771 extent:2 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_24 GBV_ILN_30 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_105 GBV_ILN_130 GBV_ILN_170 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2010 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_4027 GBV_ILN_4036 GBV_ILN_4046 GBV_ILN_4116 GBV_ILN_4126 GBV_ILN_4266 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4309 GBV_ILN_4313 GBV_ILN_4314 GBV_ILN_4315 GBV_ILN_4316 GBV_ILN_4317 GBV_ILN_4318 GBV_ILN_4319 GBV_ILN_4323 GBV_ILN_4336 GBV_ILN_4700 UA 4922 AR 14 1996 4 2770-2771 2 |
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author-letter |
Matsuo, Naoto |
dewey-full |
530 |
title_sort |
analytical method of gigabit trench doping uniformity by secondary ion mass spectrometry |
title_auth |
Analytical method of gigabit trench doping uniformity by secondary ion mass spectrometry |
collection_details |
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title_short |
Analytical method of gigabit trench doping uniformity by secondary ion mass spectrometry |
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author2 |
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2024-07-03T22:24:28.519Z |
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