Mean secondary electron yield of avalanche electrons in the channels of a microchannel plate detector

Gespeichert in:

Autor*in:	Funsten, H.O. [verfasserIn] Suszcynsky, D.M. Harper, R.W.

Format:	Artikel

Erschienen:	1996

Umfang:	5

Übergeordnetes Werk:	Enthalten in: Review of scientific instruments - Melville, NY : AIP, 1930, 67(1996), 10, Seite 3478-3482
Übergeordnetes Werk:	volume:67 ; year:1996 ; number:10 ; pages:3478-3482 ; extent:5

Katalog-ID:	OLC1506486258

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Mean secondary electron yield of avalanche electrons in the channels of a microchannel plate detector

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